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    • 2. 发明授权
    • Apparatus and method for measuring the thickness of a measurement object
    • 用于测量测量对象厚度的装置和方法
    • US09335145B2
    • 2016-05-10
    • US14111210
    • 2012-03-27
    • Achim SonntagGerhard KirschnerHerbert FuellmeierFranz Hochwimmer
    • Achim SonntagGerhard KirschnerHerbert FuellmeierFranz Hochwimmer
    • G01B5/06G01B7/06G01B11/06G01B21/08
    • G01B5/06G01B7/06G01B7/087G01B7/107G01B11/06G01B11/0691G01B21/08G01B2210/44
    • An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.
    • 一种用于测量测量物体的厚度的装置,优选地是在测量间隙中具有卷材或片状物的形式的测量对象,其具有安装到机架上的测量机构,其中,用于测量厚度的测量机构 包括针对测量对象的一个​​或多个旅行测量传感器,其特征在于,耦合到行驶测量传感器的补偿传感器测量到参考规则的距离,以便检测并补偿测量的变化 间隙,因为参考规则是集成在测量机构中的框形参考装置的一侧的形式,并且参考装置被配置为使得参考规则与该参考规则之间的距离 与参考规则相反的参考装置在厚度测量期间是已知的。 还说明了用于测量厚度的相应方法。