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1. 发明专利

JP3472897B2 How to adjust the linear measuring device and this device 失效
公开(公告)号：JP3472897B2
公开(公告)日：2003-12-02
申请号：JP3566896
申请日：1996-01-30
申请人：ブラウンアンドシャープテサソシエテアノニム
发明人：ツァニエールアドリアーノ , ベジンゲアレックス
IPC分类号： G01B21/02 , G01B5/02 , G01D5/24
CPC分类号： G01B5/02

2. 发明专利

JP2000074602A Electronic micrometer 有权
标题翻译：电子显微镜
公开(公告)号：JP2000074602A
公开(公告)日：2000-03-14
申请号：JP20040799
申请日：1999-07-14
申请人： Brown & Sharpe Tesa Sa , ブラウンアンドシャープテサソシエテアノニム
发明人： ZANIER ADRIANO , BOVEY ARTHUR , BORTGOGNON LUCIEN
IPC分类号： G01B3/18 , G01B7/02 , G01B21/02
CPC分类号： G01B3/18
摘要： PROBLEM TO BE SOLVED: To protect all constituent components in the internal space of the micrometer from the infiltration of moisture, dust, and water.
SOLUTION: The electronic micrometer is composed of a sleeve 10 having an internal surface having screw threads partially formed inside, a screw 1 which is engaged with the sleeve 10 and rotated in the sleeve 10 so as to move itself along the length-directional measurement axis (x), and a casing 23 wherein a capacitive system which measures the relative rotation of the screw in the sleeve 10 and starts the measurement to determine the length-directional position of the screw is arranged and which has at least one internal capacity limited. The casing 23 is composed of two half shell bodies. At least one thread type joint 30 or 32 seals the internal capacity 230 of the casing 23. Other seal means 34 and 38 are provided so as to prevent water and dirt from penetrating the internal capacity.
COPYRIGHT: (C)2000,JPO
摘要翻译：要解决的问题：保护千分尺的内部空间中的所有组成部件免受潮湿，灰尘和水的渗透。解决方案：电子千分尺由具有内部部分地形成有内螺纹的内表面的套筒10组成，螺钉1与套管10接合并在套筒10中旋转，以沿着长度方向的测量轴（x）和壳体23，其中布置了测量套筒10中的螺杆的相对旋转并开始测量以确定螺杆的长度方向位置的电容系统，并且其具有至少一个内部容量限制。壳体23由两个半壳体构成。至少一个螺纹型接头30或32密封壳体23的内部容积230.其它密封装置34和38被设置成防止水和污物渗透内部容量。

3. 发明专利

JP2000074601A Measuring instrument for length direction 有权
标题翻译：测量长度方向的仪器
公开(公告)号：JP2000074601A
公开(公告)日：2000-03-14
申请号：JP20040699
申请日：1999-07-14
申请人： Brown & Sharpe Tesa Sa , ブラウンアンドシャープテサソシエテアノニム
发明人： ZANIER ADRIANO , BOVEY ARTHUR , PAUDEX MICHEL
IPC分类号： G01B3/18 , G01B7/02 , G01B21/02
CPC分类号： G01B3/18
摘要： PROBLEM TO BE SOLVED: To eliminate the need to machine a material to adjust the clearance between a sleeve and a micrometer screw during assembly.
SOLUTION: A micrometer is composed of a sleeve 10 provided with an internal surface where screw threads 105 are partially formed and an external surface where screw threads 101 are partially formed. On the external surface, one deformable tapered part 107 is provided. The micrometer screw is engaged with the sleeve 10 and rotated in the sleeve 10 so as to move itself along the length-directional measurement axis (x) of this instrument. A nut 11 is engaged onto the sleeve external screw threads 101 and brought into contact with the tapered part 107 so as to adjust the clearance between the micrometer screw and sleeve 10. The tapered part 107 has nothing in a lengthwise slit and its deforming capability is given by an odd number of flat segments with the external diameter variable along its periphery.
COPYRIGHT: (C)2000,JPO
摘要翻译：要解决的问题：为了消除在组装期间加工材料以调节套筒和千分尺螺钉之间的间隙的需要。解决方案：千分尺由套筒10组成，套管10设有一部分形成螺纹105的内表面和部分形成螺纹101的外表面。在外表面上设有一个可变形锥形部分107。千分尺螺丝与套筒10接合并在套管10中旋转，以沿着该仪器的长度方向的测量轴线（x）自身移动。螺母11被接合到套筒外螺纹101上并与锥形部107接触，以调节千分尺螺钉和套管10之间的间隙。锥形部分107在纵向狭缝中没有任何东西，并且其变形能力是由奇数个扁平段给出，外围沿其外围可变。

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