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    • 1. 发明申请
    • Manufacture method for semiconductor device having field oxide film
    • 具有场氧化膜的半导体器件的制造方法
    • US20060189106A1
    • 2006-08-24
    • US11346270
    • 2006-02-03
    • Syuusei TakamiHiroaki Fukami
    • Syuusei TakamiHiroaki Fukami
    • H01L21/425
    • H01L29/0638H01L29/78
    • On the principal surface of a silicon substrate, a side spacer made of silicon nitride is formed on the side wall of a lamination including a silicon oxide film, a silicon nitride film and a silicon oxide film. Thereafter, a channel stopper ion doped region is formed by implanting impurity ions by using as a mask the lamination, side spacer and resist layer. After the resist layer and side spacer are removed, a field oxide film is formed through selective oxidation using the lamination as a mask, and a channel stopper region corresponding to the ion doped region is formed. After the lamination is removed, a circuit device such as a MOS type transistor is formed in each device opening of the field oxide film.
    • 在硅衬底的主表面上,在包括氧化硅膜,氮化硅膜和氧化硅膜的叠片的侧壁上形成由氮化硅制成的侧隔板。 此后,通过使用叠层,侧面间隔物和抗蚀剂层作为掩模,通过注入杂质离子形成通道阻挡离子掺杂区域。 在除去抗蚀剂层和侧隔板之后,通过使用层压作为掩模通过选择性氧化形成场氧化膜,并且形成与离子掺杂区域对应的沟道停止区域。 在去除层压之后,在场氧化物膜的每个器件开口中形成诸如MOS型晶体管的电路器件。
    • 2. 发明申请
    • Manufacture Method for Semiconductor Device Having Field Oxide Film
    • 具有场氧化膜的半导体器件的制造方法
    • US20080003776A1
    • 2008-01-03
    • US11851082
    • 2007-09-06
    • Syuusei TakamiHiroaki Fukami
    • Syuusei TakamiHiroaki Fukami
    • H01L21/76
    • H01L29/0638H01L29/78
    • On the principal surface of a silicon substrate, a side spacer made of silicon nitride is formed on the side wall of a lamination including a silicon oxide film, a silicon nitride film and a silicon oxide film. Thereafter, a channel stopper ion doped region is formed by implanting impurity ions by using as a mask the lamination, side spacer and resist layer. After the resist layer and side spacer are removed, a field oxide film is formed through selective oxidation using the lamination as a mask, and a channel stopper region corresponding to the ion doped region is formed. After the lamination is removed, a circuit device such as a MOS type transistor is formed in each device opening of the field oxide film.
    • 在硅衬底的主表面上,在包括氧化硅膜,氮化硅膜和氧化硅膜的叠片的侧壁上形成由氮化硅制成的侧隔板。 此后,通过使用叠层,侧面间隔物和抗蚀剂层作为掩模,通过注入杂质离子形成通道阻挡离子掺杂区域。 在除去抗蚀剂层和侧隔板之后,通过使用层压作为掩模通过选择性氧化形成场氧化膜,并且形成与离子掺杂区域对应的沟道停止区域。 在去除层压之后,在场氧化物膜的每个器件开口中形成诸如MOS型晶体管的电路器件。
    • 4. 发明授权
    • Manufacture method for semiconductor device having field oxide film
    • 具有场氧化膜的半导体器件的制造方法
    • US07687367B2
    • 2010-03-30
    • US11851082
    • 2007-09-06
    • Syuusei TakamiHiroaki Fukami
    • Syuusei TakamiHiroaki Fukami
    • H01L21/76
    • H01L29/0638H01L29/78
    • On the principal surface of a silicon substrate, a side spacer made of silicon nitride is formed on the side wall of a lamination including a silicon oxide film, a silicon nitride film and a silicon oxide film. Thereafter, a channel stopper ion doped region is formed by implanting impurity ions by using as a mask the lamination, side spacer and resist layer. After the resist layer and side spacer are removed, a field oxide film is formed through selective oxidation using the lamination as a mask, and a channel stopper region corresponding to the ion doped region is formed. After the lamination is removed, a circuit device such as a MOS type transistor is formed in each device opening of the field oxide film.
    • 在硅衬底的主表面上,在包括氧化硅膜,氮化硅膜和氧化硅膜的叠片的侧壁上形成由氮化硅制成的侧隔板。 此后,通过使用叠层,侧面间隔物和抗蚀剂层作为掩模,通过注入杂质离子形成通道阻挡离子掺杂区域。 在除去抗蚀剂层和侧隔板之后,通过使用层压作为掩模通过选择性氧化形成场氧化膜,并且形成与离子掺杂区域对应的沟道停止区域。 在去除层压之后,在场氧化物膜的每个器件开口中形成诸如MOS型晶体管的电路器件。