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    • 84. 发明公开
    • 분리가능하며 고정되어 있지 않은 광학 부품의 고정장치
    • 光学部件的可拆卸支架
    • KR1020010007079A
    • 2001-01-26
    • KR1020000026326
    • 2000-05-17
    • 라이카 카메라 악티엔게젤샤프트
    • 베스트스테판우베슈나벨라이너
    • G03B27/28
    • G02B7/026G03B17/04G02B7/022G02B7/023
    • PURPOSE: An improved holder is provided having high performance by optimizing an intrinsic influence quantity with respect to the surer holding of optical components. CONSTITUTION: An angle of inclination of a chamfered surface (6) is set in a range of 40 to 500 and a boundary wall (11) of an insert groove (4) existing within the range of the optical components (2 and 3) is placed at a height of a chamfered edge facing a socket (1). The boundary wall (11) of the insert groove (4) existing in front of the optical components (2 and 3) is undercut at an angle of 10 to 15 deg., by which the depth of the insert groove (4) is made larger by 0.15 to 0.2 mm than the radius of an annular element (5). The free opening between the chamfered edge (10) existing on the optical components (2 and 3) and the front edge (12) of the undercut boundary wall (11) of the insert groove (4) is made equal to 0.8 times the diameter of the annular element (5).
    • 目的:通过优化相对于光学部件的保持器的固有影响量,提供了具有高性能的改进的保持器。 构成:倒角面(6)的倾斜角度设定在40〜500的范围内,存在于光学部件(2和3)范围内的插入槽(4)的边界壁(11)为 放置在面向插座(1)的倒角边缘的高度。 存在于光学部件(2和3)前面的插入槽(4)的边界壁(11)以10至15度的角度进行底切,由此形成插入槽(4)的深度 比环形元件(5)的半径大0.15〜0.2mm。 存在于光学部件(2和3)上的倒角边缘(10)与插入槽(4)的底切边界壁(11)的前边缘(12)之间的自由开口等于直径的0.8倍 的环形元件(5)。
    • 89. 发明授权
    • Mask and apparatus used for alignment purposes in photolithography
    • 用于光刻机中对准目的的掩模和设备
    • US3771872A
    • 1973-11-13
    • US3771872D
    • 1972-12-08
    • RANK ORGANISATION LTD
    • NIGHTINGALE ECULLIS R
    • G03B27/00C23F1/00G02B7/00G03B27/02G03F1/00G03F9/00H01L21/027G03B27/28
    • G03F9/7076G03F1/42
    • A mask for use in photolithography and apparatus for using the mask, in which a pattern formed as opaque regions in a transparent mask or as transparent regions in an opaque mask are to be transferred to a photosensitive layer by exposing the photosensitive layer through the mask. Alternatively the photosensitive layer could be exposed to light reflected from the mask if the pattern were formed as variations in the reflectivity of the mask. In order that the mask can be accurately positioned with respect to the photosensitive layer they are both formed with fiducial marks and the fiducial mark on the mask is formed as a plurality of very small elements extending transverse the general line of the fiducial mark and so positioned that diffraction effects at the edges of the elements cooperate to provide a single dense image, that is a single bright image on a dark ground or a single dark image on a bright ground depending on whether the elements are opaque or transparent.
    • 用于光刻的掩模和用于使用掩模的掩模,其中在透明掩模中形成为不透明区域的图案或不透明掩模中的透明区域的图案通过将感光层曝光通过掩模而转印到感光层。 或者,如果图案形成为掩模的反射率的变化,则感光层可以暴露于从掩模反射的光。 为了使掩模能够相对于感光层精确地定位,它们都形成有基准标记,并且掩模上的基准标记形成为横向于基准标记的总线延伸的多个非常小的元件,并且如此定位 在元件边缘处的衍射效应协同提供单个致密图像,即在黑暗地面上的单个亮色图像或亮地上的单个暗图像,取决于元件是不透明的还是透明的。
    • 90. 发明授权
    • Transparent photographic masks
    • 透明摄影面膜
    • US3744904A
    • 1973-07-10
    • US3744904D
    • 1970-06-11
    • GAF CORP
    • LOPREST FBARR D
    • G03C1/52G03F1/54G03B27/28
    • G03F1/54G03C1/52
    • Photographic masks, suitable for reproduction in a photo-resist layer - by exposure of the latter to actinic light under the mask, and development of the photo-resist image - of the pattern of a microelectronic component or device, are made by exposure to light in accordance with an original (especially by contact exposure under a primary mask) containing the pattern to be reproduced, of light-sensitive material having a flat, rigid, dimensionally stable transparent base such as glass and a thin (e. g. 0.5 to 10 micron thick) transparent resin layer adhering to the base and containing, molecularly dispersed therein an azo coupling component and a light-sensitive diazonium compound, susceptible to decomposition on exposure to light and temporarily stabilized against coupling pending alkaline development, the diazonium compound and coupling component being uniformly distributed throughout the thickness of the resin layer, said light-sensitive material yielding on development with ammonia vapor, in the unexposed areas, an azo dye coloration transparent to visible light but opaque to ultraviolet light, while the decomposition products of the diazonium compound and azo coupling component in the light-exposed areas are transparent to ultraviolet as well as visible light. The light-sensitive materials are made by applying the sensitizing composition and resin to the base in the form of a solution in a volatile solvent, removing any excess e. g., by centrifugation, and drying to remove the solvent. The masks produced afford satisfactory resolution to 0.1 micron. They are used to reproduce the pattern in a photo-resist layer coated on a substrate such as a silicon wafer, as by contact exposure under the mask, development of the photo-resist, and suitable modifying treatment of the thereby exposed areas of the underlying substrate.
    • 适用于在光致抗蚀剂层中再现的照相掩模,通过曝光于光电子部件或器件,通过曝光于光掩模下面的光化光,以及显影微电子部件或器件的图案来形成光电子图像。 包含具有平坦,刚性,尺寸稳定的透明基底(例如玻璃和薄)(例如0.5至10微米厚)的感光材料的原件(特别是通过初级掩模下的接触曝光) )透明树脂层,并且分散地分散有偶氮偶联组分和光敏重氮化合物,其在暴露于光下易于分解并且在碱性显影下临时稳定以防偶联,重氮化合物和偶联组分均匀 分布在树脂层的整个厚度上,所述感光材料用氨显影 蒸气在未曝光区域中对可见光透明但对紫外线不透明的偶氮染料着色,而曝光区域中重氮化合物和偶氮偶合组分的分解产物对紫外线以及可见光是透明的。 感光材料是通过将敏化组合物和树脂以挥发性溶剂中的溶液的形式施用于碱而制成的,除去任何过量的e。 例如通过离心,并干燥除去溶剂。 所生产的面膜提供令人满意的分辨率至0.1微米。 它们用于在涂覆在诸如硅晶片的基底上的光致抗蚀剂层中再现图案,如通过掩模下的接触曝光,光刻胶的显影,以及对底层的曝光区域的适当改性处理 基质。