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    • 2. 发明申请
    • Optical Receiver Having Bandwidth Control For Intersymbol Interference Compensation
    • 具有带宽控制的光接收器用于符号间干扰补偿
    • US20090116851A1
    • 2009-05-07
    • US11935345
    • 2007-11-05
    • Brian L. HeffnerChristian MalouinTheodore J. Schmidt
    • Brian L. HeffnerChristian MalouinTheodore J. Schmidt
    • H04B10/06
    • H04B10/677
    • Apparatus and techniques for receiving and processing an optical signal. In one implementation, an optical receiver is provided to include a delay line interferometer, an etalon, and a data estimator for estimating the data carried on a differentially modulated optical input signal. The delay line interferometer receives the input signal and issues differentially decoded constructive and destructive signals. The etalon filters the constructive signal with a transmission stopband imposed over the passband of the constructive signal. The bandwidth of the etalon stopband is selected based on the bandwidth of the modulation of the input signal in order to maximize received signal quality. The data estimator uses a difference between signals derived from the filtered constructive signal and the destructive signal for estimating data.
    • 用于接收和处理光信号的装置和技术。 在一个实施方案中,提供光接收器以包括延迟线干涉仪,标准具和用于估计在差分调制的光输入信号上承载的数据的数据估计器。 延迟线干涉仪接收输入信号并发出差分解码的建构性和破坏性信号。 标准具使用施加在结构信号的通带上的传输阻挡带来对建设性信号进行滤波。 基于输入信号的调制的带宽来选择标准具阻带的带宽,以便最大化接收的信号质量。 数据估计器使用从滤波的构成信号导出的信号与用于估计数据的破坏性信号之间的差异。
    • 3. 发明授权
    • Method and apparatus for determining the thickness and index of
refraction of a film using low coherence reflectometry and a reference
surfaces
    • 使用低相干反射计和参考表面确定膜的厚度和折射率的方法和装置
    • US5633712A
    • 1997-05-27
    • US520198
    • 1995-08-28
    • Shalini VenkateshWayne V. SorinBrian L. Heffner
    • Shalini VenkateshWayne V. SorinBrian L. Heffner
    • G01B11/06G01N21/41G01B9/02
    • G01N21/41G01B11/0675
    • An apparatus and method for measuring the thickness of a film having top and bottom surfaces. The apparatus includes low coherence light source that generates a probe light signal. The film is positioned between first and second reference reflectors, the first reference reflector being partially reflecting. The probe light signal is applied to the film after passing through the first reference reflector. Part of the portion of the probe light signal leaving the film is reflected back toward the first reference reflector by the second reference reflector. The light exiting through the first reference reflector is collected to form the input to a receiver that determines the time delay between light reflected from the top and bottom surfaces of the film as well as the change in optical path length between said first and second reflectors resulting from the introduction of said film between said first and second reflectors. In the preferred embodiment of the present invention, the receiver is constructed from an optical autocorrelator or an optical spectrum analyzer that includes circuitry for providing the Fourier transform of the frequency domain spectrum measured from the combined light signal. Embodiments in which only one of the reference reflectors is utilized provide a means for simplifying the output spectrum from the receiver when multi-layer films are utilized.
    • 一种用于测量具有顶表面和底表面的膜的厚度的装置和方法。 该装置包括产生探测光信号的低相干光源。 薄膜位于第一和第二参考反射器之间,第一参考反射器被部分地反射。 探针光信号通过第一参考反射器后施加到膜。 离开膜的探测光信号的一部分的一部分被第二参考反射器反射回第一参考反射器。 收集通过第一参考反射器射出的光以形成接收器的输入,该接收器确定从膜的顶表面和底表面反射的光之间的时间延迟以及所述第一和第二反射器之间的光程长度的变化,从而得到 从所述第一和第二反射器之间的所述膜的引入。 在本发明的优选实施例中,接收机由光学自相关器或光谱分析仪构成,光谱分析仪包括用于提供从组合的光信号测量的频域频谱的傅里叶变换的电路。 其中仅使用一个参考反射器的实施例提供了当使用多层膜时简化来自接收器的输出光谱的装置。
    • 5. 发明授权
    • Method and apparatus for measuring polarization sensitivity of optical
devices
    • 用于测量光学器件偏振灵敏度的方法和装置
    • US5298972A
    • 1994-03-29
    • US755931
    • 1991-09-06
    • Brian L. Heffner
    • Brian L. Heffner
    • G01J4/04G01M11/00
    • G01M11/00G01J4/04
    • An instrument includes a polarized optical source for producing three sequential predetermined states of polarization of a light beam and an optical polarization meter for measuring the polarization of a portion of the light beam transmitted by or reflected from an optical network by splitting it into four beams, passing three of the beams through optical elements, measuring the transmitted intensity of all four beams, and calculating Stokes parameters. The light beam enters the optical polarization meter through a single-mode optical fiber that acts as a spatial filter for controlling the position and alignment of the beam with respect to the optical elements. The distortion of the light beam polarization caused by this optical fiber is corrected by introducing two different linearly polarized light beams and measuring Stokes parameters which are used to construct a calibration matrix that is inverted and multiplied times measured Stokes parameters of subsequent measurements to yield true Stokes parameters. The three sequential predetermined states of polarization yield three corresponding Jones input vectors, and the Stokes parameters for the responses of the optical network are converted to three Jones output vectors. A Jones matrix for the optical network to within a complex constant is then computed from the Jones input and output vectors. Relative polarization sensitivity can be determined from this matrix for the optical network. The relative distortion caused by the optical network can be corrected by multiplying by the inverse of the matrix during later measurements through the optical network. Additionally, power measurements on the optical network and a substituted optical through enable absolute determinations and corrections.
    • 仪器包括用于产生光束的三个顺序的预定偏振状态的偏振光源和用于测量由光网络传输或从光网络反射的光束的一部分的偏振将其分成四个光束的光偏振计, 通过三个光束通过光学元件,测量所有四个光束的透射强度,并计算斯托克斯参数。 光束通过单模光纤进入光偏振计,该单模光纤用作空间滤光器,用于控制光束相对于光学元件的位置和对准。 通过引入两个不同的线性偏振光束和测量斯托克斯参数来校正由该光纤引起的光束偏振的失真,该斯托克斯参数用于构建校准矩阵,该校准矩阵被反演和乘以倍数测量的随后测量的斯托克斯参数以产生真实的斯托克斯 参数。 三个连续的预定偏振态产生三个对应的Jones输入向量,并且用于光网络的响应的斯托克斯参数被转换为三个琼斯输出向量。 然后从琼斯输入和输出向量计算光网络中复数常数内的琼斯矩阵。 可以从该光网络的矩阵中确定相对极化灵敏度。 光网络引起的相对失真可以通过在以后的测量中通过光网络乘以矩阵的倒数来校正。 另外,光网络上的功率测量和替代的光学通过启用绝对确定和校正。
    • 9. 发明授权
    • Roller assembly having pre-aligned for on-line thickness measurements
    • 辊组件具有预对准的在线厚度测量
    • US5850287A
    • 1998-12-15
    • US893432
    • 1997-07-11
    • Wayne V. SorinShalini VenkateshBrian L. Heffner
    • Wayne V. SorinShalini VenkateshBrian L. Heffner
    • G01B11/06G01N21/45G01B9/02
    • G01B11/0691
    • An apparatus for measuring the thickness of a film on a production line or the like. The apparatus includes a moveable member in contact with the film. The moveable member rotates about a fixed member and includes a transparent region. The apparatus also includes an optical probe attached to the fixed member. The optical probe has an optical fiber for coupling a light signal to the film through the transparent region of the moveable member and for returning light reflected from the film to a receiver for determining the thickness of the film. The optical probe may also include a lens assembly for imaging the light signal onto the film and imaging the reflected light signals back into the optical probe. The optical probe may also include a partially reflecting reference reflector for simplifying the analysis of multi-layer films.
    • 一种用于测量生产线上的薄膜厚度的装置。 该装置包括与薄膜接触的可移动部件。 可移动构件围绕固定构件旋转并且包括透明区域。 该装置还包括附接到固定构件的光学探头。 光学探针具有用于通过可移动部件的透明区域将光信号耦合到膜的光纤,并且用于将从膜反射的光返回到接收器以确定膜的厚度。 光学探针还可以包括用于将光信号成像到胶片上并将反射光信号成像回到光学探针中的透镜组件。 光学探针还可以包括用于简化多层膜的分析的部分反射的参考反射器。