专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20100229061A1 Cell-Aware Fault Model Creation And Pattern Generation 审中-公开
标题翻译：细胞感知故障模型创建和模式生成
公开(公告)号：US20100229061A1
公开(公告)日：2010-09-09
申请号：US12718799
申请日：2010-03-05
申请人： Friedrich HAPKE , Rene Krenz-Baath , Andreas Glowatz , Juergen Schloeffel , Peter Weseloh , Michael Wittke , Mark A. Kassab , Christopher W. Schuermyer
发明人： Friedrich HAPKE , Rene Krenz-Baath , Andreas Glowatz , Juergen Schloeffel , Peter Weseloh , Michael Wittke , Mark A. Kassab , Christopher W. Schuermyer
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318342
摘要： Cell-aware fault models directly address layout-based intra-cell defects. They are created by performing analog simulations on the transistor-level netlist of a library cell and then by library view synthesis. The cell-aware fault models may be used to generate cell-aware test patterns, which usually have higher defect coverage than those generated by conventional ATPG techniques. The cell-aware fault models may also be used to improve defect coverage of a set of test patterns generated by conventional ATPG techniques.
摘要翻译：单元感知故障模型直接针对基于布局的小区内缺陷。它们是通过对库单元的晶体管级网表执行模拟仿真，然后通过库视图合成来创建的。细胞感知故障模型可用于产生细胞感知测试模式，其通常具有比常规ATPG技术产生的缺陷覆盖更高的缺陷覆盖。细胞感知故障模型还可以用于改进由常规ATPG技术产生的一组测试模式的缺陷覆盖。

2. 发明申请

US20080052029A1 Unique binary identifier using existing state elements 审中-公开
标题翻译：使用现有状态元素的唯一二进制标识符
公开(公告)号：US20080052029A1
公开(公告)日：2008-02-28
申请号：US11466846
申请日：2006-08-24
申请人： Robert B. Benware , Mark A. Ward , Christopher W. Schuermyer
发明人： Robert B. Benware , Mark A. Ward , Christopher W. Schuermyer
IPC分类号： G06F19/00 , G06F17/50
CPC分类号： G06F17/504
摘要： A method of retrieving a unique, repeatable identification value from an integrated circuit by identifying a plurality of state elements within the integrated circuit, where the state elements are part of standard functional circuitry within the integrated circuit, and are not part of a specialized circuit designed to primarily produce the unique, repeatable identification value, performing an initializing process on the state elements to bring the state elements to repeatable states, where the repeatable states of different state elements are dependent at least in part on differences between the different state elements, reading the repeatable states on the state elements, and joining the repeatable states into a binary number as the unique, repeatable identification value.
摘要翻译：一种通过识别集成电路内的多个状态元件从集成电路中检索唯一的，可重复的识别值的方法，其中状态元件是集成电路内的标准功能电路的一部分，并且不是专门设计的电路的一部分主要产生唯一的，可重复的识别值，对状态元素执行初始化处理以使状态元素成为可重复状态，其中不同状态元素的可重复状态至少部分地取决于不同状态元素之间的差异，读取状态元素上的可重复状态，并将可重复状态加入到二进制数中作为唯一的，可重复的识别值。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式