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    • 2. 发明授权
    • Programmable logic device with highly routable interconnect
    • 具有高度可路由互连的可编程逻辑器件
    • US06294928B1
    • 2001-09-25
    • US08838398
    • 1997-04-03
    • Craig S. LytleKerry S. VeenstraFrancis B. Heile
    • Craig S. LytleKerry S. VeenstraFrancis B. Heile
    • H01L2500
    • H03K19/17736H03K19/177H03K19/17728
    • A programmable logic device architecture with a highly routable programmable interconnect structure. The arrangement of the logic array blocks (LABs), programmable interconnect structure, and other logical elements forms a Clos network. After specific constraints have been met, the architecture is guaranteed to route. The architecture is provably routable when there is no fan-out in the middle stage. A LAB (A-200) comprises an input multiplexer region (A-504), logic elements (A-300), input-output pins (A-516), and output multiplexer region (A-508). Furthermore, a logic device and a method of operating a logic device. The device includes logic elements (B-240) that perform desired logic functions and routing functions. The logic elements (B-240) are arranged in larger logic blocks known as logic array blocks (B-230) that have local interconnection systems. The logic array blocks (B-230) are configured to provide global interconnections. The configuration provides a Clos network, whereby a signal may be routed from any input to any output without blocking.
    • 具有高可路由可编程互连结构的可编程逻辑器件架构。 逻辑阵列块(LAB),可编程互连结构和其他逻辑元件的布置形成了Clos网络。 在满足特定约束之后,保证架构的路由。 当中间阶段没有扇出的时候,这个架构是可行的。 AAB(A-200)包括输入多路复用器区域(A-504),逻辑元件(A-300),输入输出引脚(A-516)和输出多路复用器区域(A-508)。 此外,逻辑设备和操作逻辑设备的方法。 该设备包括执行所需逻辑功能和路由功能的逻辑元件(B-240)。 逻辑元件(B-240)被布置在具有本地互连系统的被称为逻辑阵列块(B-230)的较大逻辑块中。 逻辑阵列块(B-230)被配置为提供全局互连。 该配置提供了一个Clos网络,从而信号可以从任何输入路由到任何输出而不阻塞。
    • 7. 发明授权
    • Apparatus for facilitating scan testing of asynchronous logic circuitry
    • 用于促进异步逻辑电路的扫描测试的装置
    • US5285153A
    • 1994-02-08
    • US947729
    • 1992-09-21
    • Bahram AhaninCraig S. LytleRicky W. Ho
    • Bahram AhaninCraig S. LytleRicky W. Ho
    • G01R31/317G01R31/3185G01R31/28
    • G01R31/318558G01R31/31707
    • Scan testing of asynchronous logic circuitry is facilitated by gating off the asynchronous inputs to flip-flops during scan testing. If desired, the asynchronous inputs which are gated off in this manner may themselves be tested by connecting them to one or more output terminals or scan registers during testing. Alternatively, the asynchronous inputs which are gated could be tested by selectively enabling the signals at strategic points during scan testing. The number of input terminals required to control the test mode may be reduced by providing registers for storing test control signals applied to normal input terminals at the beginning of a test cycle. Once these test control signals are stored, the normal input terminals are free to return to their normal use.
    • 通过在扫描测试期间门控异步输入到触发器来促进异步逻辑电路的扫描测试。 如果需要,以这种方式门控的异步输入本身可以通过在测试期间将它们连接到一个或多个输出端子或扫描寄存器来进行测试。 或者,可以通过在扫描测试期间在战略点上选择性地启用信号来测试门控的异步输入。 通过提供用于存储在测试周期开始时施加到正常输入端的测试控制信号的寄存器,可以减少控制测试模式所需的输入端子的数量。 一旦存储了这些测试控制信号,正常输入端可以自由返回正常使用。