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    • 9. 发明授权
    • Semiconductor device package
    • 半导体器件封装
    • US08802508B2
    • 2014-08-12
    • US13689034
    • 2012-11-29
    • Burton J. CarpenterBoon Yew LowShufeng Zhao
    • Burton J. CarpenterBoon Yew LowShufeng Zhao
    • H01L21/82H01L21/56
    • H01L21/565H01L23/4334H01L2224/48091H01L2224/73265H01L2924/00014
    • Forming a packaged semiconductor device includes placing a semiconductor die attached to a carrier into a mold cavity having an injection port, wherein the semiconductor die has an encapsulant exclusion region on a top surface of the semiconductor die within an outer perimeter of the top surface; and flowing an encapsulant over the semiconductor die and carrier from the injection port, wherein the encapsulant flows around the encapsulant exclusion region to surround the encapsulant exclusion region without covering the encapsulant exclusion region. The encapsulant exclusion region has a first length corresponding to a single longest distance across the encapsulant exclusion region, wherein the first length is aligned, within 30 degrees, to a line defined by a shortest distance between an entry point of the injection port into the mold cavity and an outer perimeter of the encapsulant exclusion region.
    • 形成封装的半导体器件包括将附接到载体的半导体管芯放置到具有注入端口的模腔中,其中半导体管芯在顶表面的外周边内在半导体管芯的顶表面上具有封装排除区域; 并且将密封剂从所述注入端口流过所述半导体管芯和载体,其中所述密封剂围绕所述密封剂排除区域流动以围绕所述密封剂排除区域而不覆盖所述密封剂排除区域。 密封剂排除区域具有对应于穿过密封剂排除区域的单个最长距离的第一长度,其中第一长度在30度内对准由注射端口进入模具的入口点之间的最短距离所限定的线 空腔和密封剂排除区域的外周边。