会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 82. 发明申请
    • SPACER STRUCTURE
    • 间隔结构
    • US20100007843A1
    • 2010-01-14
    • US12327819
    • 2008-12-04
    • Po-Yuan Shen
    • Po-Yuan Shen
    • G02F1/1339
    • G02F1/13394G02F2001/13396G02F2001/13398
    • A spacer structure includes a first substrate, an overcoat layer, first spacers, second spacers, and a second substrate. The first spacers are disposed in a first region, and the overcoat layer has a first thickness in the first region. The second spacers are disposed in a second region, and the overcoat layer has a second thickness in the second region. The first spacers and the second spacers have the same height, and the first thickness is greater than the second thickness. Accordingly, no gap exists between each of the first spacers and the second substrate; however, a gap exists between each or the second spacers and the second substrate.
    • 间隔结构包括第一基底,外涂层,第一间隔物,第二间隔物和第二基底。 第一间隔件设置在第一区域中,并且外涂层在第一区域具有第一厚度。 第二间隔件设置在第二区域中,并且外涂层在第二区域具有第二厚度。 第一间隔件和第二间隔件具有相同的高度,第一厚度大于第二厚度。 因此,在每个第一间隔件和第二基板之间不存在间隙; 然而,在每个或第二间隔件和第二衬底之间存在间隙。
    • 87. 发明授权
    • System and method for preventing read margin degradation for a memory array
    • 用于防止存储器阵列的读取容限劣化的系统和方法
    • US07262999B2
    • 2007-08-28
    • US10997114
    • 2004-11-24
    • Jian-Yuan ShenHsien-Wen HsuChi-Ling Chu
    • Jian-Yuan ShenHsien-Wen HsuChi-Ling Chu
    • G11C16/06G11C16/04
    • G11C16/349G11C16/0475
    • An ultra cycling nitride read only memory (NROM) device is coupled to a NROM array such that both bits of the ultra cycling NROM device will be erased when all NROM devices of the NROM array are erased. The ultra cycling NROM device is then programmed at its right bit. A threshold voltage difference will be obtained for the ultra cycling NROM device for the un-programmed left bit. Next, a cycling number is obtained based on the threshold voltage difference for the ultra cycling NROM device. A threshold voltage shift can be found based on the cycling number for the NROM array. Finally, an erase voltage will be calculated according to the threshold voltage shift for the NROM array. If the NROM array is programmed again, the erase voltage will be applied to un-programmed NROM devices of the NROM array to further reduce the threshold voltages.
    • 超循环氮化物只读存储器(NROM)器件耦合到NROM阵列,使得当NROM阵列的所有NROM器件被擦除时,超循环NROM器件的两个位将被擦除。 然后在其右侧编程超循环NROM设备。 对于非编程左位的超循环NROM器件,将获得阈值电压差。 接下来,基于超循环NROM装置的阈值电压差来获得循环次数。 可以基于NROM阵列的循环次数找到阈值电压偏移。 最后,将根据NROM阵列的阈值电压偏移计算擦除电压。 如果NROM阵列再次被编程,则擦除电压将被施加到NROM阵列的未编程的NROM器件,以进一步降低阈值电压。