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1. 发明授权

US07379172B2 Method and apparatus for inspection of optical component 失效
标题翻译：光学部件检查方法和装置
公开(公告)号：US07379172B2
公开(公告)日：2008-05-27
申请号：US11319172
申请日：2005-12-28
申请人： Kazumasa Takata , Hidetoshi Utsuro , Tomotaka Furuta , Takashi Urashima
发明人： Kazumasa Takata , Hidetoshi Utsuro , Tomotaka Furuta , Takashi Urashima
IPC分类号： G01N21/00
CPC分类号： G01M11/0271
摘要： An inspection method for evaluating the performance of an optical component at high precision is provided. According to the inspection method, a first light beam 24 and a second light beam 26 both having different phases are generated from light which has passed through an optical component 18, and are interfered with each other to form an interference region 30. A linear line 66, a linear line 70 and linear lines 72 are set within the interference region 30 so as to determine a distribution of light intensities on each of the linear lines 72. Then, a frequency corresponding to the maximal light intensity is determined. Further, an approximated liner line or an approximated curved line is determined from a plurality of frequencies determined for each of the linear line 72. Then, the aberration of the optical component is evaluated based on the coefficient of the approximated linear or curved line.
摘要翻译：提供了一种用于高精度地评估光学部件的性能的检查方法。根据检查方法，由已经通过光学部件18的光产生具有不同相位的第一光束24和第二光束26，并且彼此干涉以形成干涉区域30。线性线66，线性线70和线性线72设置在干涉区域30内，以便确定每个线性线72上的光强度的分布。然后，确定与最大光强度对应的频率。此外，根据为每个线性线72确定的多个频率来确定近似线性线或近似曲线。然后，基于近似线性或曲线的系数来评价光学部件的像差。

2. 发明申请

US20110090564A1 EXTERIOR PARTS AND METHOD OF MANUFACTURING THE SAME 审中-公开
标题翻译：外部零件及其制造方法
公开(公告)号：US20110090564A1
公开(公告)日：2011-04-21
申请号：US12991025
申请日：2009-09-08
申请人： Hidetoshi Utsuro , Yukio Nishikawa , Masayuki Takahashi , Toshihiko Wada
发明人： Hidetoshi Utsuro , Yukio Nishikawa , Masayuki Takahashi , Toshihiko Wada
IPC分类号： G02B5/18
CPC分类号： G02B5/1861 , B44C1/17 , B44F1/02 , B44F1/08 , G02B5/1819
摘要： An exterior part (100) has a first structural color region (111) formed by a first linear peak-valley pattern including multiple linear grooves arranged in X direction, and a second structural color region (112) formed by a second linear peak-valley pattern including multiple linear grooves arranged in Y direction. The widths, depths, and pitches of the linear grooves are dimensions enabling the generation of diffracted light including structural colors. In the first structural color region (111), surfaces inclined in X direction (3 o'clock or 9 o'clock direction) are formed. In the second structural color region (112), surfaces inclined in Y direction (0 o'clock or 6 o'clock direction) are formed.
摘要翻译：外部部件（100）具有由包括沿X方向排列的多个直线槽的第一线性峰谷图案形成的第一结构色区域（111）和由第二线性峰谷图案形成的第二直线峰谷图案包括沿Y方向布置的多个线性沟槽。线性沟槽的宽度，深度和间距是能够产生包括结构颜色的衍射光的尺寸。在第一结构色区域（111）中，形成在X方向（3点或9点方向）倾斜的面。在第二结构色区域（112）中，形成在Y方向（0点或6点方向）倾斜的面。

3. 发明申请

US20110026208A1 EXTERIOR PARTS AND METHOD OF MANUFACTURING THE SAME AND ELECTRONIC EQUIPMENT USING THE SAME 审中-公开
标题翻译：外部零件及其制造方法和使用该方法的电子设备
公开(公告)号：US20110026208A1
公开(公告)日：2011-02-03
申请号：US12936844
申请日：2009-09-11
申请人： Hidetoshi Utsuro , Yukio Nishikawa , Masayuki Takahashi , Toshihiko Wada
发明人： Hidetoshi Utsuro , Yukio Nishikawa , Masayuki Takahashi , Toshihiko Wada
IPC分类号： B32B3/30 , B23P11/00 , H05K7/00
CPC分类号： B44F1/10 , G02B5/1861 , G02B5/1866 , G03H1/0244 , G03H1/0256 , G03H2250/12 , G03H2250/36 , G03H2250/39 , G03H2250/40 , Y10T29/49826 , Y10T428/2457
摘要： On a triangular groove array structure 53 with a constant structure period, first structural color regions 51 and a second structural color region 52 are formed. The first structural color regions 51 are covered with a protective layer 54 having a refractive index N and the second structural color region 52 is directly exposed to an air layer 55. Variations in color development characteristics owing to the influence of the protective layer 54 can bring the pattern and character of the second structural color region 52 into relief with a contrast.
摘要翻译：在具有恒定结构周期的三角形凹槽阵列结构53上形成第一结构颜色区域51和第二结构颜色区域52。第一结构颜色区域51被具有折射率N的保护层54覆盖，并且第二结构颜色区域52直接暴露于空气层55.由于保护层54的影响，显色特性的变化可以带来第二结构颜色区域52的图案和特征被形成为具有对比度的浮雕。

4. 发明授权

US07821626B2 Angle measuring device and method 有权
标题翻译：角度测量装置及方法
公开(公告)号：US07821626B2
公开(公告)日：2010-10-26
申请号：US11994077
申请日：2006-09-20
申请人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
发明人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
IPC分类号： G01C1/00
CPC分类号： G01B11/26
摘要： By diffracting light emitted from a collimator lens into lights of different orders by a transmission diffraction grating, applying the diffracted lights to a flat surface of an object, forming the light that has been reflected on the flat surface of the object and thereafter retransmitted through the transmission diffraction grating into an image in a position located apart from the optical axis of the outgoing light and measuring the angle of the object with respect to the optical axis of the collimator lens using the image location and the order of the light formed as the image, the angle in a wide range can be measured with a high resolving power.
摘要翻译：通过透射衍射光栅将从准直透镜发射的光衍射成不同顺序的光，将衍射光施加到物体的平坦表面，形成已被反射在物体的平坦表面上的光，然后通过透射衍射光栅转换成位于远离出射光的光轴的位置的图像，并使用图像位置和形成为图像的光的顺序来测量物体相对于准直透镜的光轴的角度，可以以高分辨能力测量宽范围内的角度。

5. 发明申请

US20090231573A1 ANGLE MEASURING DEVICE AND METHOD 有权
标题翻译：角度测量装置和方法
公开(公告)号：US20090231573A1
公开(公告)日：2009-09-17
申请号：US11994077
申请日：2006-09-20
申请人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
发明人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
IPC分类号： G01B11/26
CPC分类号： G01B11/26
摘要： By diffracting light emitted from a collimator lens into lights of different orders by a transmission diffraction grating, applying the diffracted lights to a flat surface of an object, forming the light that has been reflected on the flat surface of the object and thereafter retransmitted through the transmission diffraction grating into an image in a position located apart from the optical axis of the outgoing light and measuring the angle of the object with respect to the optical axis of the collimator lens using the image location and the order of the light formed as the image, the angle in a wide range can be measured with a high resolving power.
摘要翻译：通过透射衍射光栅将从准直透镜发射的光衍射成不同顺序的光，将衍射光施加到物体的平坦表面，形成已被反射在物体的平坦表面上的光，然后通过透射衍射光栅转换成位于远离出射光的光轴的位置的图像，并使用图像位置和形成为图像的光的顺序来测量物体相对于准直透镜的光轴的角度，可以以高分辨能力测量宽范围内的角度。

6. 发明申请

US20060192977A1 Method and apparatus for inspection of optical component 失效
标题翻译：光学部件检查方法和装置
公开(公告)号：US20060192977A1
公开(公告)日：2006-08-31
申请号：US11319172
申请日：2005-12-28
申请人： Kazumasa Takata , Hidetoshi Utsuro , Tomotaka Furuta , Takashi Urashima
发明人： Kazumasa Takata , Hidetoshi Utsuro , Tomotaka Furuta , Takashi Urashima
IPC分类号： G01B11/02 , G01B9/02
CPC分类号： G01M11/0271
摘要： An inspection method for evaluating the performance of an optical component at high precision is provided. According to the inspection method, a first light beam 24 and a second light beam 26 both having different phases are generated from light which has passed through an optical component 18, and are interfered with each other to form an interference region 30. A linear line 66, a linear line 70 and linear lines 72 are set within the interference region 30 so as to determine a distribution of light intensities on each of the linear lines 72. Then, a frequency corresponding to the maximal light intensity is determined. Further, an approximated liner line or an approximated curved line is determined from a plurality of frequencies determined for each of the linear line 72. Then, the aberration of the optical component is evaluated based on the coefficient of the approximated linear or curved line.
摘要翻译：提供了一种用于高精度地评估光学部件的性能的检查方法。根据检查方法，由已经通过光学部件18的光产生具有不同相位的第一光束24和第二光束26，并且彼此干涉以形成干涉区域30。线性线66，线性线70和线性线72设置在干涉区域30内，以便确定每个线性线72上的光强度的分布。然后，确定与最大光强度对应的频率。此外，根据为每个线性线72确定的多个频率来确定近似线性线或近似曲线。然后，基于近似线性或曲线的系数来评价光学部件的像差。

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