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    • 4. 发明专利
    • Semiconductor device and skew adjustment method
    • 半导体器件和SKEW调整方法
    • JP2006275616A
    • 2006-10-12
    • JP2005092064
    • 2005-03-28
    • Fujitsu Ltd富士通株式会社
    • KIKUCHI KAZUHIKOKITAGAWA MASAYAMASUKO JUN
    • G01R31/28G01R31/26G06F1/06G06F1/10G06F12/00G06F12/16H01L21/822H01L27/04
    • G11C7/22G11C5/04G11C7/222G11C29/02G11C29/023G11C29/028
    • PROBLEM TO BE SOLVED: To cause a circuit to operate correctly in its entirety, when achieving the circuit equating with one functional macro by using a plurality of divided chips, with a skew brought about by dividing the circuit into the plurality of chips automatically adjusted. SOLUTION: The functional circuit constituting one functional macro is divided and mounted on the plurality of chips while generating a plurality of inner block signals with their phases different from each other based on a referential clock signal. Based on the result of a test operation performed by using a selected inner clock signal, the phase of a clock signal supplied to functional circuits in the chips is adjusted to obtain a clock signal of an optimum phase from among the plurality of inner clock signals. The skew brought about by dividing the circuit into the plurality of chips is automatically adjusted to cause the circuit to operate correctly in its entirety. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:为了使电路整体正常地工作,当通过使用多个划分的芯片来实现与一个功能宏相当的电路时,通过将电路分成多个芯片而产生偏斜 自动调整。 解决方案:构成一个功能宏的功能电路被分割并安装在多个芯片上,同时基于参考时钟信号产生彼此相位不同的多个内部块信号。 基于通过使用所选择的内部时钟信号进行的测试操作的结果,调整提供给芯片中的功能电路的时钟信号的相位,以从多个内部时钟信号中获得最佳相位的时钟信号。 通过将电路分成多个芯片产生的偏斜被自动调整,使电路整体正常地工作。 版权所有(C)2007,JPO&INPIT