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1. 发明授权

US09513331B2 Test head for electrical testing of a test specimen 有权
标题翻译：试样的电气试验用试验头
公开(公告)号：US09513331B2
公开(公告)日：2016-12-06
申请号：US13957868
申请日：2013-08-02
申请人： Stefan Trenz , Gunther Böhm , Achim Weiland
发明人： Stefan Trenz , Gunther Böhm , Achim Weiland
IPC分类号： G01R31/00 , G01R31/28 , G01R1/073
CPC分类号： G01R31/2886 , G01R1/07314 , G01R1/07357
摘要： The present disclosure relates to a test head for electrical testing of a test specimen, in particular a wafer, having at least two guide plates, which are spaced apart by means of at least one spacer and have guide holes distributed over the surfaces thereof, in which test contact pins for physical contact with the test specimen are guided in a sliding manner. Provision is made for the spacer to be formed by a multiplicity of point supports arranged in a manner distributed over the surfaces of the guide plates and secured on the guide plates.
摘要翻译：本公开涉及一种用于电测试的测试头，特别是具有至少两个引导板的测试样本的测试头，所述至少两个引导板通过至少一个间隔件间隔开并且在其表面上分布有引导孔，用于与测试样品物理接触的测试接触销被滑动地引导。通过多个点支撑件形成间隔件，其布置方式分布在导向板的表面上并固定在导向板上。

2. 发明授权

US07622936B2 Contact device for touch contacting an electrical test specimen, and corresponding method 失效
标题翻译：用于触摸接触电试样的接触装置及相应的方法
公开(公告)号：US07622936B2
公开(公告)日：2009-11-24
申请号：US12002481
申请日：2007-12-17
申请人： Achim Weiland , Gunther Böhm
发明人： Achim Weiland , Gunther Böhm
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R31/2863 , G01R31/2874 , G01R31/2889
摘要： A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.
摘要翻译：用于触摸接触电测试样本的接触装置包括接触头和连接装置。具有测试样本的接触头具有电触摸可接触的测试触点，其位置分布在测试表面上并且由至少一个属于接触头的导向元件确定并且紧固到触点的保持装置头。测试触点在其背离测试样本的一侧将与连接装置的接触表面进行电触触接触。提供了引导元件由各自具有测试表面的一部分并且通过至少一个固定轴承连接到保持装置和连接装置中的至少一个的各个段构成。

3. 发明授权

US08098077B2 Contact-making apparatus 有权
标题翻译：接触器
公开(公告)号：US08098077B2
公开(公告)日：2012-01-17
申请号：US11473726
申请日：2006-06-23
申请人： Rainer Schmid , Achim Weiland
发明人： Rainer Schmid , Achim Weiland
IPC分类号： G01R31/20
CPC分类号： G01R1/07357 , G01R3/00 , H01R13/03
摘要： A contact-making apparatus for electrical connection of a unit under test to an electrical test device. The apparatus has a plurality of electrical test contacts, which are associated with at least one holding element, for making contact with the unit under test. An adapter device increases the distance between adjacent contact paths. The adapter device has contact elements for touch contact with the test contacts. The contact elements are comprised of noble metal or of a noble metal alloy, or of an alloy having at least one noble metal component, or of electrically conductive plastic. The invention also relates to a corresponding method of forming the contact elements by heating and then cooling and then forming the apparatus.
摘要翻译：一种用于将被测单元电连接到电测试装置的接触制备装置。该装置具有与至少一个保持元件相关联的多个电测试触点，用于与被测单元的接触。适配器装置增加相邻接触路径之间的距离。适配器装置具有用于与测试触点的触摸接触的接触元件。接触元件由贵金属或贵金属合金或具有至少一种贵金属组分的合金或导电塑料构成。本发明还涉及通过加热然后冷却然后形成该装置来形成接触元件的相应方法。

4. 发明授权

US07850460B2 Electrical contact element for contacting an electrical component under test and contacting apparatus 有权
标题翻译：用于接触被测电气部件和接触装置的电接触元件
公开(公告)号：US07850460B2
公开(公告)日：2010-12-14
申请号：US12463083
申请日：2009-05-08
申请人： Achim Weiland , Gunther Boehm
发明人： Achim Weiland , Gunther Boehm
IPC分类号： H01R12/00
CPC分类号： G01R1/06733 , G01R1/0675 , G01R1/07357 , H01R13/2407 , H01R13/2435 , H01R2201/20
摘要： An elongate electrical contact element (1) for physically contacting electrical components under test, having two electrical contacting end regions (2, 3) and an elongate intermediate region (4) situated between the end regions (2, 3). The intermediate region (4) has an essentially rectangular cross-section and is configured lamellar along its longitudinal extent. Also disclosed is a corresponding contacting apparatus (22) including such a contact element (1) and a contact element holder (23).
摘要翻译：用于物理接触待测电气部件的细长电接触元件（1），具有两个电接触端区域（2,3）和位于端部区域（2,3）之间的细长中间区域（4）。中间区域（4）具有基本上矩形的横截面，并且沿其纵向范围被构造成层状。还公开了包括这种接触元件（1）和接触元件保持器（23）的相应接触装置（22）。

5. 发明申请

US20140049278A1 TEST HEAD FOR ELECTRICAL TESTING OF A TEST SPECIMEN 有权
标题翻译：测试样本的电气测试测试头
公开(公告)号：US20140049278A1
公开(公告)日：2014-02-20
申请号：US13957868
申请日：2013-08-02
申请人： Stefan TRENZ , Gunther BÖHM , Achim WEILAND
发明人： Stefan TRENZ , Gunther BÖHM , Achim WEILAND
IPC分类号： G01R31/28
CPC分类号： G01R31/2886 , G01R1/07314 , G01R1/07357
摘要： The present disclosure relates to a test head for electrical testing of a test specimen, in particular a wafer, having at least two guide plates, which are spaced apart by means of at least one spacer and have guide holes distributed over the surfaces thereof, in which test contact pins for physical contact with the test specimen are guided in a sliding manner. Provision is made for the spacer to be formed by a multiplicity of point supports arranged in a manner distributed over the surfaces of the guide plates and secured on the guide plates.
摘要翻译：本公开涉及一种用于电测试的测试头，特别是具有至少两个引导板的测试样本的测试头，所述至少两个引导板通过至少一个间隔件间隔开并且在其表面上分布有引导孔，用于与测试样品物理接触的测试接触销被滑动地引导。通过多个点支撑件形成间隔件，其布置方式分布在导向板的表面上并固定在导向板上。

6. 发明申请

US20070017702A1 Contact-making apparatus 有权
标题翻译：接触器
公开(公告)号：US20070017702A1
公开(公告)日：2007-01-25
申请号：US11473726
申请日：2006-06-23
申请人： Rainer Schmid , Achim Weiland
发明人： Rainer Schmid , Achim Weiland
IPC分类号： H05K9/00
CPC分类号： G01R1/07357 , G01R3/00 , H01R13/03
摘要： A contact-making apparatus for electrical connection of a unit under test to an electrical test device. The apparatus has a plurality of electrical test contacts, which are associated with at least one holding element, for making contact with the unit under test. An adapter device increases the distance between adjacent contact paths. The adapter device has contact elements for touch contact with the test contacts. The contact elements are comprised of noble metal or of a noble metal alloy, or of an alloy having at least one noble metal component, or of electrically conductive plastic. The invention also relates to a corresponding method of forming the contact elements by heating and then cooling and then forming the apparatus.
摘要翻译：一种用于将被测单元电连接到电测试装置的接触制备装置。该装置具有与至少一个保持元件相关联的多个电测试触点，用于与被测单元的接触。适配器装置增加相邻接触路径之间的距离。适配器装置具有用于与测试触点的触摸接触的接触元件。接触元件由贵金属或贵金属合金或具有至少一种贵金属组分的合金或导电塑料构成。本发明还涉及通过加热然后冷却然后形成该装置来形成接触元件的相应方法。

7. 发明申请

US20090280676A1 ELECTRICAL CONTACT ELEMENT FOR CONTACTING AN ELECTRICAL TEST SAMPLE AND CONTACTING APPARATUS 有权
标题翻译：用于接触电测试样品和接触装置的电接触元件
公开(公告)号：US20090280676A1
公开(公告)日：2009-11-12
申请号：US12463083
申请日：2009-05-08
申请人： Achim WEILAND , Gunther Boehm
发明人： Achim WEILAND , Gunther Boehm
IPC分类号： H01R11/18 , H01R13/02
CPC分类号： G01R1/06733 , G01R1/0675 , G01R1/07357 , H01R13/2407 , H01R13/2435 , H01R2201/20
摘要： An elongate electrical contact element (1) for physically contacting electrical components under test, having two electrical contacting end regions (2, 3) and an elongate intermediate region (4) situated between the end regions (2, 3). The intermediate region (4) has an essentially rectangular cross-section and is configured lamellar along its longitudinal extent. Also disclosed is a corresponding contacting apparatus (22) including such a contact element (1) and a contact element holder (23).
摘要翻译：用于物理接触待测电气部件的细长电接触元件（1），具有两个电接触端区域（2,3）和位于端部区域（2,3）之间的细长中间区域（4）。中间区域（4）具有基本上矩形的横截面，并且沿其纵向范围被构造成层状。还公开了包括这种接触元件（1）和接触元件保持器（23）的相应接触装置（22）。

8. 发明申请

US20080150568A1 Contact device for touch contacting an electrical test specimen, and corresponding method 失效
标题翻译：用于触摸接触电试样的接触装置及相应的方法
公开(公告)号：US20080150568A1
公开(公告)日：2008-06-26
申请号：US12002481
申请日：2007-12-17
申请人： Achim Weiland , Gunther Bohm
发明人： Achim Weiland , Gunther Bohm
IPC分类号： G01R31/02
CPC分类号： G01R31/2863 , G01R31/2874 , G01R31/2889
摘要： A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.
摘要翻译：用于触摸接触电测试样本的接触装置包括接触头和连接装置。具有测试样本的接触头具有电触摸可接触的测试触点，其位置分布在测试表面上并且由至少一个属于接触头的导向元件确定并且紧固到触点的保持装置头。测试触点在其背离测试样本的一侧将与连接装置的接触表面进行电触触接触。提供了引导元件由各自具有测试表面的一部分并且通过至少一个固定轴承连接到保持装置和连接装置中的至少一个的各个段构成。

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