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    • 83. 发明授权
    • Method for measuring a spectrum of a narrowband light source, and spectrometer arrangement
    • 用于测量窄带光源的光谱的方法和光谱仪布置
    • US08289520B2
    • 2012-10-16
    • US12558874
    • 2009-09-14
    • Johannes KrausAlois HerkommerBernhard WeiglMichel Le MaireHolger Muenz
    • Johannes KrausAlois HerkommerBernhard WeiglMichel Le MaireHolger Muenz
    • G01J3/45
    • G01J3/26G01J3/36
    • A spectrometer arrangement for measuring a spectrum of a light beam emitted by a narrowband light source, such as a bandwidth-narrowed laser, includes at least one etalon, a beam splitter for splitting the light beam into a first partial beam and a second partial beam, one or more optical directing elements for directing the first partial beam n times and the second partial beam (n+k) times through the at least one etalon, wherein n and k are integers ≧1. The spectrometer arrangement further has at least one light-sensitive detector and an evaluation device for evaluating the spectra—recorded by the at least one detector—of the first partial beam that has passed through the at least one etalon n times and of the second partial beam that has passed through the at least one etalon (n+k) times in order to determine the light spectrum corrected for the apparatus function of the at least one etalon.
    • 用于测量由窄带光源(例如带宽变窄的激光器)发射的光束的光谱的光谱仪装置包括至少一个标准具,用于将光束分成第一部分光束的分束器和第二部分光束 一个或多个用于通过至少一个标准具指导第一部分光束n次和第二部分光束(n + k)的光学引导元件,其中n和k是整数≥1。 光谱仪布置还具有至少一个光敏检测器和评估装置,用于评估已经通过至少一个标准具的第一部分光束的至少一个检测器记录的光谱n次和第二部分光束 已经通过至少一个标准具(n + k)次的光束,以便确定校正了至少一个标准具的装置功能的光谱。
    • 84. 发明授权
    • Optical devices and related systems and methods
    • 光器件及相关系统及方法
    • US07629572B2
    • 2009-12-08
    • US11418872
    • 2006-05-05
    • Vitaliy ShkloverHolger KiereyHolger MuenzMichel Le MaireBernhard Weigl
    • Vitaliy ShkloverHolger KiereyHolger MuenzMichel Le MaireBernhard Weigl
    • G01J1/32G02B13/08
    • G02B27/0988G02B1/115G02B5/22G02B13/08G02B27/0966G03F7/70591G03F7/70958G03F7/70975
    • The disclosure relates to a light beam intensity non-uniformity correction device that includes an optical element having a light entrance face with an antireflective property. According to the invention the antireflective property is locally amended in order to enhance light beam intensity uniformity. The disclosure further relates to a method for amending intensity distribution of a light beam in an optical system having one or more optical elements, where the method includes: a) assembling the optical system with the one or more optical elements arranged in predetermined positions, b) measuring intensity distribution, c) calculating locally required increase or decrease in absorption and/or reflection of one of the optical elements to amend measured intensity distribution into a predetermined intensity distribution, d) removing the optical element from the optical system, e) locally amending absorption and/or reflection of the one of the optical elements according to the calculation, f) installing the optical element in the predetermined position in the optical system.
    • 本发明涉及一种光束强度不均匀性校正装置,其包括具有防反射性的光入射面的光学元件。 根据本发明,为了增强光束强度的均匀性,局部地修改了防反射特性。 本发明还涉及一种用于修正具有一个或多个光学元件的光学系统中的光束的强度分布的方法,其中所述方法包括:a)将光学系统与布置在预定位置的一个或多个光学元件组合,b )测量强度分布,c)计算局部所需的光学元件之一的吸收和/或反射的增加或减少以将测量的强度分布修改为预定的强度分布,d)从光学系统中去除光学元件,e)局部地 根据计算修正光学元件之一的吸收和/或反射,f)将光学元件安装在光学系统中的预定位置。
    • 85. 发明授权
    • Optical imaging system for imaging at least two planes of a light beam spaced apart in the beam direction
    • 光学成像系统,用于对沿光束方向间隔开的光束的至少两个平面进行成像
    • US07477438B2
    • 2009-01-13
    • US10441990
    • 2003-05-20
    • Alois Herkommer
    • Alois Herkommer
    • G02B26/08
    • G01J1/4257
    • An optical imaging system for imaging at least two planes of a light beam spaced apart in the beam direction, in particular of a laser light beam, onto a common target site, for example a detector, has at least one optically imaging element arranged in the beam path of the light beam. The at least one optically imaging element is a collecting primary mirror, and arranged downstream of the primary mirror are at least two secondary mirrors that can be brought alternately into the beam path, the secondary mirrors being designed such that one secondary mirror permits imaging of one plane, and the other secondary mirror permits imaging of the other plane of the light beam onto the target site in each case.
    • 一种光学成像系统,用于将沿光束方向(特别是激光束)间隔开的光束的至少两个平面成像到公共目标位置(例如检测器)上,具有至少一个光学成像元件 光束的光束路径。 所述至少一个光学成像元件是收集主反射镜,并且布置在主反射镜的下游是至少两个可以交替地被带入光束路径的次级反射镜,次级反射镜被设计成使得一个副反射镜允许成像一个 平面,另一个副镜允许在每种情况下将光束的另一平面成像到目标位置上。
    • 89. 发明申请
    • HOLDING ARRANGEMENT FOR AN OPTICAL ELEMENT
    • 光学元件的安装
    • US20120154935A1
    • 2012-06-21
    • US13359341
    • 2012-01-26
    • Ulrich WeberArmin SchoeppachHubert Holderer
    • Ulrich WeberArmin SchoeppachHubert Holderer
    • G02B7/02
    • G02B7/004G02B7/023
    • A holding arrangement for an optical element, in particular for a cylindrical lens, includes a basic structure surrounding an optical element and a mounting device by which the optical element is supported on the basic structure. The mounting device has two degrees of freedom so that the optical element can be supported by the mounting device in a manner that allows the optical element to rotate about both about an optical axis and an axis perpendicular to the optical axis. If the optical element is a cylindrical lens, the axis perpendicular to the optical axis can be an axis perpendicular to an axial direction of the cylindrical lens. The disclosure further relates to a manipulator unit for an optical system which includes a holding arrangement.
    • 用于光学元件的保持装置,特别是用于圆柱形透镜的保持装置包括围绕光学元件的基本结构和安装装置,光学元件通过该安装装置支撑在基本结构上。 安装装置具有两个自由度,使得光学元件可以以允许光学元件围绕光轴和垂直于光轴的轴线旋转的方式由安装装置支撑。 如果光学元件是圆柱形透镜,则垂直于光轴的轴线可以是垂直于柱面透镜轴向的轴线。 本发明还涉及一种用于光学系统的操纵器单元,其包括保持装置。