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    • 1. 发明授权
    • Apparatus and method for testing pixels arranged in a matrix array
    • 用于测试以矩阵阵列排列的像素的装置和方法
    • US06873175B2
    • 2005-03-29
    • US10379458
    • 2003-03-04
    • Guillermo Toro-LiraMakoto ShinoharaTakaharu Nishihara
    • Guillermo Toro-LiraMakoto ShinoharaTakaharu Nishihara
    • G01N23/225G01R31/302G01R31/305G09G3/00G01R31/00
    • G09G3/006G01R31/305
    • An apparatus for testing plural pixels arranged in a matrix array on a TFT substrate comprises an electron gun for incidenting the electron beam to the TFT substrate, a secondary electron detector for detecting the amount of secondary electrons generated by incidenting the electron beam to the TFT substrate, and a stage for carrying the TFT substrate which is held thereon. The electron gun is placed against the TFT substrate held on the stage and incidents the electron beam to each basic scanning area. The electron gun scans the electron beam in one basic scanning area a predetermined number of times to obtain a secondary electron waveform necessary for testing the presence/absence of a defect in the pixel. The stage is always moved while the electron gun scans the electron beam in each basic scanning area, whereby the entire area of the TFT substrate is tested.
    • 一种用于测试在TFT基板上以矩阵阵列排列的多个像素的装置,包括用于将电子束入射到TFT基板的电子枪,用于检测通过将电子束入射到TFT基板而产生的二次电子量的二次电子检测器 以及用于承载保持在其上的TFT基板的载物台。 将电子枪放置在保持在平台上的TFT基板上,并将电子束发射到每个基本扫描区域。 电子枪在一个基本扫描区域内扫描预定次数的电子束,以获得测试像素中缺陷的存在/不存在所需的二次电子波形。 当电子枪扫描每个基本扫描区域中的电子束时,舞台总是移动,由此测试TFT基片的整个区域。
    • 2. 发明申请
    • Infrared transmitter/receiver accessory and system for portable photo player
    • 红外发射器/接收器附件和便携式照相机系统
    • US20070018947A1
    • 2007-01-25
    • US11185928
    • 2005-07-19
    • Guillermo Toro-Lira
    • Guillermo Toro-Lira
    • G09G5/00
    • G09G5/006G09G2370/16
    • A system and a consumer electronics kit include an infrared transmitter module and an infrared receiver module. The infrared transmitter module includes a video input that a user can connect to a video output of a portable image display/storage device. The infrared receiver module includes an infrared detector configured to receive infrared signals from said infrared transmitter module, where the received infrared signals contain image information of one or more images stored on the portable image display/storage device. The image information may be still image data representing photographs, moving image data, image data generated by an application program. The infrared receiver module includes a connector that a user can connect to a video input of an electronic device. The electronic device may comprise a display device such as a television or computer monitor, an LCD display, or a portable viewer housing the infrared receiver module and an LCD display.
    • 系统和消费电子产品套件包括红外发射器模块和红外接收器模块。 红外发射模块包括用户可以连接到便携式图像显示/存储装置的视频输出的视频输入。 红外线接收器模块包括红外检测器,其被配置为从所述红外发射器模块接收红外信号,其中所接收的红外信号包含存储在便携式图像显示/存储设备上的一个或多个图像的图像信息。 图像信息可以是表示照片,运动图像数据,由应用程序生成的图像数据的静止图像数据。 红外线接收器模块包括用户可以连接到电子设备的视频输入的连接器。 电子设备可以包括诸如电视或计算机监视器,LCD显示器或容纳红外线接收器模块和LCD显示器的便携式查看器的显示设备。
    • 3. 发明申请
    • Testing flat panel display plates using high frequency AC signals
    • 使用高频交流信号测试平板显示板
    • US20060061380A1
    • 2006-03-23
    • US11217085
    • 2005-08-30
    • Guillermo Toro-Lira
    • Guillermo Toro-Lira
    • G01R31/00
    • G09G3/006
    • Methods of and apparatus for detecting pixel element defects in flat panel display (FPDs). Floating pixel elements (fpes) of uncompleted active plates in a manufacturing process are activated with high frequency AC test signals. In response to the activation signal, a high frequency output signal is produced by a voltage divider formed by an impedance of the fpe under test and an impedance presented by high frequency elements (e.g. stray capacitances) associated with the fpe under test. A signal characteristic (e.g. the amplitude) of the output signal is compared to an expected characteristic to determine the presence of pixel element defects. The methods of the present invention may be performed prior to completion of the active plate, e.g., prior to forming a liquid crystal between plates of a passive matrix LCD and prior to coating a partially formed OLED active plate with light emitting organic material layers. Use of high frequency activation signals allows detection of pixel element defects that are invisible to DC test methods. Additionally, because the methods and apparatus of the present invention allow testing prior to FPD plates being completely manufactured and prior to FPD final assembly, pixel defects can be detected early in the display manufacturing process, thereby resulting in a substantial reduction in production costs.
    • 用于检测平板显示器(FPD)中的像素元件缺陷的方法和装置。 在制造过程中未完成的有源板的浮动像素元件(fpes)由高频AC测试信号激活。 响应于激活信号,通过由被测试的fpe的阻抗形成的分压器产生高频输出信号,并且由与测试中的fpe相关联的高频元件(例如,杂散电容)呈现的阻抗。 将输出信号的信号特性(例如幅度)与预期特性进行比较,以确定像素元件缺陷的存在。 本发明的方法可以在活性板完成之前进行,例如在无源矩阵LCD的板之间形成液晶之前,以及在涂覆具有发光有机材料层的部分形成的OLED有源板之前。 使用高频激活信号可以检测直流测试方法不可见的像素元件缺陷。 此外,由于本发明的方法和装置允许在FPD板完全制造之前并且在FPD最终组装之前进行测试,因此可以在显示器制造过程的早期检测到像素缺陷,从而导致生产成本的显着降低。
    • 4. 发明申请
    • Flat panel display inspection system
    • 平板显示检测系统
    • US20060181266A1
    • 2006-08-17
    • US11058437
    • 2005-02-14
    • Guillermo Toro-Lira
    • Guillermo Toro-Lira
    • G01R31/28
    • G02F1/1309G02F1/1303G02F2001/136254
    • A substrate inspection system includes a plurality of load-lock-less inspection chambers, which are share a single pump unit. A plurality of valves are configured to selectively couple the pump unit to a selected one of the plurality of inspection chambers. The pump unit is configured to pump air out of the selected one of the plurality of inspection chambers while a substrate or substrates in one or more of the remaining plurality of load-lock-less inspection chambers is being inspected. Each load-lock-less inspection chamber may have an associated plurality of rows of electron guns. The plurality of rows of electron guns are operable to provide an electron source for performing voltage waveform contrasting. By employing load-lock-less inspection chambers, a single, shared pump unit, and/or the plurality of rows of electron guns, the footprint of the substrate inspection system can be minimized.
    • 基板检查系统包括多个无负载锁定检查室,其共享单个泵单元。 多个阀构造成选择性地将泵单元联接到多个检查室中的选定的一个。 泵单元被构造成在检查剩余的多个无负载锁定检查室中的一个或多个中的基板或基板的同时将空气泵出所选择的多个检查室中的一个。 每个无负载锁定检查室可以具有相关联的多排电子枪。 多行电子枪可操作以提供用于执行电压波形对比的电子源。 通过采用无负载锁定检查室,单个共享泵单元和/或多排电子枪,可以使衬底检查系统的占地面积最小化。
    • 5. 发明授权
    • Apparatus and method for testing pixels of flat panel display
    • 用于测试平板显示器像素的装置和方法
    • US07012583B2
    • 2006-03-14
    • US10360223
    • 2003-02-07
    • Guillermo Toro-LiraDavid Baker
    • Guillermo Toro-LiraDavid Baker
    • G09G3/20
    • G01R31/305G09G3/006G09G3/3611
    • An apparatus for testing pixels of a flat panel display has a palette for holding a TFT substrate, drive signal source units, and predetermined voltage source units. The palette is grounded. One of the predetermined voltage source units applies a predetermined voltage to a Cs electrode of each of pixels constituting the TFT substrate so that the predetermined voltage is used as a reference voltage of the TFT substrate 11. The drive signal source units supply drive signals to a gate electrode G and a source electrode S respectively in each of the pixels constituting the TFT substrate. The voltages of the drive signals are floated by predetermined voltages given by the corresponding predetermined voltage source units respectively.
    • 用于测试平板显示器的像素的装置具有用于保持TFT基板,驱动信号源单元和预定电压源单元的调色板。 调色板接地。 预定电压源单元之一对构成TFT基板的每个像素的Cs电极施加预定电压,使得预定电压用作TFT基板11的基准电压。驱动信号源单元将驱动信号提供给 分别在构成TFT基板的各像素中形成栅电极G和源电极S. 驱动信号的电压分别由相应的预定电压源单元给定的预定电压浮动。