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    • 3. 发明专利
    • Measuring instrument for length direction
    • 测量长度方向的仪器
    • JP2000074601A
    • 2000-03-14
    • JP20040699
    • 1999-07-14
    • Brown & Sharpe Tesa Saブラウン アンド シャープ テサ ソシエテ アノニム
    • ZANIER ADRIANOBOVEY ARTHURPAUDEX MICHEL
    • G01B3/18G01B7/02G01B21/02
    • G01B3/18
    • PROBLEM TO BE SOLVED: To eliminate the need to machine a material to adjust the clearance between a sleeve and a micrometer screw during assembly.
      SOLUTION: A micrometer is composed of a sleeve 10 provided with an internal surface where screw threads 105 are partially formed and an external surface where screw threads 101 are partially formed. On the external surface, one deformable tapered part 107 is provided. The micrometer screw is engaged with the sleeve 10 and rotated in the sleeve 10 so as to move itself along the length-directional measurement axis (x) of this instrument. A nut 11 is engaged onto the sleeve external screw threads 101 and brought into contact with the tapered part 107 so as to adjust the clearance between the micrometer screw and sleeve 10. The tapered part 107 has nothing in a lengthwise slit and its deforming capability is given by an odd number of flat segments with the external diameter variable along its periphery.
      COPYRIGHT: (C)2000,JPO
    • 要解决的问题:为了消除在组装期间加工材料以调节套筒和千分尺螺钉之间的间隙的需要。 解决方案:千分尺由套筒10组成,套管10设有一部分形成螺纹105的内表面和部分形成螺纹101的外表面。 在外表面上设有一个可变形锥形部分107。 千分尺螺丝与套筒10接合并在套管10中旋转,以沿着该仪器的长度方向的测量轴线(x)自身移动。 螺母11被接合到套筒外螺纹101上并与锥形部107接触,以调节千分尺螺钉和套管10之间的间隙。锥形部分107在纵向狭缝中没有任何东西,并且其变形能力是 由奇数个扁平段给出,外围沿其外围可变。