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    • 72. 发明申请
    • DEVICES, SYSTEMS, AND METHODS FOR ILLUMINATING AND IMAGING OBJECTS
    • 用于照明和成像对象的装置,系统和方法
    • WO2018070938A1
    • 2018-04-19
    • PCT/SG2017/050512
    • 2017-10-12
    • LIFE TECHNOLOGIES HOLDINGS PTE LIMITED
    • CHEN, MingsongSHI, BenyongTOH, Tiong HanYEO, Steven
    • G02B21/06G02B21/36G01N21/64
    • G02B27/14G01N21/253G01N21/6452G01N21/6456G01N21/76G02B6/04G02B17/02G02B21/06G02B21/362G02B26/0816G02B27/1066G02B27/108G02B27/16
    • An illumination system includes a surface configured to have an imaging target placed thereon, a light source, a beam splitter and at least a first mirror. The beam splitter is configured to split the beam of light from the light source and the first mirror is configured to reflect a first beam from the beam splitter onto the surface with the imaging target. An imaging system includes an imaging surface configured to have an imaging target placed thereon, a mirror, and a capturing device. The capturing device is configured to capture an image of the imaging target through a path of emitted light that extends from the imaging target, reflects off of the mirror, and to the capturing device. The mirror, the capturing device, or both are configured to move in a diagonal direction with respect to the imaging surface to reduce a length of the path of emitted light. Systems and methods to calibrate an imaging system to remove or reduce non-uniformities within images of samples due to imaging system properties.
    • 照明系统包括被配置为具有放置在其上的成像目标的表面,光源,分束器和至少第一反射镜。 分束器被配置为分离来自光源的光束,并且第一反射镜被配置为将来自分束器的第一光束反射到具有成像目标的表面上。 成像系统包括被配置成具有放置在其上的成像目标的成像表面,镜子和捕捉装置。 捕捉设备被配置为通过从成像目标延伸的发射光的路径捕捉成像目标的图像,从镜子反射并捕捉到捕捉设备。 镜子,捕捉设备或两者被配置成相对于成像表面沿对角方向移动以减小发射光路径的长度。 校准成像系统以消除或减少由于成像系统特性导致的样品图像内的不均匀性的系统和方法。
    • 73. 发明申请
    • AN INTERFEROMETRIC MICROSCOPY ARRANGEMENT WITH A POINT-LIKE BEAM SPLITTING LAYER
    • 具有点状束分裂层的干涉仪显微镜安排
    • WO2018007101A1
    • 2018-01-11
    • PCT/EP2017/064213
    • 2017-06-12
    • SIEMENS HEALTHCARE GMBH
    • SCHICK, AntonHAYDEN, OliverSCHMIDT, Oliver
    • G03H1/04G01B9/021G01B9/02G01N21/45G02B21/36G02B21/00G01B9/04G03H1/00
    • G01B9/04G01B9/02001G01B9/02034G02B21/0056G02B21/361G02B27/108G03H1/0443G03H1/0493G03H2001/005G03H2001/0445
    • An interfere) metric microscopy arrangement (1) is presented having an objective lens (20) that receives a light beam (9) emerging after sample interaction, wherefrom the light beam (9) is received by a beam splitter unit (30), positioned at a focal length (22) of the objective lens (20), the beam splitter unit (30) having a transparent substrate (32) and a point-like beam-splitting layer (34) that splits a part of the light beam (9) into a spatially filtered reference beam (40) and an object beam (50). Thereafter, a reference beam tube lens (60) and an object beam tube lens (70) receive the reference (40) and the object (50) beams, respectively. A beam combiner unit (80) having a transparent substrate (82) and a beam-combining layer (84) receives the reference (40) and the object (50) beams from the reference (60) and the object (70) beam tube lenses, respectively, and combines the reference (40) and the object (50) beams to form pattern-generating beam (99) directed towards the optical detector (90) to form an interference pattern thereon.
    • 提供具有物镜(20)的干涉)度量显微镜装置(1),所述物镜(20)接收在样品相互作用之后出现的光束(9),其中光束(9) (30),所述分束器单元(30)具有透明衬底(32)和点状分束层(34),所述点分束器单元(30)位于所述物镜(20)的焦距(22) 将光束(9)的一部分分成空间滤波的参考光束(40)和物体光束(50)。 之后,参考光束管透镜(60)和物镜光管透镜(70)分别接收参考光束(40)和物体(50)光束。 具有透明衬底(82)和光束组合层(84)的光束组合器单元(80)接收来自参考(60)和物体(70)光束管的参考物体(40)和物体(50) (40)和物体(50)光束组合以形成指向光学检测器(90)的图案生成光束(99)以在其上形成干涉图案。