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    • 1. 发明授权
    • Process for producing photovoltaic device
    • 光电器件生产工艺
    • US06482668B2
    • 2002-11-19
    • US09260044
    • 1999-03-02
    • Naoto OkadaMasahiro KanaiHirokazu OhtoshiTadashi Hori
    • Naoto OkadaMasahiro KanaiHirokazu OhtoshiTadashi Hori
    • H01L2100
    • H01L31/1824H01L31/1816Y02E10/545Y02P70/521
    • In the step of forming a microcrystalline i-type semiconductor layer by high-frequency plasma CVD, wherein an area of the parallel-plate electrode is represented by S; a width of the discharge space in its direction perpendicular to the transport direction of the belt-like substrate, by Ws; a width of a region formed by the parallel-plate electrode together with its surrounding insulating region, in its direction perpendicular to the transport direction of the belt-like substrate, by Wc; a width of the belt-like substrate in the direction perpendicular to its transport, by Wk; a distance between the parallel-plate electrode and the belt-like substrate, by h; a power density at which crystal fraction begins to saturate at predetermined substrate temperature, material gas flow rate and pressure, by Pd; and a high-frequency power, by P, 2h/(Ws−Wc)≧2.5, (Ws/h)×2(Ws−Wk)/[4h+(Ws−Wc) ]≧10, and P≧(10/8)×Pd×S. A microcrystalline semiconductor layer having lower characteristics distribution in the width direction of a belt-like substrate result, and photovoltaic devices having uniform photoelectric conversion efficiency can be mass-produced by a roll-to-roll system.
    • 在通过高频等离子体CVD形成微晶i型半导体层的步骤中,平行板电极的面积由S表示; 放电空间在与带状衬底的输送方向垂直的方向上的宽度Ws; 由平行板电极与其周围的绝缘区域在垂直于带状衬底的输送方向的方向上形成的区域的宽度为Wc; 带状基板在与其运输方向垂直的方向上的宽度W k; 平行板电极和带状衬底之间的距离h; 通过Pd在晶体部分在预定的衬底温度,材料气体流速和压力下开始饱和的功率密度; 和高频功率,通过P,在带状衬底的宽度方向上具有较低特性分布的微晶半导体层,并且可以通过卷对卷大规模生产具有均匀光电转换效率的光电器件 系统。
    • 4. 发明授权
    • Light-receiving member and methods of producing light-receiving member
    • 光接收部件和光接收部件的制造方法
    • US5516611A
    • 1996-05-14
    • US224730
    • 1994-04-08
    • Satoshi KojimaHirokazu OhtoshiHitoshi Murayama
    • Satoshi KojimaHirokazu OhtoshiHitoshi Murayama
    • G03G5/08G03G5/082H01L31/0376G03G5/085
    • H01L31/03762G03G5/08228Y02E10/548
    • In order to improve characteristics of a light-receiving member for electrophotography having a photoconductive layer comprising an amorphous silicon material and implement a method for facilitating designing of a layer structure, the present invention provides a light-receiving member which is formed by depositing in sequence a photoconductive layer which comprises a non-monocrystalline material comprising silicon atoms as a main element and a surface layer on a conductive substrate, wherein the photoconductive layer comprises at least hydrogenated amorphous silicon which contains at least carbon atoms and boron atoms and the boron atom content in the photoconductive layer in a direction of film thickness is varied in a correlation of exponential functions with respect to the carbon atom content in the photoconductive layer in the direction of film thickness, and a method for producing the light-receiving member by forming a layer while controlling a charge of a starting gas for the boron atoms in the correlation of exponential functions with respect to a charge of a starting gas for the carbon atoms.
    • 为了改善具有包含非晶硅材料的光电导层的电子照相用光接收元件的特性,并且实现了便于设计层结构的方法,本发明提供了一种光接收元件,其通过依次沉积形成 光电导层,其包含包含硅原子作为主要元素的非单晶材料和导电基底上的表面层,其中光电导层至少包含含至少碳原子和硼原子的氢化非晶硅,硼原子含量 在膜厚方向的光导电层中,指数函数相对于光电导层中的碳原子含量在膜厚方向上的相关性变化,以及通过形成层的光接收部件的制造方法 同时控制b的起始气体的电荷 指数函数相对于碳原子的起始气体的电荷相关的原子。
    • 6. 发明授权
    • Apparatus and method for processing a substrate
    • 用于处理衬底的装置和方法
    • US06602347B1
    • 2003-08-05
    • US09439609
    • 1999-11-12
    • Hiroshi ShimodaMasahiro KanaiHirokazu OhtoshiTadashi HoriKoichiro Moriyama
    • Hiroshi ShimodaMasahiro KanaiHirokazu OhtoshiTadashi HoriKoichiro Moriyama
    • C23C1600
    • C23C16/545G21K5/10H01L31/03921H01L31/206Y02E10/50Y02P70/521
    • A substrate-processing apparatus includes a substrate delivery chamber, a substrate-processing chamber and a substrate takeup chamber, wherein in the substrate delivery chamber, a web substrate and an interleaf are delivered from a delivery bobbin including the web substrate and the interleaf alternately wound while the web substrate delivered is transported into the substrate-processing chamber to process the web substrate therein and the interleaf delivered is wound on an interleaf takeup bobbin. In the substrate takeup chamber, the web substrate transported from the substrate-processing chamber and an interleaf delivered from an interleaf delivery bobbin are alternately wound in a roll form on a substrate takeup bobbin. The substrate-processing apparatus is provided with a mechanism for detecting transport abnormality of the interleaf either in the substrate delivery chamber or in the substrate takeup chamber.
    • 基板处理装置包括基板输送室,基板处理室和基板卷取室,其中,在基板输送室中,从基板和交错卷绕的输送线轴输送卷筒纸基板和夹板 而输送的网状基材被输送到基材处理室中以在其中处理网状物基材,并且输送的中间层被卷绕在中间卷取线轴上。 在基板卷取室中,从基板处理室输送的网状基板和从中间输送线轴输送的夹层交替地卷绕在基板卷绕筒管上。 衬底处理装置设置有用于检测衬底输送室或衬底收容室中的插入物的运输异常的机构。
    • 7. 发明授权
    • Apparatus and method for processing a substrate
    • 用于处理衬底的装置和方法
    • US06576061B1
    • 2003-06-10
    • US09469797
    • 1999-12-22
    • Koichiro MoriyamaMasahiro KanaiHirokazu OhtoshiTadashi HoriNaoto OkadaHiroshi ShimodaHiroyuki Ozaki
    • Koichiro MoriyamaMasahiro KanaiHirokazu OhtoshiTadashi HoriNaoto OkadaHiroshi ShimodaHiroyuki Ozaki
    • H01L2100
    • H01L21/67173H01L21/67236H01L21/67253H01L21/6776
    • A substrate-processing method comprising transporting a substrate to pass through a plurality of processing spaces communicated with each other while processing said substrate in each processing space, characterized in that based on an inner pressure of (a) one of said plurality of processing spaces, said inner pressure of said processing space (a) and an inner pressure of (b) at least one of the processing spaces arranged before or after said processing space (a) are controlled. A substrate-processing apparatus comprising a plurality of processing spaces, a substrate transportation means for transporting a substrate to pass through said plurality of processing spaces while said substrate being processed in each processing space, and a pressure gage of measuring an inner pressure of (a) one of said plurality of processing spaces, characterized in that said substrate-processing apparatus has a control unit for controlling the inner pressure of said processing space (a) and that of (b) at least one of the processing spaces arranged before or after said processing space (a) based on information obtained from said pressure gage.
    • 一种基板处理方法,包括在每个处理空间中处理所述基板的同时传送基板以通过彼此连通的多个处理空间,其特征在于,基于所述多个处理空间中的一个的内部压力, 所述处理空间(a)的所述内部压力和所述处理空间(a)之前或之后布置的处理空间中的至少一个处理空间(b)的内部压力被控制。1。一种基板处理设备,包括多个处理空间, 基板传送装置,用于在每个处理空间中处理所述基板的同时传送基板以通过所述多个处理空间;以及压力计,测量所述多个处理空间中的一个处理空间中的(a)的内部压力,其特征在于, 所述基板处理装置具有用于控制所述处理空间(a)和(b)的内部压力的控制单元 基于从所述压力计获得的信息,在所述处理空间(a)之前或之后布置的处理空间中的至少一个。