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    • 3. 发明申请
    • MEMORY WITH A FAST STABLE SENSING AMPLIFIER
    • 具有快速稳定的感应放大器的记忆
    • US20090251981A1
    • 2009-10-08
    • US12099776
    • 2008-04-08
    • Po-Hao HuangHong-Yi Liao
    • Po-Hao HuangHong-Yi Liao
    • G11C7/00
    • G11C7/062G11C7/067G11C7/12
    • A memory includes a memory cell, a sensing amplifier, four N-type MOS transistors, a reference circuit, and a comparator. The sensing amplifier is used for sensing digital data stored in the memory cell of the memory and generating an output signal corresponding to the digital data when the memory cell is read. The sensing amplifier includes a current source, a voltage generator, an auxiliary transistor, and an operational amplifier. The auxiliary transistor is coupled in parallel to the current source so as to provide an additional current to the sensing amplifier initially. Thus, the sensing amplifier can output a stable signal in a short time so as to improve the performance of the memory.
    • 存储器包括存储单元,感测放大器,四个N型MOS晶体管,参考电路和比较器。 感测放大器用于感测存储在存储器的存储单元中的数字数据,并且当读取存储单元时产生与数字数据相对应的输出信号。 感测放大器包括电流源,电压发生器,辅助晶体管和运算放大器。 辅助晶体管与电流源并联耦合,以便最初向感测放大器提供额外的电流。 因此,感测放大器可以在短时间内输出稳定的信号,从而提高存储器的性能。
    • 4. 发明申请
    • Non-volatile memory and operating method thereof
    • 非易失性存储器及其操作方法
    • US20070242523A1
    • 2007-10-18
    • US11403437
    • 2006-04-12
    • Hong-Yi LiaoWu-Chang ChangChing-Yuan Lin
    • Hong-Yi LiaoWu-Chang ChangChing-Yuan Lin
    • G11C16/04
    • G11C16/0416G11C16/0433H01L27/115H01L27/11568
    • An operating method of a non-volatile memory is provided. The non-volatile memory includes plural memory cells. Each memory cell includes a charge storage structure, a gate, and a source and a drain disposed in the well on the both sides of the gate. During an erasing operation, a first voltage is applied to the source of the selected memory cell, a second voltage is applied to the gate of each selected memory cell, and a third voltage is applied to the well; and the drain of the selected memory cell is floated, so that the selected memory cell is erased. In the meantime, the fourth voltage is applied to the drain of each unselected memory cell, the fifth voltage is applied to the gate of the unselected memory cell, and the source of the unselected memory cell is floated to prevent the unselected memory cell from being erased.
    • 提供了一种非易失性存储器的操作方法。 非易失性存储器包括多个存储单元。 每个存储单元包括电荷存储结构,栅极以及设置在栅极两侧的阱中的源极和漏极。 在擦除操作期间,将第一电压施加到所选择的存储单元的源极,将第二电压施加到每个选择的存储单元的栅极,并将第三电压施加到阱; 并且所选择的存储单元的漏极浮动,使得所选存储单元被擦除。 同时,将第四电压施加到每个未选择的存储单元的漏极,第五电压被施加到未选择的存储单元的栅极,并且未选择的存储单元的源被浮置以防止未选择的存储单元 擦除
    • 7. 发明授权
    • Non-volatile memory and operating method thereof
    • 非易失性存储器及其操作方法
    • US07450418B2
    • 2008-11-11
    • US11403437
    • 2006-04-12
    • Hong-Yi LiaoWu-Chang ChangChing-Yuan Lin
    • Hong-Yi LiaoWu-Chang ChangChing-Yuan Lin
    • G11C11/34
    • G11C16/0416G11C16/0433H01L27/115H01L27/11568
    • An operating method of a non-volatile memory is provided. The non-volatile memory includes plural memory cells. Each memory cell includes a charge storage structure, a gate, and a source and a drain disposed in the well on the both sides of the gate. During an erasing operation, a first voltage is applied to the source of the selected memory cell, a second voltage is applied to the gate of each selected memory cell, and a third voltage is applied to the well; and the drain of the selected memory cell is floated, so that the selected memory cell is erased. In the meantime, the fourth voltage is applied to the drain of each unselected memory cell, the fifth voltage is applied to the gate of the unselected memory cell, and the source of the unselected memory cell is floated to prevent the unselected memory cell from being erased.
    • 提供了一种非易失性存储器的操作方法。 非易失性存储器包括多个存储单元。 每个存储单元包括电荷存储结构,栅极以及设置在栅极两侧的阱中的源极和漏极。 在擦除操作期间,将第一电压施加到所选择的存储单元的源极,将第二电压施加到每个选择的存储单元的栅极,并将第三电压施加到阱; 并且所选择的存储单元的漏极浮动,使得所选存储单元被擦除。 同时,将第四电压施加到每个未选择的存储单元的漏极,第五电压被施加到未选择的存储单元的栅极,并且未选择的存储单元的源被浮置以防止未选择的存储单元 擦除