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    • 88. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE
    • 半导体存储器件
    • US20160111138A1
    • 2016-04-21
    • US14725102
    • 2015-05-29
    • Rohm Co., Ltd.
    • Shintaro IZUMITomoki NAKAGAWAHiroshi KAWAGUCHIMasahiko YOSHIMOTO
    • G11C11/22G11C29/08
    • G11C14/0072G11C11/221G11C11/2259G11C29/08G11C29/50
    • Proposed as a configuration, a controlling method, and a testing method for a ferroelectric shadow memory are (1) a bit line non-precharge method, in which no precharging of a bit line is performed during a read/write operation; (2) a plate line charge share method, in which electric charge is shared between plate lines that are driven sequentially during store/recall operation; (3) a word line boost method, in which the potential on a word line is raised during a write operation; (4) a plate line driver boost method, in which the driving capacity of a plate line driver is raised during a store/recall operation; and (5) a testing method for detecting a defect in a ferroelectric capacitor by arbitrarily setting a potential on a bit line from outside a chip.
    • 作为配置,铁电阴影存储器的控制方法和测试方法,提出以下步骤:(1)在读/写操作期间不执行位线预充电的位线非预充电方法; (2)平板线电荷共享方法,其中在存储/调用操作期间顺序驱动的板线之间共享电荷; (3)在写入操作期间字线上的电位升高的字线升压方法; (4)一种板线驱动器升压方法,其中在行存储/调用操作期间升高板式驱动器的驱动能力; 以及(5)通过从芯片外部任意设定位线上的电位来检测铁电电容器的缺陷的测试方法。
    • 90. 发明授权
    • Signal level conversion in nonvolatile bitcell array
    • 非易失性位单元阵列中的信号电平转换
    • US08854858B2
    • 2014-10-07
    • US13753819
    • 2013-01-30
    • Texas Instruments Incorporated
    • Steven Craig BartlingSudhanshu Khanna
    • G11C11/22H03K3/02
    • H03K3/02G11C11/2275G11C11/419G11C14/0072H03K3/356104
    • A system on chip (SoC) includes one or more core logic blocks that are configured to operate on a lower supply voltage and a memory array configured to operate on a higher supply voltage. Each bitcell in the memory has two ferroelectric capacitors connected in series between a first plate line and a second plate line to form a node Q. A data bit voltage is transferred to the node Q by activating a write driver to provide the data bit voltage responsive to the lower supply voltage. The data bit voltage is boosted on the node Q by activating a sense amp coupled to node Q of the selected bit cell, such that the sense amp senses the data bit voltage on the node Q and in response increases the data bit voltage on the node Q to the higher supply voltage.
    • 片上系统(SoC)包括配置为在较低电源电压下操作的一个或多个核心逻辑块和配置为在较高电源电压下工作的存储器阵列。 存储器中的每个位单元具有串联连接在第一板线和第二板线之间以形成节点Q的两个铁电电容器。通过激活写驱动器将数据位电压传送到节点Q以提供数据位电压响应 到较低的电源电压。 通过激活耦合到所选位单元的节点Q的读出放大器,在节点Q上升高数据位电压,使得感测放大器感测节点Q上的数据位电压,并且响应于增加节点上的数据位电压 Q到更高的电源电压。