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1. 发明专利

JP3873041B2 Light-emitting display reader 有权
公开(公告)号：JP3873041B2
公开(公告)日：2007-01-24
申请号：JP2003186911
申请日：2003-06-30
申请人：勝美吉野 , 潤也小林 , 独立行政法人科学技術振興機構
发明人：勝美吉野 , 潤也小林
IPC分类号： G01B11/00 , G06T1/00 , G02F1/13 , G09F9/00

2. 发明专利

JP2005025261A Luminescent display reading device 有权
标题翻译：发光显示读取装置
公开(公告)号：JP2005025261A
公开(公告)日：2005-01-27
申请号：JP2003186911
申请日：2003-06-30
申请人： Japan Science & Technology Agency , Junya Kobayashi , Katsumi Yoshino , 勝美吉野 , 潤也小林 , 独立行政法人科学技術振興機構
发明人： YOSHINO KATSUMI , KOBAYASHI JUNYA
IPC分类号： G01B11/00 , G02F1/13 , G06T1/00 , G09F9/00
摘要： PROBLEM TO BE SOLVED: To provide a luminescent display device having a reading device having high speed performance and high resolution.
SOLUTION: This luminescent display reading device is provided with a luminescent display panel constituted of a plurality of pixels, a luminescent driving part for displaying a picture on the luminescent display panel and a reading means for reading the displayed image. A plurality of different kinds of detectors whose resolutions and reply speeds are different are arranged as the reading means. For example, a CCD 5 is arranged as at least one of the different kinds of detectors, and a photo-diode 6 is arranged as another detector so that the deterioration of the resolution of the CCD 5 can be compensated.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种具有高速性能和高分辨率的读取装置的发光显示装置。解决方案：该发光显示读取装置设置有由多个像素构成的发光显示面板，用于在发光显示面板上显示图像的发光驱动部件和用于读取显示图像的读取装置。其分辨率和回复速度不同的多种不同种类的检测器被布置为读取装置。例如，CCD 5被布置为不同种类的检测器中的至少一种，并且光电二极管6被布置为另一个检测器，使得可以补偿CCD 5的分辨率的劣化。版权所有（C）2005，JPO＆NCIPI

3. 发明专利

JP2003344014A Precision alignment apparatus 审中-公开
标题翻译：精密对位设备
公开(公告)号：JP2003344014A
公开(公告)日：2003-12-03
申请号：JP2002152173
申请日：2002-05-27
申请人： Junya Kobayashi , Katsumi Yoshino , 勝美吉野 , 潤也小林
发明人： YOSHINO KATSUMI , KOBAYASHI JUNYA
IPC分类号： G01B11/00 , B81C3/00
摘要： PROBLEM TO BE SOLVED: To provide a precision alignment apparatus in which a marker of high visibility is attached to a workpiece and uses pattern recognition which enables a fine work matching a purpose of the work.
SOLUTION: In the precision alignment apparatus, a plate (a liquid crystal display substrate) 27 of a light emitting element is set on a stage 19 and a stage 24, a pattern of the substrate 27 is controlled, and a place to be spotted is marked (turned on). Turned-on positions are stored sequentially on a memory as image information by an image sensor 17 via a condensing lens 18. A pattern of image data on the stored memory is collated with a previously fetched pattern, and an instruction is transmitted to respective power-supply devices 25, 22 in order to drive an X-stage motor 26 and a Y-stage motor 23 by a motor control unit 21 so that the patterns are matched.
COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：提供一种精度对准装置，其中将高可见度的标记附着到工件上，并且使用能够进行符合工作目的的精细作业的图案识别。解决方案：在精密对准装置中，将发光元件的板（液晶显示基板）27设置在台19和台24上，控制基板27的图案，被发现被标记（打开）。打开的位置经由聚光透镜18由图像传感器17顺序地存储在存储器上作为图像信息。存储的存储器上的图像数据的图案与先前获取的图案进行对照，并且将指令发送到相应的功率 - 供给装置25,22，以通过马达控制单元21驱动X级马达26和Y级马达23，使得图案匹配。版权所有（C）2004，JPO

4. 发明专利

JP2004205366A High-powered microscope apparatus 有权
标题翻译：高功率微型计算机
公开(公告)号：JP2004205366A
公开(公告)日：2004-07-22
申请号：JP2002375251
申请日：2002-12-25
申请人： Japan Science & Technology Agency , Junya Kobayashi , Katsumi Yoshino , 勝美吉野 , 潤也小林 , 独立行政法人科学技術振興機構
发明人： YOSHINO KATSUMI , KOBAYASHI JUNYA
IPC分类号： G01B9/04 , G01B11/00 , G01N37/00 , G01Q60/10 , G01Q60/24 , G02B21/00 , G02B21/26 , G02B21/34 , G02B21/36
CPC分类号： G02B21/34 , G01B9/04 , G02B21/365
摘要： PROBLEM TO BE SOLVED: To realize a more accurate full-closed controller which eliminates the need for conventional expensive length measuring scales, by setting a marker or the like with high visibility on a slide glass, a stage or the like of a microscope and using a pattern image recognition method, and to realize a work by using the controller.
SOLUTION: In order to solve above problems, a high-powered microscope apparatus is provided with a prescribed pattern which is formed on the stage or a sample support member for microscopes, a recognizing means which recognizes the prescribed pattern, and a moving means which moves the sample support member for the microscopes to a prescribed position, based on positional information being recognized by the recognizing means.
COPYRIGHT: (C)2004,JPO&NCIPI
摘要翻译：要解决的问题：为了实现更精确的全闭合控制器，其消除了对常规昂贵的长度测量尺度的需要，通过在载玻片，舞台等上设置具有高能见度的标记等显微镜和使用图案图像识别方法，并通过使用控制器实现工作。解决方案：为了解决上述问题，高功率显微镜装置设置有形成在舞台上的规定图案或用于显微镜的样品支撑构件，识别规定图案的识别装置和移动基于由识别装置识别的位置信息，将用于显微镜的样品支撑构件移动到规定位置的装置。版权所有（C）2004，JPO＆NCIPI

5. 发明专利

JP2006251678A Confocal optical system 审中-公开
标题翻译：协同光学系统
公开(公告)号：JP2006251678A
公开(公告)日：2006-09-21
申请号：JP2005071294
申请日：2005-03-14
申请人： Junya Kobayashi , Katsumi Yoshino , 勝美吉野 , 潤也小林
发明人： YOSHINO KATSUMI , KOBAYASHI JUNYA
IPC分类号： G02B21/02
摘要： PROBLEM TO BE SOLVED: To provide a laser microscope having a confocal optical system in which the need for mechanical drive of the Z axis is eliminated and an optical aberration is prevented.
SOLUTION: A laser beam exiting from a pin hole 4 passes through a liquid crystal filter 10 while spreading, and then enters an imaging lens 6, the optical length of which has been determined in accordance with the refractive index of the liquid crystal. After passing through the imaging lens 6, the laser beam travels through infinity compensation area as parallel light, then passes through an XY scanning mirror 7, and enters an objective lens 8. The light exiting from the objective lens 8 is focused at a certain distance, and the laser beam two-dimensionally scans the surface of a specimen. The laser beam enters the objective lens 8 again from the specimen side, passes through the imaging lens 6, travels straight through a beam splitter 11 and is condensed by a pin hole 5. In this case, only when the focal points coincide on the surface of the specimen, the laser beam is allowed to pass through the pin hole 5. This makes it possible to know the focusing position on the surface subjected to XY scanning.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种具有共焦光学系统的激光显微镜，其中消除了对Z轴的机械驱动的需要，并且防止了光学像差。解决方案：从针孔4出射的激光束在扩展时通过液晶滤光片10，然后进入成像透镜6，其光学长度根据液晶的折射率确定。在通过成像透镜6之后，激光束作为平行光行进通过无穷远补偿区域，然后通过XY扫描镜7进入物镜8.从物镜8出射的光以一定距离聚焦，并且激光束二维地扫描样本的表面。激光束从样品侧再次进入物镜8，通过成像透镜6，直接通过分束器11，并通过针孔5冷凝。在这种情况下，仅当焦点在表面上重合时允许激光束穿过针孔5.这使得可以知道经受XY扫描的表面上的聚焦位置。版权所有（C）2006，JPO＆NCIPI

6. 发明专利

JP3754958B2 High magnification microscope observation apparatus 有权
公开(公告)号：JP3754958B2
公开(公告)日：2006-03-15
申请号：JP2002375251
申请日：2002-12-25
申请人：勝美吉野 , 潤也小林 , 独立行政法人科学技術振興機構
发明人：勝美吉野 , 潤也小林
IPC分类号： G01B9/04 , G01B11/00 , G01N37/00 , G01Q60/10 , G01Q60/24 , G02B21/00 , G02B21/26 , G02B21/34 , G02B21/36
CPC分类号： G02B21/34 , G01B9/04 , G02B21/365

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