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1. 发明授权

US07917327B2 Chip handler with a buffer traveling between roaming areas for two non-colliding robotic arms 有权
标题翻译：芯片处理程序与两个非碰撞机器人臂之间的漫游区域之间移动
公开(公告)号：US07917327B2
公开(公告)日：2011-03-29
申请号：US12831777
申请日：2010-07-07
申请人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
发明人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
IPC分类号： G06F19/00 , G06F17/40
CPC分类号： B25J9/1666 , B25J9/16 , G05B19/4182 , Y02P90/083
摘要： Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.
摘要翻译：两个机器人臂在测试台的分开的，不重叠的区域漫游，避免碰撞。移动缓冲器沿着前方位置和后方位置之间的x轨道移动。在前置位置，第一机器臂将IC芯片从输入托盘或堆叠器装载到行进缓冲器中的缓冲腔中。移动缓冲器然后沿x轨道移动到后部位置，其中第二机器人臂将芯片从行进缓冲器移动到测试板进行测试。在测试之后，第二机器人臂将芯片移动到第二行进缓冲器，然后第二移动缓冲器沿着轨道移动到前部位置，以由第一机器人臂卸载。两个移动缓冲器可以在循环中的相同轨道上移动。移动缓冲器中的缓冲腔在内部轨道上移动以在前后位置之间扩展和收缩间距和间距，以匹配测试板间距。

2. 发明申请

US20100274517A1 Chip Handler with a Buffer Traveling between Roaming Areas for Two Non-Colliding Robotic Arms 有权
标题翻译：具有缓冲器的芯片处理器在两个非碰撞机器人臂的漫游区域之间行进
公开(公告)号：US20100274517A1
公开(公告)日：2010-10-28
申请号：US12831777
申请日：2010-07-07
申请人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
发明人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
IPC分类号： G06F19/00 , G05B19/418
CPC分类号： B25J9/1666 , B25J9/16 , G05B19/4182 , Y02P90/083
摘要： Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.
摘要翻译：两个机器人臂在测试台的分开的，不重叠的区域漫游，避免碰撞。移动缓冲器沿着前方位置和后方位置之间的x轨道移动。在前置位置，第一机器臂将IC芯片从输入托盘或堆叠器装载到行进缓冲器中的缓冲腔中。移动缓冲器然后沿x轨道移动到后部位置，其中第二机器人臂将芯片从行进缓冲器移动到测试板进行测试。在测试之后，第二机器人臂将芯片移动到第二行进缓冲器，然后第二移动缓冲器沿着轨道移动到前部位置，以由第一机器人臂卸载。两个移动缓冲器可以在循环中的相同轨道上移动。移动缓冲器中的缓冲腔在内部轨道上移动以在前后位置之间扩展和收缩间距和间距，以匹配测试板间距。

3. 发明授权

US07783447B2 Chip handler with a buffer traveling between roaming areas for two non-colliding robotic arms 有权
标题翻译：芯片处理程序与两个非碰撞机器人臂之间的漫游区域之间移动
公开(公告)号：US07783447B2
公开(公告)日：2010-08-24
申请号：US11944614
申请日：2007-11-24
申请人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
发明人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
IPC分类号： G06F19/00 , G06F17/40
CPC分类号： B25J9/1666 , B25J9/16 , G05B19/4182 , Y02P90/083
摘要： Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.
摘要翻译：两个机器人臂在测试台的分开的，不重叠的区域漫游，避免碰撞。移动缓冲器沿着前方位置和后方位置之间的x轨道移动。在前置位置，第一机器臂将IC芯片从输入托盘或堆叠器装载到行进缓冲器中的缓冲腔中。移动缓冲器然后沿x轨道移动到后部位置，其中第二机器人臂将芯片从行进缓冲器移动到测试板进行测试。在测试之后，第二机器人臂将芯片移动到第二行进缓冲器，然后第二移动缓冲器沿着轨道移动到前部位置，以由第一机器人臂卸载。两个移动缓冲器可以在循环中的相同轨道上移动。移动缓冲器中的缓冲腔在内部轨道上移动以在前后位置之间扩展和收缩间距和间距，以匹配测试板间距。

4. 发明申请

US20090138119A1 Chip Handler with a Buffer Traveling between Roaming Areas for Two Non-Colliding Robotic Arms 有权
标题翻译：具有缓冲器的芯片处理器在两个非碰撞机器人臂的漫游区域之间行进
公开(公告)号：US20090138119A1
公开(公告)日：2009-05-28
申请号：US11944614
申请日：2007-11-24
申请人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
发明人： Ramon S. Co , Tat Leung Lai , Calvin G. Leong
IPC分类号： G06F19/00
CPC分类号： B25J9/1666 , B25J9/16 , G05B19/4182 , Y02P90/083
摘要： Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch.
摘要翻译：两个机器人臂在测试台的分开的，不重叠的区域漫游，避免碰撞。移动缓冲器沿着前方位置和后方位置之间的x轨道移动。在前置位置，第一机器臂将IC芯片从输入托盘或堆叠器装载到行进缓冲器中的缓冲腔中。移动缓冲器然后沿x轨道移动到后部位置，其中第二机器人臂将芯片从行进缓冲器移动到测试板进行测试。在测试之后，第二机器人臂将芯片移动到第二行进缓冲器，然后第二移动缓冲器沿着轨道移动到前部位置，以由第一机器人臂卸载。两个移动缓冲器可以在循环中的相同轨道上移动。移动缓冲器中的缓冲腔在内部轨道上移动以在前后位置之间扩展和收缩间距和间距，以匹配测试板间距。

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