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    • 1. 发明申请
    • High Speed Large Scale Dictionary Matching
    • 高速大字典匹配
    • US20130332146A1
    • 2013-12-12
    • US13490832
    • 2012-06-07
    • Kanak B. AgarwalHarm P. Hofstee
    • Kanak B. AgarwalHarm P. Hofstee
    • G06F17/21
    • G06F17/2735
    • A mechanism is provided for dictionary matching. The mechanism loads a plurality of dictionary memory arrays with a set of dictionary words and updates a plurality of status arrays. Each status array of the plurality of status arrays corresponds to a respective one of the plurality of dictionary memory arrays. Each entry of a given status array stores a status bit, which indicates whether a corresponding entry of the corresponding dictionary memory array stores a valid dictionary word. The mechanism receives an input data word and generates a hash value based on the input data word. The mechanism reads a dictionary word from each of the dictionary memory arrays and a status bit from each of the status arrays using the hash value as a read address. The mechanism determines whether a dictionary memory array within the plurality of dictionary memory arrays stores a valid dictionary word that matches the input data word.
    • 提供了字典匹配的机制。 该机构使用一组字典字加载多个字典存储器阵列并更新多个状态阵列。 多个状态阵列中的每个状态阵列对应于多个字典存储器阵列中的相应一个。 给定状态阵列的每个条目存储状态位,其指示对应的字典存储器阵列的相应条目是否存储有效的字典字。 该机制接收输入数据字,并根据输入数据字生成哈希值。 该机制使用散列值作为读取地址从每个字典存储器阵列读取字典字,并从每个状态数组中读取状态位。 该机构确定多个字典存储器阵列内的字典存储器阵列是否存储与输入数据字匹配的有效字典字。
    • 2. 发明申请
    • APPARATUS AND METHOD FOR ACCELERATING TEST, DEBUG AND FAILURE ANALYSIS OF A MULTIPROCESSOR DEVICE
    • 用于加速多处理器设备的测试,调试和故障分析的装置和方法
    • US20070300115A1
    • 2007-12-27
    • US11421518
    • 2006-06-01
    • Ramyanshu DattaMatthew E. FernslerHarm P. Hofstee
    • Ramyanshu DattaMatthew E. FernslerHarm P. Hofstee
    • G01R31/28G06F11/00
    • G06F11/2236
    • An apparatus and method for accelerating test, debug and failure analysis of a multiprocessor device are provided. With the apparatus and method, on-chip trace logic is utilized to receive internal signals from logic provided in modules of the multiprocessor device. The modules are preferably copies of one another such that, given the same inputs, each module should operate in the same manner and generate the same output as long as the modules are operating properly. The modules are provided with the same inputs and the internal signals of the modules are traced using an on-chip trace bus and on-chip trace logic analyzer to perform the trace. The internal signals from one module are compared against another module so as to determine if there is any discrepancy which would indicate a fault. Additional pairs of modules may be compared to pinpoint a faulty module that is the source of the fault.
    • 提供了一种用于加速多处理器设备的测试,调试和故障分析的设备和方法。 利用该装置和方法,利用片上跟踪逻辑来从多处理器设备的模块中提供的逻辑接收内部信号。 这些模块优选地是彼此的副本,使得在给定相同的输入的情况下,每个模块应该以相同的方式操作并产生相同的输出,只要模块正常运行即可。 模块提供相同的输入,并使用片上跟踪总线和片上跟踪逻辑分析仪跟踪模块的内部信号,以执行跟踪。 将来自一个模块的内部信号与另一个模块进行比较,以确定是否存在指示故障的差异。 可以对额外的模块对进行比较,以确定故障源的故障模块。
    • 3. 发明授权
    • High speed large scale dictionary matching
    • 高速大字典匹配
    • US08830714B2
    • 2014-09-09
    • US13490832
    • 2012-06-07
    • Kanak B. AgarwalHarm P. Hofstee
    • Kanak B. AgarwalHarm P. Hofstee
    • G11C15/00G06F17/30
    • G06F17/2735
    • A mechanism is provided for dictionary matching. The mechanism loads a plurality of dictionary memory arrays with a set of dictionary words and updates a plurality of status arrays. Each status array of the plurality of status arrays corresponds to a respective one of the plurality of dictionary memory arrays. Each entry of a given status array stores a status bit, which indicates whether a corresponding entry of the corresponding dictionary memory array stores a valid dictionary word. The mechanism receives an input data word and generates a hash value based on the input data word. The mechanism reads a dictionary word from each of the dictionary memory arrays and a status bit from each of the status arrays using the hash value as a read address. The mechanism determines whether a dictionary memory array within the plurality of dictionary memory arrays stores a valid dictionary word that matches the input data word.
    • 提供了字典匹配的机制。 该机构使用一组字典字加载多个字典存储器阵列并更新多个状态阵列。 多个状态阵列中的每个状态阵列对应于多个字典存储器阵列中的相应一个。 给定状态阵列的每个条目存储状态位,其指示对应的字典存储器阵列的相应条目是否存储有效的字典字。 该机制接收输入数据字,并根据输入数据字生成哈希值。 该机制使用散列值作为读取地址从每个字典存储器阵列读取字典字,并从每个状态数组中读取状态位。 该机构确定多个字典存储器阵列内的字典存储器阵列是否存储与输入数据字匹配的有效字典字。
    • 6. 发明申请
    • DELEGATED VIRTUALIZATION IN A MULTI-CORE PROCESSOR (MCP)
    • 多核处理器(MCP)中的代表虚拟化
    • US20100082941A1
    • 2010-04-01
    • US12241332
    • 2008-09-30
    • Karl J. DuvalsaintHarm P. HofsteeDaeik KimMoon J. Kim
    • Karl J. DuvalsaintHarm P. HofsteeDaeik KimMoon J. Kim
    • G06F15/76G06F9/06
    • G06F9/5027G06F2209/509Y02D10/22
    • The disclosure is applied to a generic microprocessor architecture with a set (e.g., one or more) of controlling elements (e.g., MPEs) and a set of groups of sub-processing elements (e.g., SPEs). Under this arrangement, MPEs and SPEs are organized in a way that a smaller number MPEs control the behavior of a group of SPEs using program code embodied as a set of virtualized control threads. The arrangement also enables MPEs delegate functionality to one or more groups of SPEs such that those group(s) of SPEs will act as pseudo MPEs. The pseudo MPEs will utilize pseudo virtualized control threads to control the behavior of other groups of SPEs. In a typical embodiment, the apparatus includes a MCP coupled to a power supply coupled with cores to provide a supply voltage to each core (or core group) and controlling-digital elements and multiple instances of sub-processing elements.
    • 本公开应用于具有一组(例如,一个或多个)控制元件(例如,MPE)和一组子处理元件(例如,SPE)的通用微处理器架构。 在这种安排下,MPEs和SPE的组织方式是使用较少数量的MPE使用体现为一组虚拟控制线程的程序代码控制一组SPE的行为。 该安排还使MPEs能够将功能委托给一个或多个SPE组,使得这些SPE组将充当伪MPE。 伪MPE将利用伪虚拟化控制线程来控制其他组的SPE的行为。 在典型的实施例中,该装置包括耦合到与核耦合的电源的MCP以向每个核(或核心组)提供电源电压以及控制数字元件和子处理元件的多个实例。
    • 7. 发明申请
    • Accelerating Test, Debug and Failure Analysis of a Multiprocessor Device
    • 加速多处理器设备的测试,调试和故障分析
    • US20080229166A1
    • 2008-09-18
    • US12129030
    • 2008-05-29
    • Ramyanshu DattaMatthew E. FernslerHarm P. Hofstee
    • Ramyanshu DattaMatthew E. FernslerHarm P. Hofstee
    • G01R31/28G06F11/25
    • G06F11/2236
    • A mechanism for accelerating test, debug and failure analysis of a multiprocessor device is provided. With the mechanism, on-chip trace logic is utilized to receive internal signals from logic provided in modules of the multiprocessor device. The modules are preferably copies of one another such that, given the same inputs, each module should operate in the same manner and generate the same output as long as the modules are operating properly. The modules are provided with the same inputs and the internal signals of the modules are traced using an on-chip trace bus and on-chip trace logic analyzer to perform the trace. The internal signals from one module are compared against another module so as to determine if there is any discrepancy which would indicate a fault. Additional pairs of modules may be compared to pinpoint a faulty module that is the source of the fault.
    • 提供了一种用于加速多处理器设备的测试,调试和故障分析的机制。 利用该机制,利用片上跟踪逻辑来从多处理器设备的模块中提供的逻辑接收内部信号。 这些模块优选地是彼此的副本,使得在给定相同的输入的情况下,每个模块应该以相同的方式操作并产生相同的输出,只要模块正常运行即可。 模块提供相同的输入,并使用片上跟踪总线和片上跟踪逻辑分析仪跟踪模块的内部信号,以执行跟踪。 将来自一个模块的内部信号与另一个模块进行比较,以确定是否存在指示故障的差异。 可以对额外的模块对进行比较,以确定故障源的故障模块。