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    • 81. 发明申请
    • SECURE VOTING SYSTEM
    • 安全投票制度
    • US20070051804A1
    • 2007-03-08
    • US11162297
    • 2005-09-06
    • Jay AndersonEdward KelleyFranco Motika
    • Jay AndersonEdward KelleyFranco Motika
    • G07C13/00
    • G07C13/00
    • Methods, systems and program products for securely voting by providing a secure voting module in communication with a voting device. A voter signs onto the voting device using a unique voter identification, and the voter's voting selections are written to the voting device. A scrambled voter identification is generated using the unique voter identification and a unique encryption value of the secure voting module, whereby the voting selections and the scrambled voter identification are stored in the secure voting module. Once voting has ended, first and second fuses are blown within the secure voting module for destroying the unique encryption value and for permanently storing the voting selections and scrambled voter identification in a read only secure voting module that maintains voter anonymity while preventing any further physically writing thereto. The voting results may then be counted, re-counted or validated.
    • 通过提供与投票设备通信的安全投票模块来安全投票的方法,系统和程序产品。 投票人使用独特的选民身份登录投票设备,并将投票人的投票选择写入投票设备。 使用独特的选民识别和安全投票模块的唯一加密值来生成加扰的选民识别,由此投票选择和加扰的选民识别被存储在安全投票模块中。 一旦投票结束,第一和第二保险丝在安全投票模块内被吹入,以破坏唯一的加密值,并将投票选择和加密的选民识别永久存储在仅保护投票者匿名的只读安全投票模块中,同时防止进一步的物理写入 到此。 投票结果可能会被计算,重新计算或验证。
    • 82. 发明申请
    • MULTIPLE USE SECURE TRANSACTION CARD
    • 多用途安全交易卡
    • US20060196929A1
    • 2006-09-07
    • US10906692
    • 2005-03-02
    • Edward KelleyFranco Motika
    • Edward KelleyFranco Motika
    • G06K5/00G06K19/06
    • G07F7/1008G06Q20/341G06Q20/3574G06Q20/388G06Q20/4014G06Q20/40975
    • Diverse and or multiple functions are performed in a secure manner using a secure transaction card which validates a holder of the secure transaction card in accordance with a Personal Identification Number (PIN), generates, encrypts and transmits a pair of pseudo-random number sequences through a card reader to validate the card and generates, encrypts and transmits control signals or other information corresponding to a function comprising at least one of personal identity data, passport data, equipment control signals, an entry request to a secure area, medical records or access data therefor, note pad access data and secure telephone entry data in accordance with a protocol suitable for each function. One or more such functions can thus be performed in a secure manner from a single secure transaction card and selection, if needed, can be performed by a menu included in the secure transaction card.
    • 使用安全交易卡执行不同的或多个功能,该安全交易卡根据个人识别号码(PIN)验证安全交易卡的持有者,通过以下方式产生,加密和发送一对伪随机数序列 用于验证所述卡并生成,加密和传输对应于包括个人身份数据,护照数据,设备控制信号,到安全区域的入境请求,医疗记录或访问中的至少一个的功能的控制信号或其他信息 数据,便笺本身访问数据和安全电话录入数据,按照适用于每个功能的协议。 因此,可以以安全的方式从单个安全交易卡执行一个或多个这样的功能,如果需要,可以通过包括在安全交易卡中的菜单执行选择。
    • 87. 发明申请
    • System and method for testing electronic devices on a microchip
    • 在微芯片上测试电子设备的系统和方法
    • US20050138501A1
    • 2005-06-23
    • US10721646
    • 2003-11-25
    • Franco MotikaWilliam Huott
    • Franco MotikaWilliam Huott
    • G01R31/28G01R31/317G01R31/3185G11C29/40
    • G01R31/318566G01R31/31703G11C29/40
    • A system and method for testing first and second sets of electronic devices on a microchip is provided. The first set of devices receive input data and then send output data to a first multiple input shift register (MISR). The second set of devices receiving input data and then sending output data to a second MISR. The method includes determining a first seed signature value associated with the first MISR that induces the first MISR to have a first final signature value comprising a plurality of identical binary values when the first set of devices send valid output data to the first MISR when receiving a first predetermined sequence of input data. The method further includes determining a second seed signature value associated with the second MISR that induces the second MISR to have a second final signature value comprising a plurality of identical binary values when the second set of devices send valid output data to the second MISR when receiving a second predetermined sequence of input data. The method further includes initializing first and second states of the first MISR and the second MISR, respectively, to the first and second signature values, respectively. The method further includes inputting the first and second predetermined sequences of input data to the first and second set of devices, respectively, and generating first and second final signatures values from output data received from the first and second set of devices, respectively. Finally, the method includes indicating that the first and second set of devices have failed testing when at least one of the plurality of binary values in the first and second final signature values are not identical.
    • 提供了一种用于在微芯片上测试第一和第二组电子设备的系统和方法。 第一组设备接收输入数据,然后将输出数据发送到第一个多输入移位寄存器(MISR)。 第二组设备接收输入数据,然后将输出数据发送到第二MISR。 该方法包括:当第一组设备在接收到第一MISR时向第一MISR发送有效输出数据时,确定与第一MISR相关联的第一种子签名值,该第一种子签名值诱导第一MISR具有包括多个相同二进制值的第一最终签名值 第一预定的输入数据序列。 所述方法还包括:当所述第二组设备在接收到所述第二MISR时向第二MISR发送有效输出数据时,确定与所述第二MISR相关联的第二种子签名值,所述第二种子签名值诱导所述第二MISR具有包括多个相同二进制值的第二最终签名值 输入数据的第二预定序列。 该方法还包括分别将第一MISR和第二MISR的第一和第二状态初始化到第一和第二签名值。 该方法还包括分别将输入数据的第一和第二预定序列输入到第一和第二组设备,并分别从从第一和第二组设备接收的输出数据产生第一和第二最终签名值。 最后,该方法包括当第一和第二最终签名值中的多个二进制值中的至少一个不相同时,指示第一和第二组设备具有失败的测试。
    • 89. 发明授权
    • VLSI chip test power reduction
    • VLSI芯片测试功耗降低
    • US06816990B2
    • 2004-11-09
    • US10058485
    • 2002-01-28
    • Peilin SongTimothy J. KoprowskiUlrich BaurFranco Motika
    • Peilin SongTimothy J. KoprowskiUlrich BaurFranco Motika
    • G01R3128
    • G01R31/31721G01R31/31707G01R31/318307G01R31/318502G01R31/318522G01R31/3187
    • LBIST and weighted LBIST tests are performed simultaneously on different portions of the tested object. This new test methodology and design change achieves the same test coverage and test time as the traditional test strategy with dramatic power reduction during test. It can be applied at wafer, chip, MCM, and system levels of test. Most importantly, it does not need new tools for support. Current test software will work as it does with the traditional test strategy. Scheduling the LBIST and weighted LBIST tests in the same test session reduces the overall power consumption because weighted LBIST testing consumes much less power than flat LBIST testing. In the same test session, if some parts of the logic is tested using weighted LBIST while the others were tested using LBIST, the power consumed by the circuit element at any given time is reduced.
    • LBIST和加权LBIST测试在测试对象的不同部分上同时进行。 这种新的测试方法和设计变化与传统的测试策略相比,测试覆盖率和测试时间都大大降低。 它可以应用于晶圆,芯片,MCM和系统测试级别。 最重要的是,它不需要新的支持工具。 当前的测试软件将与传统的测试策略一样工作。 在相同测试会话中调度LBIST和加权LBIST测试降低了整体功耗,因为加权LBIST测试比平面LBIST测试消耗的功率少得多。 在相同的测试会话中,如果使用加权LBIST测试逻辑的某些部分,而使用LBIST测试其他部分,则电路元件在任何给定时间消耗的功率降低。