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81. 发明授权

US3948899A .alpha.-Cyanobenzylpiperazines and a process for producing the same 失效
标题翻译： {60-氰基苄基哌嗪及其制备方法
公开(公告)号：US3948899A
公开(公告)日：1976-04-06
申请号：US495426
申请日：1974-08-07
申请人： Katsumi Sakai , Riitiro Iwaki , Katsuki Taoka , Hiroshi Nakajima , Yasuo Yamada
发明人： Katsumi Sakai , Riitiro Iwaki , Katsuki Taoka , Hiroshi Nakajima , Yasuo Yamada
IPC分类号： C07D295/20 , C07D295/145 , C07D295/205 , C07D295/18
CPC分类号： C07D295/205 , C07D295/145
摘要： .alpha.-Cyanobenzylpiperazines represented by the formula ##SPC1##Or an acid addition salt thereof, wherein R.sub.1 is a halogen or 1-3C lower alkoxy, R.sub.2 and R.sub.3 are each hydrogen or 1-3C lower alkoxy, R.sub.4 is 1-3C lower alkyl, and R.sub.5 is hydrogen or 1-3C lower alkyl, which are produced by reacting an aromatic carbonyl compound with hydrogen cyanide or a salt thereof and N-alkoxycarbonyl piperazine or an acid addition salt thereof.
摘要翻译：由式或其酸加成盐表示的α-氰基苄基哌嗪，其中R1是卤素或1-3C低级烷氧基，R2和R3各自为氢或1-3C低级烷氧基，R4为1-3C低级烷基，R5为氢或1-3C低级烷基，其通过使芳族羰基化合物与氰化氢或其盐和N-烷氧基羰基哌嗪或其酸加成盐反应而制备。

82. 发明授权

US09330202B2 Exercise detection apparatus and control method for exercise detection apparatus 有权
标题翻译：运动检测装置及运动检测装置的控制方法
公开(公告)号：US09330202B2
公开(公告)日：2016-05-03
申请号：US13711273
申请日：2012-12-11
申请人： Eriko Kan , Hideya Marukawa , Naoki Tsuchiya , Hiroshi Nakajima , Yoshitake Oshima
发明人： Eriko Kan , Hideya Marukawa , Naoki Tsuchiya , Hiroshi Nakajima , Yoshitake Oshima
IPC分类号： G01B3/02 , G06F17/40 , A61B5/11 , A61B5/22 , A61B5/00 , G01C22/00 , A61B5/02
CPC分类号： G06F17/40 , A61B5/02042 , A61B5/1118 , A61B5/221 , A61B5/6823 , A61B5/6831 , A61B2560/0257 , A61B2562/0219 , G01C22/006
摘要： An exercise detection apparatus determines body movements based on data detected by a detection unit, judges movement states for each body movement based on data detected by the detection unit, corrects the movement states based on a predetermined rule, calculates an exercise state of a user based on a result of the judgment, and stores the calculated exercise state in a storage unit. Accordingly, it is possible to provide an exercise detection apparatus capable of reducing erroneous judgments of the exercise states of the user.
摘要翻译：运动检测装置根据检测部检测出的数据来判定身体动作，根据检测部所检测到的数据判定每个身体运动的移动状态，根据规定的规则校正运动状态，计算用户的运动状态根据判断结果，将计算出的运动状态存储在存储部中。因此，能够提供能够减少用户的锻炼状态的错误判断的运动检测装置。

83. 发明授权

US09086907B2 Apparatus and method for managing virtual machine addresses 有权
标题翻译：用于管理虚拟机地址的设备和方法
公开(公告)号：US09086907B2
公开(公告)日：2015-07-21
申请号：US13608362
申请日：2012-09-10
申请人： Hiroshi Nakajima
发明人： Hiroshi Nakajima
IPC分类号： G06F15/177 , G06F9/455 , H04N21/443
CPC分类号： G06F9/45558 , G06F9/45533 , G06F2009/45595 , H04N21/4437
摘要： According to one embodiment, an apparatus is configured to carry out a 1st virtual machine and a 2nd virtual machine. The 1st virtual machine includes a notifying module configured to notify a 1st port number to the 2nd virtual machine, and a 1st transmitter configured to transmit, to a network, a 1st packet including a source port number indicating port number other than the 1st port number. The 2nd virtual machine includes a 2nd transmitter configured to transmit, to the network, a 2nd packet including a source port number indicating the 1st port number. The apparatus includes a sorting module configured to sort a received packet to the 1st virtual machine or the 2nd virtual machine.
摘要翻译：根据一个实施例，一种装置被配置为执行第一虚拟机和第二虚拟机。第一虚拟机包括：通知模块，被配置为向第二虚拟机通知第一端口号;以及第一发送器，被配置为向网络发送包括指示不同于第一端口号的端口号的源端口号的第一包。第二虚拟机包括第二发射机，被配置为向网络发送包括指示第一端口号的源端口号的第二分组。该装置包括：排序模块，被配置为将接收到的分组分类到第一虚拟机或第二虚拟机。

84. 发明授权

US08733428B2 Air conditioning system for vehicle 有权
标题翻译：汽车空调系统
公开(公告)号：US08733428B2
公开(公告)日：2014-05-27
申请号：US12646663
申请日：2009-12-23
申请人： Hiroshi Nakajima
发明人： Hiroshi Nakajima
IPC分类号： F25B29/00
CPC分类号： B60H1/00785 , B60H2001/00992
摘要： An air conditioning system of a vehicle including a controller and sensors in communication with the controller. The sensors include an interior temperature sensor for determining the temperature of the vehicle interior and an inner surface temperature sensor for determining the temperature of the inner surface of the vehicle's windshield. The controller determines a dew-point for the vehicle interior based on the sensed interior temperature. The controller adjusts the dew-point or the inner surface temperature based on a correction value, and performs a defogging operation when the temperature of the inner surface of the windshield is less than the dew-point, wherein the dew-point or the inner surface temperature is adjusted.
摘要翻译：一种车辆的空调系统，包括控制器和与控制器通信的传感器。传感器包括用于确定车辆内部温度的内部温度传感器和用于确定车辆挡风玻璃内表面的温度的内表面温度传感器。控制器基于感测的内部温度来确定车辆内部的露点。控制器基于校正值调节露点或内表面温度，并且当挡风玻璃的内表面的温度低于露点时进行除雾操作，其中露点或内表面温度调节。

85. 发明授权

US08718110B2 Nitride semiconductor laser and epitaxial substrate 有权
标题翻译：氮化物半导体激光器和外延衬底
公开(公告)号：US08718110B2
公开(公告)日：2014-05-06
申请号：US13366636
申请日：2012-02-06
申请人： Takashi Kyono , Yohei Enya , Takamichi Sumitomo , Yusuke Yoshizumi , Masaki Ueno , Katsunori Yanashima , Kunihiko Tasai , Hiroshi Nakajima
发明人： Takashi Kyono , Yohei Enya , Takamichi Sumitomo , Yusuke Yoshizumi , Masaki Ueno , Katsunori Yanashima , Kunihiko Tasai , Hiroshi Nakajima
IPC分类号： H01S5/00
CPC分类号： H01S5/3201 , B82Y20/00 , H01S5/028 , H01S5/2009 , H01S5/2031 , H01S5/3063 , H01S5/3202 , H01S5/3211 , H01S5/34333 , H01S2304/04
摘要： A nitride semiconductor laser includes an electrically conductive support substrate with a primary surface of a gallium nitride based semiconductor, an active layer provided above the primary surface, and a p-type cladding region provided above the primary surface. The primary surface is inclined relative to a reference plane perpendicular to a reference axis extending in a direction of the c-axis of the gallium nitride based semiconductor. The p-type cladding region includes first and second p-type Group III nitride semiconductor layers. The first p-type semiconductor layer comprises an InAlGaN layer including built-in anisotropic strain. The second p-type semiconductor layer comprises semiconductor different from material of the InAlGaN layer. The first nitride semiconductor layer is provided between the second p-type semiconductor layer and the active layer. The second p-type semiconductor layer has a resistivity lower than that of the first p-type semiconductor layer.
摘要翻译：氮化物半导体激光器包括具有氮化镓基半导体的主表面的导电支撑衬底，设置在主表面上方的有源层和设置在主表面上的p型覆层区域。主表面相对于垂直于在氮化镓基半导体的c轴方向上延伸的参考轴的参考平面倾斜。 p型包层区域包括第一和第二p型III族氮化物半导体层。第一p型半导体层包括包括内置各向异性应变的InAlGaN层。第二p型半导体层包括与InAlGaN层的材料不同的半导体。第一氮化物半导体层设置在第二p型半导体层和有源层之间。第二p型半导体层的电阻率低于第一p型半导体层的电阻率。

86. 发明授权

US08502966B2 Surface defect inspection method and apparatus 失效
标题翻译：表面缺陷检查方法及装置
公开(公告)号：US08502966B2
公开(公告)日：2013-08-06
申请号：US13646066
申请日：2012-10-05
申请人： Kenichi Shitara , Hiroshi Nakajima
发明人： Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/47
摘要： The present invention provides an apparatus and method which enable detecting a microscopic defect sensitively by efficiently collecting and detecting scattering light from a defect in a wider region without enlarging the apparatus. In the apparatus for inspecting a defect on a surface of a sample, including illumination means which irradiates a surface of a sample with laser, reflected light detection means which detects reflected light from the sample, and signal processing means which processes a detected signal and detecting a defect on the sample, the reflected light detection means is configured to include a scattering light detection unit which collects scattering light components of the reflected light from the sample by excluding specularly reflected light components by using an aspheric flannel lens and detecting the scattering light components.
摘要翻译：本发明提供了一种能够通过在不扩大设备的情况下有效地收集和检测来自较宽区域的缺陷的散射光而敏感地检测微观缺陷的装置和方法。在用于检查样品表面上的缺陷的装置中，包括用激光照射样品表面的照射装置，检测来自样品的反射光的反射光检测装置和处理检测信号的信号处理装置，反射光检测装置被配置为包括：散射光检测单元，其通过使用非球面法兰绒透镜排除镜面反射光分量并且检测散射光分量来收集来自样品的反射光的散射光分量。

87. 发明申请

US20120324993A1 Transducer Assembly For A Downhole Tools 审中-公开
标题翻译：井下工具传感器组件
公开(公告)号：US20120324993A1
公开(公告)日：2012-12-27
申请号：US13600159
申请日：2012-08-30
申请人： Hiroshi Nakajima , Toshihiro Kinoshita , Takeo Fujihara , Yasuo Kanaya
发明人： Hiroshi Nakajima , Toshihiro Kinoshita , Takeo Fujihara , Yasuo Kanaya
IPC分类号： E21B47/017
CPC分类号： E21B47/011 , G01V1/186
摘要： Methods and related systems are described relating to a sealed acoustic transducer assembly for use in a wellbore is provided. A tool body is deployed in the wellbore, having a groove and a sealed acoustic transducer assembly removeably mounted therein. The transducer assembly includes an acoustic transducer element, and an elongated fluid filled sealed container housing the transducer element. The container includes flexible portions along the length of the container which allows for volume changes when exposed to changes in external pressure and/or temperature. Acoustic measurements downhole are made using the transducer element.
摘要翻译：描述了与在井眼中使用的密封声换能器组件相关的方法和相关系统。工具体部署在井眼中，具有凹槽和可移除地安装在其中的密封的声换能器组件。换能器组件包括声换能器元件和容纳换能器元件的细长流体填充的密封容器。容器包括沿着容器长度的柔性部分，当暴露于外部压力和/或温度的变化时允许体积变化。使用换能器元件进行井下声学测量。

88. 发明申请

US20120288164A1 COMPARING DEVICE 有权
标题翻译：比较装置
公开(公告)号：US20120288164A1
公开(公告)日：2012-11-15
申请号：US13468345
申请日：2012-05-10
申请人： Sei Nagashima , Hiroshi Nakajima
发明人： Sei Nagashima , Hiroshi Nakajima
IPC分类号： G06K9/68 , G06K9/46
CPC分类号： G06K9/00281 , G06K9/6215 , G06K9/6857
摘要： When comparing a reference image and a registered image, a reference image is defined as a high-resolution image of the highest resolution and a first low-resolution image is generated on a lower level, and a second low-resolution image is generated on a lower level. Registered images are read one-at-a-time, feature regions are set in the hierarchical images of the registered images, and corresponding regions are found in the reference image through hierarchical searching from the low-resolution image towards the high-resolution image. An evaluation is made as to whether to select the registered image that has been read out, based on a similarity between the low-resolution hierarchical image, for example, a feature region of the hierarchical image of the registered image, and the corresponding region of the hierarchical image of the reference image, to narrow down the registered images to be compared to the reference image.
摘要翻译：当比较参考图像和登记图像时，将参考图像定义为最高分辨率的高分辨率图像，并且在较低级别上生成第一低分辨率图像，并且在第一低分辨率图像上生成第二低分辨率图像低等级。注册的图像被一一读取，特征区域被设置在登记图像的分层图像中，并且通过从低分辨率图像到高分辨率图像的分层搜索，在参考图像中找到对应的区域。基于低分辨率分层图像（例如，登记图像的分层图像的特征区域）与相应区域的相似度，判断是否选择已读出的登记图像参考图像的分层图像，以缩小登记图像以与参考图像进行比较。

89. 发明授权

US08294888B2 Surface defect inspection method and apparatus 失效
标题翻译：表面缺陷检查方法及装置
公开(公告)号：US08294888B2
公开(公告)日：2012-10-23
申请号：US12855873
申请日：2010-08-13
申请人： Kenichi Shitara , Hiroshi Nakajima
发明人： Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/47
摘要： The present invention provides an apparatus and method which enable detecting a microscopic defect sensitively by efficiently collecting and detecting scattering light from a defect in a wider region without enlarging the apparatus. In the apparatus for inspecting a defect on a surface of a sample, including illumination means which irradiates a surface of a sample with laser, reflected light detection means which detects reflected light from the sample, and signal processing means which processes a detected signal and detecting a defect on the sample, the reflected light detection means is configured to include a scattering light detection unit which collects scattering light components of the reflected light from the sample by excluding specularly reflected light components by using an aspheric flannel lens and detecting the scattering light components.
摘要翻译：本发明提供了一种能够通过在不扩大设备的情况下有效地收集和检测来自较宽区域的缺陷的散射光而敏感地检测微观缺陷的装置和方法。在用于检查样品表面上的缺陷的装置中，包括用激光照射样品表面的照射装置，检测来自样品的反射光的反射光检测装置和处理检测信号的信号处理装置，反射光检测装置被配置为包括：散射光检测单元，其通过使用非球面法兰绒透镜排除镜面反射光分量并且检测散射光分量来收集来自样品的反射光的散射光分量。

90. 发明授权

US08208356B2 Optical checking method and apparatus for defects in magnetic disks 有权
标题翻译：磁盘缺陷的光学检查方法和装置
公开(公告)号：US08208356B2
公开(公告)日：2012-06-26
申请号：US12975405
申请日：2010-12-22
申请人： Ayumu Ishihara , Hiroshi Nakajima
发明人： Ayumu Ishihara , Hiroshi Nakajima
IPC分类号： G11B7/00 , G01N21/00
CPC分类号： G11B20/18 , G11B2020/1826 , G11B2220/2516
摘要： An apparatus for optically checking magnetic disk defects that makes possible more accurate determination of positions of minute defects by illuminating an area greater than a checkup area with an illuminating beam having a Gaussian distribution is to be provided. The apparatus is configured of a specular reflection detecting device including a detector having a detecting face including an array of multiple pixels, and a processing device that figures out the position of each defect by using, in addition to the output signal from each of the pixels of the detector that detected a specular reflection from the checkup area, also output signals of some pixels out of the multiple pixels having detected the specular reflection from the checkup area of one turn before and the checkup area of one turn after, both adjoining in the radial direction, and determines the type of the defect.
摘要翻译：提供一种用于光学检查磁盘缺陷的装置，其能够通过用具有高斯分布的照明光束照射大于检查区域的区域来更精确地确定微小缺陷的位置。该装置由包括具有包括多个像素的阵列的检测面的检测器的镜面反射检测装置构成，以及处理装置，除了来自每个像素的输出信号之外，还使用除去每个缺陷的位置检测到来自检验区域的镜面反射的检测器的输出信号也输出从已经检测到来自前一轮的检查区域的检测区域的检测区域的多个像素中的一些像素的输出信号以及一匝之后的检验区域径向，并确定缺陷的类型。

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