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    • 81. 发明专利
    • INFRARED-RAY THERMOMETER
    • JPH03118429A
    • 1991-05-21
    • JP25526389
    • 1989-10-02
    • FUJITSU LTD
    • SAWADA SHIGETOMOKOBAYASHI KAZUOUEHARA YUJISATO FUMIHIKO
    • G01J5/02
    • PURPOSE:To measure temperature accurately by operating the relationship between the detected temperature and the amount of infrared rays based on the amount of the infrared rays from a shutter when the temperature is not measured, and computing the temperature based on the result of the operation and the measured amount of the infrared rays when the temperature is measured. CONSTITUTION:When temperature is not measured, a switch 22 is connected to a terminal (a) based on the signal from a shutter opening and closing part 83. The temperature of the shutter is detected with a thermocouple and inputted into a temperature measuring part 24. The infrared rays radiated from the shutter are detected with an infrared ray sensor 21 through an optical fiber 5. Then, the detected amount of the infrared rays are inputted into an infrared-ray-attenuating-rate operating part 23 through the switch 22. The attenuating rate of the infrared rays due to the contamination of a probe is operated. When the temperature is measured, the switch 22 is connected to a terminal (b) based on the signal from the opening and closing part 83. The amount of the infrared rays radiated from a disk is detected with the sensor 21 through the optical fiber 5 and inputted into a temperature operating part 25. In the operating part 25, present temperature is operated highly accurately based on the attenuating rate of the infrared rays inputted from the operating part 23. The result is displayed on a temperature display part 26.
    • 82. 发明专利
    • FORMATION OF THIN FILM AND ETCHING METHOD
    • JPH0382763A
    • 1991-04-08
    • JP21753289
    • 1989-08-25
    • FUJITSU LTD
    • UEHARA YUJIKOBAYASHI KAZUO
    • C23C14/54C23F4/00H01L21/203H01L21/302H01L21/3065
    • PURPOSE:To accurately detect the speed of particles of a thin film forming element in plasma of gas and to properly control the formation of a thin film by measuring the Doppler width or Doppler shift of luminous rays not causing transition to the ground state from the particles. CONSTITUTION:Gas introduced into a vacuum vessel 1 is converted into plasma with a power source 14 for sputtering between a substrate 3 and a target 5 placed opposite to each other in the vessel 1. The plasma is converged on the target 5 through an electromagnet 16 and particles of a thin film forming element generated by sputtering are deposited on the substrate 3 to form a thin film. In this method, luminous rays from the particles in the plasma are introduced into a Fabry-Perot interference spectrometer 19 through a light receiving element 17 and optical fibers 18 and the Doppler width and/or Doppler shift of luminous rays not causing transition to the ground state among the introduced luminous rays is measured. This measured value is inputted into a computer 23 through a photodetector 21 and operational factors affecting the energy of the particles are controlled. The accuracy of measurement of the speed of the particles in the plasma is enhanced and the formation of a thin film is properly controlled.
    • 83. 发明专利
    • FORMING MAGNETIC THIN FILM
    • JPH02246306A
    • 1990-10-02
    • JP6834689
    • 1989-03-20
    • FUJITSU LTD
    • UEHARA YUJIKOBAYASHI KAZUOSAWADA SHIGETOMOSATO FUMIHIKO
    • C23C14/14C23C14/34H01F41/18
    • PURPOSE:To stabilize the magnetic characteristics of a thin film, and improve the yield by controlling the power of a power supply at the time of sputtering formation of a Cr-containg alloy thin film, electromagnet current and Ar gas pressure by using luminous spectrum wavelength of Cr excitation atom as an index. CONSTITUTION:Rays from Cr atom at the time of sputtering are collected at the end portion of an optical fiber 24 by a condenser lens 23; only 357.9nm ray is led out with a spectroscope 3; while this ray is inputted to a Fabry-Perot spectrometer 1 via a lens 2a. Output from the spectrometer 1 is detected by a photo detector 25 via a lens 2b, and a computer 21 calculates the half-width of wavelength of luminous spectrum to be affected by Doppler effect. The following are so controlled that the calculated value is kept always at the optimum value set for film formation; the power of a sputtering power supply, a current made to flow in an electromagnet for controlling the magnetic field generating on the surface of a target, and the pressure of Ar gas. Thereby a film wherein the magnetic and structural characteristics are optimum and constant can be obtained.
    • 84. 发明专利
    • MEASURING METHOD OF TEMPERATURE OF SUBSTRATE IN VACUUM FILM-FORMING CHAMBER
    • JPH0264424A
    • 1990-03-05
    • JP21701588
    • 1988-08-31
    • FUJITSU LTD
    • SATO FUMIHIKOKOBAYASHI KAZUOSAWADA SHIGETOMOUEHARA YUJI
    • G01J5/00
    • PURPOSE:To eliminate a variation in a measured value with the lowering of transmittance of infrared rays due to the stain of a probe for measurement and thereby to conduct accurate measurement of temperature by calibrating the measured value of the main body of a thermometer by using a blackbody furnace installed in a vacuum film-forming chamber. CONSTITUTION:In the case when an indicated value of a measured temperature by the main body 9' of a thermometer is different from a controlled temperature of the above-mentioned blackbody furnace 18, the indicated temperature is made to accord with the temperature of the blackbody furnace 18 by increasing a rate of amplification on the occasion of conversion of a detected amount of infrared emission into an electric signal by means of a volume adjusting knob of the main body 9' of the thermometer, for instance. Then, a probe 10 is moved to the blackbody furnace 18, the amount of emission of infrared rays is measured and calibration of an indicated temperature value of the main body 9' of the thermometer is conducted. At that time, the degree of the lowering of transmittance of the infrared rays due to a stain is known from the comparison between the temperature due to the amount of the infrared rays and a temperature due to a previously-measured amount of infrared rays. By calibrating a rate of emission of the thermometer by the rate of the lowering when a substrate temperature is measured subsequently, accordingly, the substrate temperature can be measured again with high precision.
    • 85. 发明专利
    • MAGNETIC RECORDING DEVICE
    • JPH01231080A
    • 1989-09-14
    • JP5616488
    • 1988-03-11
    • FUJITSU LTD
    • WANO MASAHIRONAKAMURA SEIKICHIUEHARA YUJINAKA TOSHIYAMIKAMI TOMOHISAEBINAKA TOSHIOMOROO JUN
    • B41J2/42G03G19/00
    • PURPOSE:To safely and easily perform high-speed recording with a simple structure by forming a magnetic latent image by changing the superconductive state of a superconductive member to a normal-conductive state on a prescribed pattern. CONSTITUTION:In each ring-like superconductor 46 of a recording body 41 passed through a uniform magnetic field producing means 42, electric currents produced by electromagnetic inductance are made to flow continuously and uniform magnetic fields are produced. When the recording body 41 in such state is selectively heated on a pattern corresponding to picture signals by means of a thermal head 43, the heated superconductor 46 exceeds the critical temperature and changes to a normal-conductive state. When the temperature of the superconductor 46 drops by cooling thereafter, an electric current is made to flow through the superconductor 46 by means of the magnetic field of the adjacent unheated superconductor 46 and a latent image is formed by magnetic field inversion. By causing magnetic toner to adhere to the magnetic latent image by means of a development counter 44, a desired picture is formed. Therefore, high-speed recording can be performed stably and easily with a simple structure.