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    • 2. 发明申请
    • Display device and manufacturing method thereof
    • 显示装置及其制造方法
    • US20080074571A1
    • 2008-03-27
    • US11900246
    • 2007-09-11
    • Hideo KawanoHideki Sunayama
    • Hideo KawanoHideki Sunayama
    • G02F1/1343
    • G02F1/136286G02F1/136204G02F1/136213
    • The object of the present invention is to provide a liquid crystal display device, which can be used in the active matrix type liquid crystal display device and has a wiring structure of superfine wiring, and a method for manufacturing the liquid crystal display device, wherein it can reduce the occurrence rate of the failures caused by the static electricity which damages the insulating layer of the electrodes or between the electrodes in the manufacturing process, and the time constant of the scan line can be improved simultaneously. In the manufacturing process for the array substrate, the wiring width in the portions of the scan line where the scan lines intersect the auxiliary capacitance bunching lines is narrowed, meanwhile, the area of the portions where the scan lines intersect the auxiliary capacitance bunching lines is reduced, and the wiring capacitance is reduced, the time constant of the scan line is decreased, meanwhile, the wiring width in portions of the auxiliary capacitance lines where they intersect the auxiliary capacitance bunching line is enlarged, the distance between the adjacent scan line and the nearest portion of the auxiliary capacitance line is shortened, and the static charges brought by the manufacturing process, and the like, discharge at the nearest portion, and the failure products caused by the static damage during the manufacturing process can be prevented from occurring.
    • 本发明的目的是提供一种可用于有源矩阵型液晶显示装置并具有超细布线的布线结构的液晶显示装置和液晶显示装置的制造方法,其中 可以降低在制造过程中由于电极绝缘层或电极之间的静电引起的故障的发生率,并且可以同时提高扫描线的时间常数。 在阵列基板的制造工序中,扫描线与辅助电容聚束线相交的扫描线的部分的布线宽度变窄,同时扫描线与辅助电容聚束线相交的部分的面积为 并且布线电容减小,扫描线的时间常数减小,同时辅助电容线的与辅助电容聚束线相交的部分的布线宽度增大,相邻的扫描线与 辅助电容线的最近部分被缩短,并且由制造过程引起的静电等等在最近部分放电,并且可以防止在制造过程中由静电损伤引起的故障产物。
    • 8. 发明申请
    • ACTIVE MATRIX DISPLAY DEVICE
    • 主动矩阵显示设备
    • US20140253858A1
    • 2014-09-11
    • US14343419
    • 2012-05-30
    • Hideo Kawano
    • Hideo Kawano
    • G02F1/1343H01L27/32
    • G02F1/134336G02F1/13439G02F1/1362G09G3/3648G09G2300/0417G09G2300/0819G09G2300/0852G09G2320/0247H01L27/1225H01L27/1255H01L27/3276H01L29/41733
    • To restrain decrease of display quality because of increases in flicker level and decrease of uniformity in screen luminance caused by increases in the overcharging effect when an amorphous metal oxide semiconductor or an organic semiconductor that has an field-effect mobility greater than amorphous silicon is used for pixel TFTs in a liquid crystal display device or organic EL display device. A new relational formula is derived for punch-through voltage in gray scale display, where the visibility of flicker, screen burn-in, and the like is high, and in-plane differential in counter electrode potential, which are an index of the overcharging effect. A design is made so as to satisfy conditions for decreasing the in-plane differential in counter electrode potential that have been newly derived on the basis of this formula to an allowable limit value or less.
    • 为了抑制由于使用非晶态金属氧化物半导体或具有大于非晶硅的场效应迁移率的有机半导体而使过度充电效果增加而引起的闪烁水平增加和屏幕亮度均匀性降低的显示质量降低 液晶显示装置或有机EL显示装置中的像素TFT。 导出了灰度显示中的穿透电压的新关系公式,其中闪烁,屏幕老化等的可视性高,并且对电极电位的面内差异是过度充电的指标 影响。 进行设计以满足将根据该公式新近导出的对置电极的面内差异减小到允许极限值以下的条件。
    • 9. 发明授权
    • Display device
    • 显示设备
    • US07602453B2
    • 2009-10-13
    • US11900246
    • 2007-09-11
    • Hideo KawanoHideki Sunayama
    • Hideo KawanoHideki Sunayama
    • G02F1/1343
    • G02F1/136286G02F1/136204G02F1/136213
    • A liquid crystal display (LCD) device has a wiring structure of superfine wiring, wherein it can reduce the occurrence rate of electrostatic discharge (ESD), and the time constant of the scan line can be improved simultaneously. The wiring width in the portions of the scan lines where they intersect the auxiliary capacitance bunching lines is narrowed, so that the area of the intersection and the wiring capacitance is reduced, thus the time constant of the scan line is decreased, meanwhile, the wiring width in portions of the auxiliary capacitance lines where they intersect the auxiliary capacitance bunching line is enlarged, the distance between the adjacent scan line and the nearest portion of the auxiliary capacitance line is shortened, and the ESD occurs at the nearest portion, and the failure products caused by the ESD can be decreased.
    • 液晶显示器(LCD)器件具有超细布线的布线结构,可以降低静电放电(ESD)的发生率,同时可以提高扫描线的时间常数。 扫描线与辅助电容聚束线相交的部分的布线宽度变窄,交叉区域和布线电容减小,扫描线的时间常数减小,同时布线 辅助电容线的与辅助电容聚束线相交的部分的宽度被扩大,相邻扫描线与辅助电容线的最近部分之间的距离缩短,并且ESD发生在最近的部分,并且故障 可以减少由ESD引起的产品。
    • 10. 发明申请
    • Optical mask employed for manufacturing array substrate, array substrate and method for manufacturing the same
    • 用于制造阵列基板的光掩模,阵列基板及其制造方法
    • US20080164524A1
    • 2008-07-10
    • US12002704
    • 2007-12-18
    • Hideo KawanoHideki Sunayama
    • Hideo KawanoHideki Sunayama
    • H01L27/12G03F1/00H01L21/84
    • H01L27/1288G03F1/00G03F7/70791H01L27/1214
    • The invention provides wiring, which can form or disconnect freely the adjacent exposure regions by employing the same optical mask under a condition that a plurality of array substrates are produced on one mother glass substrate; and an optical mask, which can be inspected by utilizing the same probe device for inspecting even though under a condition that the same mother glass substrate is used to produce the array substrates with different sizes; array substrates; and the manufacture method of the same. The solution means is: the above optical mask is formed to allow: the wiring in upper section at up and down direction is formed in the upper end section of the array substrate, and the wiring in lower section at up and down direction is formed in the lower end section; and a “U shape turning section towards the boundary”, which is turned in a U shape to the boundary at the lower end side of said array substrate, is formed, and a “U shape turning section towards the center”, which is turned again in a U shape to the center section of said array substrate, is formed.
    • 本发明提供了一种布线,其可以在一个母玻璃基板上制造多个阵列基板的条件下,通过使用相同的光掩模,自由地形成或断开相邻的曝光区域; 即使在使用相同的母玻璃基板来制造具有不同尺寸的阵列基板的条件下,也可以通过利用相同的探针装置进行检查来检查光学掩模。 阵列基板; 及其制造方法。 解决方案是:上述光掩模形成为:可以在阵列基板的上端部形成上下方向的上部布线,并且在上下方向上的布线形成在 下端部分; 和形成为U形的“U形转向部分朝向边界”的方式形成在所述阵列基板的下端侧的边界,并且形成“朝向中心的U形转动部分” 再次形成U形到所述阵列基板的中心部分。