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81. 发明申请

US20140369751A1 LEVELING DEVICE OF ROAD PAVING MACHINE 审中-公开
标题翻译：道路摊铺机水平装置
公开(公告)号：US20140369751A1
公开(公告)日：2014-12-18
申请号：US14345643
申请日：2012-06-18
申请人： Satoshi Kobayashi , Youhei Itoh , Tetsuya Watanabe , Fumio Gotoh
发明人： Satoshi Kobayashi , Youhei Itoh , Tetsuya Watanabe , Fumio Gotoh
IPC分类号： E01C19/48
CPC分类号： E01C19/4866 , E01C19/48 , E01C2301/16
摘要： [Problem] To improve performance by making it possible to properly conduct minus crown paving work in a paving work width region in which paving work in a minus crown has been impossible in a leveling device which is provided with a main screed and a pair of extendable screeds having almost the same width as the width of the main screed and is of any type among a type in which the pair of extendable screeds is disposed behind the main screed, a type in which the pair of extendable screeds is disposed in front of the main screed, and a type in which one and the other of the pair of the extendable screeds are disposed, respectively, in front of and behind the main screed.[Solution] A pulling mechanism which, if the crown amount is set to a minus amount when the respective inner ends (21a, 22a) of a pair of extendable screeds (21, 22) are extended in a range not going beyond a machine center line, pulls up screed plates (21b, 22b) in a required length range on the sides of the respective inner ends (21a, 22a) of the pair of extendable screeds (21, 22) according to the minus set amount of the crown amount.
摘要翻译： [问题]为了提高性能，可以在设置有主熨平板的调平装置和一对可延伸的平铺装置中，在铺设作业宽度区域中正确地进行负拱顶铺装工作，其中，在铺设工作宽度区域中，具有与主熨平板的宽度几乎相同的宽度的刮板，并且是其中一对可延伸的砂浆布置在主刮板后面的类型中的任何类型，其中一对可延伸的砂浆布置在主刮板前面的类型主要熨平板，以及分别在主熨平板的前面和后面设置一对可延伸的砂浆中的一个和另一个的类型。 [解决方案]一种拉伸机构，当一对可延伸的格栅（21,22）的各个内端（21a，22a）在不超过机器中心的范围内延伸时，如果将冠量设定为负量根据冠的量的负设定量，在一对可伸长的砂浆（21,22）的各个内端（21a，22a）的侧面上，在所需的长度范围内拉起熨平板（21b，22b）。

82. 发明授权

US08771497B2 Electrolyzer, electrodes used therefor, and electrolysis method 有权
标题翻译：电解器，使用的电极和电解法
公开(公告)号：US08771497B2
公开(公告)日：2014-07-08
申请号：US12596767
申请日：2008-04-17
申请人： Hiroshi Maekawa , Mitsuru Sadamoto , Souta Itou , Shin Fukuda , Kentaro Suzuki , Tetsuya Watanabe , Katsumi Isozaki
发明人： Hiroshi Maekawa , Mitsuru Sadamoto , Souta Itou , Shin Fukuda , Kentaro Suzuki , Tetsuya Watanabe , Katsumi Isozaki
IPC分类号： C25B1/24 , C25B9/06 , C25B11/03
CPC分类号： C25B11/03 , C25B1/245
摘要： An electrolyzer is comprised of an anode and a cathode which are in contact with an electrolytic solution, wherein at least one of the anode and the cathode is composed of an electric conductor having a gas permeable structure comprising a gas generating surface at which gas is generated by electrolysis of the electrolytic solution, a plurality of through holes leading from the gas generating surface to a different surface and allowing the gas generated on the gas generating surface to selectively pass therethrough, and a gas releasing surface which is the different surface for releasing the gas supplied from the gas generating surface via the through holes. At least one of a surface treatment which causes the gas generating surface to be lyophilic for the electrolytic solution and a surface treatment which causes the gas releasing surface to be lyophobic for the electrolytic solution is performed.
摘要翻译：电解槽由与电解液接触的阳极和阴极组成，其中阳极和阴极中的至少一个由具有透气结构的电导体构成，该透气结构包括产生气体的气体产生表面通过电解电解液，从气体发生表面引导到不同表面的多个通孔，并允许在气体发生表面上产生的气体选择性地通过其中;以及气体释放表面，其是不同的表面，用于释放从气体发生表面通过通孔供应的气体。执行使气体产生表面对于电解液是亲液的表面处理和使排气表面为电解液疏液的表面处理中的至少一种。

83. 发明授权

US08710524B2 Light emitting element, method for manufacturing the light emitting element, optical element and method for manufacturing the optical element 失效
标题翻译：发光元件，制造发光元件的方法，光学元件及其制造方法
公开(公告)号：US08710524B2
公开(公告)日：2014-04-29
申请号：US12529984
申请日：2008-03-05
申请人： Yoshihisa Usami , Tadasuke Takahashi , Tetsuya Watanabe
发明人： Yoshihisa Usami , Tadasuke Takahashi , Tetsuya Watanabe
IPC分类号： H01L33/00
CPC分类号： H01L33/10 , H01L33/54 , H01L33/58 , H01L2933/0091
摘要： Fine asperities are simply formed in the surface of a light emission surface to improve an luminous efficiency of a light emitting element. An LED element 10 is prepared as an example of a luminous body, and a thermally deformable heat mode recording material layer 12 is formed in the light emission surface 18 of the LED element 10. The recording material layer 12 is then illuminated with condensed light so that a plurality of recessed portions 15 are formed at a pitch of 0.01-100 times a center wavelength of the light emitted from the LED element 10.
摘要翻译：在发光面的表面简单地形成微细的凹凸，以提高发光元件的发光效率。准备LED元件10作为发光体的实例，并且在LED元件10的发光表面18中形成可热变形的热模式记录材料层12.然后，记录材料层12被聚光照射，因此多个凹部15以从LED元件10发射的光的中心波长的0.01-100倍的间距形成。

84. 发明申请

US20120196515A1 POLISHING PAD 有权
标题翻译：抛光垫
公开(公告)号：US20120196515A1
公开(公告)日：2012-08-02
申请号：US13444376
申请日：2012-04-11
申请人： Takashi KATAYAMA , Tetsuya Watanabe , Yukio Goto , Shinya Kato , Toshiyasu Yajima
发明人： Takashi KATAYAMA , Tetsuya Watanabe , Yukio Goto , Shinya Kato , Toshiyasu Yajima
IPC分类号： B24D11/00 , B24B1/00 , B24B29/00
CPC分类号： B24B37/24 , B24D11/006 , D03D13/008
摘要： To provide a polishing pad (14) useful for polishing semiconductor materials having a high hardness. The polishing pad (14) is used for polishing a workpiece (16) in combination with loose grains and comprises a polishing surface (15) comprising a textile of high-tenacity organic fibers, the fiber has a tenacity of not lower than 15 cN/dtex. In the textile, the high-tenacity organic fiber may have a single fiber fineness within the range between 0.3 dtex and 15 dtex, or a total fineness of within the range between 3 dtex and 3,000 dtex. The fiber may include, for example, a fully-aromatic polyester fiber.
摘要翻译：提供可用于研磨具有高硬度的半导体材料的抛光垫（14）。抛光垫（14）用于与松散的颗粒结合抛光工件（16），并且包括具有高强度有机纤维织物的抛光表面（15），该纤维的强度不低于15cN / dtex 在织物中，高强度有机纤维的单纤维纤度可以在0.3dtex至15dtex之间的范围内，或者总细度在3dtex至3,000dtex之间的范围内。纤维可以包括例如全芳族聚酯纤维。

85. 发明申请

US20120062890A1 Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device 审中-公开
标题翻译：检测颗粒的方法及其装置或半导体器件的缺陷
公开(公告)号：US20120062890A1
公开(公告)日：2012-03-15
申请号：US13298079
申请日：2011-11-16
申请人： Hidetoshi Nishiyama , Minori Noguchi , Yoshimasa Ooshima , Akira Hamamatsu , Kenji Watanabe , Tetsuya Watanabe , Takahiro Jingu
发明人： Hidetoshi Nishiyama , Minori Noguchi , Yoshimasa Ooshima , Akira Hamamatsu , Kenji Watanabe , Tetsuya Watanabe , Takahiro Jingu
IPC分类号： G01N15/02
CPC分类号： G01N21/4738 , G01N21/8806 , G01N21/93 , G01N21/94 , G01N21/9501 , G01N2015/1486 , G01N2015/1493
摘要： Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are analyzed. Since the inspection apparatus outputs a large number of detected particles/defects, an immense time is required for analyzing the detected particles/defects, resulting in a delay in taking countermeasures to a failure in the manufacturing processes. In the present invention, an apparatus for optically inspecting particles or defects relates a particle or defect size to a cause of failure in an inspection result. A data processing circuit points out a cause of failure from the statistics on the inspection result, and displays information on the inspection result. A failure analysis is conducted by setting a threshold for identifying a failure in each of regions on a semiconductor device or the like to statistically evaluate detected particles.
摘要翻译：通常，作为检测结果，粒子/缺陷检查装置输出检测出的粒子/缺陷的总数。对于制造过程中的故障采取对策，分析检查装置检测到的颗粒/缺陷。由于检查装置输出大量检测到的粒子/缺陷，所以需要巨大的时间来分析检测到的粒子/缺陷，从而导致制造过程中的失败的对策的延迟。在本发明中，用于光学检查颗粒或缺陷的装置在检查结果中将颗粒或缺陷尺寸与故障原因相关联。数据处理电路从检查结果统计中指出故障原因，并显示检查结果信息。通过设定用于识别半导体装置等上的各区域的故障的阈值来进行故障分析，以统计学评价检测出的粒子。

86. 发明申请

US20110222391A1 METHOD FOR MANUFACTURING MEDIUM ON WHICH INFORMATION IS RECORDED IN PIT PATTERN 失效
标题翻译：在PIT PATTERN中记录信息的方法
公开(公告)号：US20110222391A1
公开(公告)日：2011-09-15
申请号：US12673565
申请日：2008-05-16
申请人： Yoshihisa Usami , Tetsuya Watanabe
发明人： Yoshihisa Usami , Tetsuya Watanabe
IPC分类号： C23F1/02 , G11B7/26
CPC分类号： G11B7/261 , B41M5/24 , Y10T428/21
摘要： A method by which depressions and projections (pit pattern) can be formed directly and easily in a substrate made of inorganic material is provided. A method for forming a medium on which information is recorded in a pit pattern comprises the steps of: forming a recording material layer (21) over a substrate (11) made of inorganic material wherein the recording material layer is of a thermally deformable heat mode recording material; forming a plurality of holes 15 by application of condensed light to the recording material layer (21); and forming a plurality of pits (16) in the substrate wherein the plurality of pits corresponding to the plurality of holes (15) are etched by using as a mask the recording material layer (21) in which the plurality of holes are formed.
摘要翻译：提供了在由无机材料制成的基板中可以直接且容易地形成凹陷和突起（凹坑图案）的方法。用于形成以凹坑图形记录信息的介质的方法包括以下步骤：在由无机材料制成的基板（11）上形成记录材料层（21），其中记录材料层是可热变形的热模式录音材料; 通过向记录材料层（21）施加聚光来形成多个孔15; 以及在所述基板中形成多个凹坑（16），其中通过使用其中形成有所述多个孔的记录材料层（21）作为掩模蚀刻对应于所述多个孔（15）的多个凹坑。

87. 发明申请

US20100165398A1 Image forming device and image forming method 失效
标题翻译：图像形成装置和图像形成方法
公开(公告)号：US20100165398A1
公开(公告)日：2010-07-01
申请号：US12654225
申请日：2009-12-15
申请人： Tetsuya Watanabe
发明人： Tetsuya Watanabe
IPC分类号： G06F15/00
CPC分类号： H04N1/2307 , H04N1/233 , H04N1/2361
摘要： An image forming device includes a first development unit configured to form a first image on a recording medium with a first developer, a second development unit configured to form a second image on the recording medium with at least one of a plurality of second developers that are different from the first developer, and a print control unit configured to select the at least one of the plurality of second developers for forming the second image. The second developers are transparent developers, and the second image is a transparent image
摘要翻译：图像形成装置包括：第一显影单元，被配置为在第一显影剂的记录介质上形成第一图像;第二显影单元，被配置为在记录介质上形成第二图像，所述第二显影单元具有多个第二显影剂中的至少一个，不同于第一显影剂的打印控制单元和被配置为选择用于形成第二图像的多个第二显影器中的至少一个的打印控制单元。第二个开发者是透明的开发者，第二个图像是透明的图像

88. 发明授权

US07692779B2 Apparatus and method for testing defects 失效
标题翻译：检测缺陷的装置和方法
公开(公告)号：US07692779B2
公开(公告)日：2010-04-06
申请号：US11244080
申请日：2005-10-06
申请人： Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Shunichi Matsumoto , Yukio Kembo , Ryouji Matsunaga , Keiji Sakai , Takanori Ninomiya , Tetsuya Watanabe , Hisato Nakamura , Takahiro Jingu , Yoshio Morishige , Shuichi Chikamatsu
发明人： Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Shunichi Matsumoto , Yukio Kembo , Ryouji Matsunaga , Keiji Sakai , Takanori Ninomiya , Tetsuya Watanabe , Hisato Nakamura , Takahiro Jingu , Yoshio Morishige , Shuichi Chikamatsu
IPC分类号： G01N21/00
CPC分类号： B82Y15/00 , G01N21/94 , G01N21/95623 , G01N21/95684 , G01N2021/8822 , G01R31/308 , H01J37/00 , H01J2237/022 , H01J2237/0225 , H01L21/67253 , H01L21/67288 , H01L21/681 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： An apparatus for detecting defects on a specimen including an illumination optical unit which obliquely projects a laser onto a region which is longer in one direction than in a direction transverse to said one direction on a surface of a specimen, a table unit which mounts said specimen and which is movable, a detection optical unit which detects with an image sensor an image of light formed by light reflected from said specimen in both directions of the one direction and the direction transverse and which reflected light in both directions is formed on said image sensor while said table is moving, a signal processor which processes a signal outputted from said image sensor of said detection optical unit to extract defects of said specimen. A display unit which displays information of defects extracted by said signal processor.
摘要翻译：一种用于检测试样上的缺陷的装置，包括照射光学单元，该照明光学单元将激光倾斜地突出到在一个方向上比沿垂直于所述一个方向的横向方向在一个方向上更长的区域;安装所述样本的台单元检测光学单元，其利用图像传感器检测在所述图像传感器上形成有从所述一个方向的两个方向和横向方向反射的光形成的光，并且在所述图像传感器上形成两个方向的反射光当所述表移动时，信号处理器处理从所述检测光学单元的所述图像传感器输出的信号，以提取所述样本的缺陷。一种显示由所述信号处理器提取的缺陷信息的显示单元。

89. 发明授权

US07649238B2 Semiconductor device 有权
标题翻译：半导体器件
公开(公告)号：US07649238B2
公开(公告)日：2010-01-19
申请号：US12108369
申请日：2008-04-23
申请人： Tetsuya Watanabe , Takashi Ipposhi
发明人： Tetsuya Watanabe , Takashi Ipposhi
IPC分类号： H01L29/06 , H01L27/12
CPC分类号： H01L21/84 , H01L27/1203 , H01L29/78615
摘要： In a PMOS transistor, the source-drain region is divided into four parts along the gate width and has an arrangement of four independent source regions and an arrangement of four independent drain regions. A partial trench isolation insulating film is arranged in contact with the whole of the opposed surfaces between the four source regions in such a manner that the channel region formed under the gate electrode is divided across the channel length. A body-tied region containing N-type impurities relatively high in concentration is arranged in contact with the side surface of the source region opposite to the gate electrode, and the potential of the body region is fixed through the well region from the body-tied region.
摘要翻译：在PMOS晶体管中，源极 - 漏极区域沿着栅极宽度分成四个部分，并且具有四个独立源极区域和四个独立漏极区域的布置的布置。部分沟槽隔离绝缘膜被布置成与四个源极区域之间的整个相对表面接触，使得形成在栅电极下方的沟道区域跨越沟道长度被划分。包含浓度相对较高的N型杂质的身体绑扎区域与源极区域与栅电极相对的侧表面接触，并且身体区域的电位通过井身区域从身体绑定地区。

90. 发明授权

US07639350B2 Apparatus and method for testing defects 失效
标题翻译：检测缺陷的装置和方法
公开(公告)号：US07639350B2
公开(公告)日：2009-12-29
申请号：US11681981
申请日：2007-03-05
申请人： Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Shunichi Matsumoto , Yukio Kembo , Ryouji Matsunaga , Keiji Sakai , Takanori Ninomiya , Tetsuya Watanabe , Hisato Nakamura , Takahiro Jingu , Yoshio Morishige , Shuichi Chikamatsu
发明人： Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Shunichi Matsumoto , Yukio Kembo , Ryouji Matsunaga , Keiji Sakai , Takanori Ninomiya , Tetsuya Watanabe , Hisato Nakamura , Takahiro Jingu , Yoshio Morishige , Shuichi Chikamatsu
IPC分类号： G01N21/00
CPC分类号： B82Y15/00 , G01N21/94 , G01N21/95623 , G01N21/95684 , G01N2021/8822 , G01R31/308 , H01J37/00 , H01J2237/022 , H01J2237/0225 , H01L21/67253 , H01L21/67288 , H01L21/681 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： A method for detecting defects on a specimen includes mounting a specimen on a table with which is movable, obliquely projecting a laser as a line onto a surface of the specimen, detecting with an image sensor an image of light formed by light reflected from the specimen and passed through a filter which blocks scattered light resulting from repetitive patterns formed on the specimen, processing a signal outputted from the image sensor to extract defects of the specimen, and a displaying information of defects extracted by the signal processor.
摘要翻译：一种检测试样缺陷的方法，其特征在于，将试样安装在可移动的台面上，将作为线的激光线倾斜投射到试样的表面上，用图像传感器检测由试样反射的光形成的光的图像通过滤波器，该滤波器阻挡由样本上形成的重复图案产生的散射光，处理从图像传感器输出的信号，提取样本的缺陷，以及由信号处理器提取的缺陷的显示信息。

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