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    • 5. 发明授权
    • Method and circuit for detecting and compensating for a degradation of a semiconductor device
    • 用于检测和补偿半导体器件劣化的方法和电路
    • US07668682B2
    • 2010-02-23
    • US11923701
    • 2007-10-25
    • Christopher GonzalezVinod RamaduraiNorman Jay Rohrer
    • Christopher GonzalezVinod RamaduraiNorman Jay Rohrer
    • G06F17/50G06F11/22
    • G01R31/2837
    • A design structure and method comprising a degradation detection circuit configured to respond to degradation. The degradation detection circuit is located within a semiconductor device and comprises a process sensitive circuit, a measurement circuit, a calculation circuit, and a control circuit. The method comprises subjecting the semiconductor device to a first operating condition. A first value at a first time for a parameter of the process sensitive circuit is measured by the measurement circuit. The semiconductor device is operated to perform an intended function. A second value at a second time for the parameter of the circuit is measured by the measurement circuit. The second time is different from the first time. A first differential value between the first value and the second value is determined by the calculation circuit. The control circuit is configured to receive an enable signal.
    • 一种设计结构和方法,包括被配置为响应劣化的劣化检测电路。 劣化检测电路位于半导体器件内,包括过程敏感电路,测量电路,计算电路和控制电路。 该方法包括使半导体器件处于第一操作状态。 通过测量电路测量第一次针对过程敏感电路的参数的第一值。 操作半导体器件以执行预期的功能。 电路参数的第二个值由测量电路测量。 第二次与第一次不同。 第一值和第二值之间的第一差分值由计算电路确定。 控制电路被配置为接收使能信号。
    • 10. 发明申请
    • VOLTAGE DROOP DYNAMIC RECOVERY
    • 电压动态动态恢复
    • US20070192636A1
    • 2007-08-16
    • US11276101
    • 2006-02-14
    • Christopher GonzalezPaul KartschokeVinod RamaduraiMathew Ringler
    • Christopher GonzalezPaul KartschokeVinod RamaduraiMathew Ringler
    • G06F1/00
    • G06F1/28
    • Method and systems for dynamically recovering from voltage droops are disclosed. In one embodiment, a microprocessor coupled to a plurality of voltage sensing circuits is provided. The microprocessor includes an instruction sequencing unit and pipeline including a first series of instructions. A central voltage droop detection processor may be coupled to each of the voltage sensing circuits and the microprocessor. Voltage droop is detected using a voltage sensing circuit, after which processing of the microprocessor is interrupted. The pipeline may then be cleared. Subsequently, a second series of instructions including the first series of instructions, and additional instructions are issued. The additional instructions may include stall instructions that cause a delay in processing of the first series of instructions, which prevents re-occurrence of the voltage droop. The interruption and re-issuing also signals the microprocessor that all the data in a particular instruction stream might not be valid and allows recovery.
    • 公开了用于从电压下降动态恢复的方法和系统。 在一个实施例中,提供耦合到多个电压感测电路的微处理器。 微处理器包括指令排序单元和包括第一系列指令的流水线。 中央电压下降检测处理器可以耦合到每个电压感测电路和微处理器。 使用电压检测电路检测电压下降,之后中断微处理器的处理。 然后可以清除管道。 随后,发出包括第一系列指令和附加指令的第二系列指令。 附加指令可以包括导致​​处理第一系列指令的延迟的停止指令,这防止电压下降的再次发生。 中断和重新发出也向微处理器指示特定指令流中的所有数据可能无效并允许恢复。