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1. 发明申请

WO2020007541A1 STEUERUNG VON ULTRASCHALLAUFNAHMEN 审中-公开
公开(公告)号：WO2020007541A1
公开(公告)日：2020-01-09
申请号：PCT/EP2019/064018
申请日：2019-05-29
申请人： SIEMENS HEALTHCARE GMBH
发明人： DÜPPENBECKER, Peter Michael , RADICKE, Marcus , SCHMIDT, Oliver
IPC分类号： A61B8/08 , A61B8/00
摘要： Die Erfindung umfasst ein Verfahren zur Steuerung von Ultraschallaufnahmen, wobei ein Ausdehnungsmaß (U1, U2, U3, U4) einer Brust (O1, O2, O3, O4) ermittelt und in Abhängigkeit des ermittelten Ausdehnungsmaßes (U1, U2, U3, U4) ein aktiver Bereich (23) einer Ultraschallsonde (21) einer Ultraschallanlage (20) geregelt wird. Überdies wird eine Steuereinrichtung beschrieben, um das Verfahren auszuführen und eine Ultraschallanlage (20) sowie eine Röntgenanlage (1).

2. 发明申请

WO2018007101A1 AN INTERFEROMETRIC MICROSCOPY ARRANGEMENT WITH A POINT-LIKE BEAM SPLITTING LAYER 审中-公开
标题翻译：具有点状束分裂层的干涉仪显微镜安排
公开(公告)号：WO2018007101A1
公开(公告)日：2018-01-11
申请号：PCT/EP2017/064213
申请日：2017-06-12
申请人： SIEMENS HEALTHCARE GMBH
发明人： SCHICK, Anton , HAYDEN, Oliver , SCHMIDT, Oliver
IPC分类号： G03H1/04 , G01B9/021 , G01B9/02 , G01N21/45 , G02B21/36 , G02B21/00 , G01B9/04 , G03H1/00
CPC分类号： G01B9/04 , G01B9/02001 , G01B9/02034 , G02B21/0056 , G02B21/361 , G02B27/108 , G03H1/0443 , G03H1/0493 , G03H2001/005 , G03H2001/0445
摘要： An interfere) metric microscopy arrangement (1) is presented having an objective lens (20) that receives a light beam (9) emerging after sample interaction, wherefrom the light beam (9) is received by a beam splitter unit (30), positioned at a focal length (22) of the objective lens (20), the beam splitter unit (30) having a transparent substrate (32) and a point-like beam-splitting layer (34) that splits a part of the light beam (9) into a spatially filtered reference beam (40) and an object beam (50). Thereafter, a reference beam tube lens (60) and an object beam tube lens (70) receive the reference (40) and the object (50) beams, respectively. A beam combiner unit (80) having a transparent substrate (82) and a beam-combining layer (84) receives the reference (40) and the object (50) beams from the reference (60) and the object (70) beam tube lenses, respectively, and combines the reference (40) and the object (50) beams to form pattern-generating beam (99) directed towards the optical detector (90) to form an interference pattern thereon.
摘要翻译：提供具有物镜（20）的干涉）度量显微镜装置（1），所述物镜（20）接收在样品相互作用之后出现的光束（9），其中光束（9）（30），所述分束器单元（30）具有透明衬底（32）和点状分束层（34），所述点分束器单元（30）位于所述物镜（20）的焦距（22）将光束（9）的一部分分成空间滤波的参考光束（40）和物体光束（50）。之后，参考光束管透镜（60）和物镜光管透镜（70）分别接收参考光束（40）和物体（50）光束。具有透明衬底（82）和光束组合层（84）的光束组合器单元（80）接收来自参考（60）和物体（70）光束管的参考物体（40）和物体（50）（40）和物体（50）光束组合以形成指向光学检测器（90）的图案生成光束（99）以在其上形成干涉图案。

3. 发明申请

WO2017157555A1 HIGH ACCURACY 5-PART DIFFERENTIAL WITH DIGITAL HOLOGRAPHIC MICROSCOPY AND UNTOUCHED LEUKOCYTES FROM PERIPHERAL BLOOD 审中-公开
标题翻译：具有数字全息显微镜和周围血细胞未受影响的白细胞的高精度5分微分
公开(公告)号：WO2017157555A1
公开(公告)日：2017-09-21
申请号：PCT/EP2017/051656
申请日：2017-01-26
申请人： SIEMENS HEALTHCARE GMBH
发明人： EL-ZEHIRY, Noha Youssry , HAYDEN, Oliver , KAMEN, Ali , RICHTER, Lukas , STANZEL, Manfred , UGELE, Matthias , KÜHN, Daniela , MARQUARDT, Gaby , SCHMIDT, Oliver
IPC分类号： G01N15/14 , G03H1/04 , G06K9/00
CPC分类号： G01N15/1434 , G01N15/1429 , G01N15/147 , G01N2015/1006 , G01N2015/1454 , G03H1/0005 , G03H1/0443 , G03H2001/005 , G03H2001/0445 , G03H2210/20 , G03H2210/55 , G03H2240/56
摘要： The present invention relates to an improved method for marker-free detection of a cell type of at least one cell in a medium using microfluidics and digital holographic microscopy, as well as a device, particular for carrying out the method.
摘要翻译：本发明涉及使用微流体学和数字全息显微镜在介质中对至少一种细胞的细胞类型进行无标记检测的改进方法，以及特别用于实施该方法。

4. 发明申请

WO2018007101A8 AN INTERFEROMETRIC MICROSCOPY ARRANGEMENT WITH A POINT-LIKE BEAM SPLITTING LAYER 审中-公开
公开(公告)号：WO2018007101A8
公开(公告)日：2018-01-11
申请号：PCT/EP2017/064213
申请日：2017-06-12
申请人： SIEMENS HEALTHCARE GMBH
发明人： SCHICK, Anton , HAYDEN, Oliver , SCHMIDT, Oliver
IPC分类号： G03H1/04 , G01B9/021 , G01B9/02 , G01N21/45 , G02B21/36 , G02B21/00 , G01B9/04 , G03H1/00
摘要： An interferometric microscopy arrangement (1) is presented having an objective lens (20) that receives a light beam (9) emerging after sample interaction, wherefrom the light beam (9) is received by a beam splitter unit (30), positioned at a focal length (22) of the objective lens (20), the beam splitter unit (30) having a transparent substrate (32) and a point-like beam-splitting layer (34) that splits a part of the light beam (9) into a spatially filtered reference beam (40) and an object beam (50). Thereafter, a reference beam tube lens (60) and an object beam tube lens (70) receive the reference (40) and the object (50) beams, respectively. A beam combiner unit (80) having a transparent substrate (82) and a beam-combining layer (84) receives the reference (40) and the object (50) beams from the reference (60) and the object (70) beam tube lenses, respectively, and combines the reference (40) and the object (50) beams to form pattern-generating beam (99) directed towards the optical detector (90) to form an interference pattern thereon.

5. 发明申请

WO2017045712A1 ARRANGEMENT AND METHOD FOR PROVIDING A SAMPLE FOR INSPECTION BY AN IMAGING DEVICE 审中-公开
标题翻译：用于通过成像装置提供样品进行检查的装置和方法
公开(公告)号：WO2017045712A1
公开(公告)日：2017-03-23
申请号：PCT/EP2015/071244
申请日：2015-09-16
申请人： SIEMENS HEALTHCARE GMBH
发明人： HAYDEN, Oliver , RICHTER, Lukas , SCHMIDT, Oliver , TEDDE, Sandro Francesco
IPC分类号： G01N1/28 , G02B21/34 , G01N35/00 , G01N21/03
CPC分类号： G01N35/00009 , G01N1/2813 , G01N21/03 , G01N2021/0353 , G01N2021/0357 , G01N2021/0364 , G02B21/34
摘要： An arrangement, a system and a method for providing a sample for investigation by an imaging device are presented. The arrangement includes a substrate and a capillary forming part. The substrate includes a sample receiving region and a capillary forming region on a surface of the substrate. The sample receiving region receives the sample. The sample receiving region is adjacent to the capillary forming region. The capillary forming part includes a coverslip and a spacer. The coverslip is positioned over the capillary forming region of the surface of the substrate such that the coverslip covers the capillary forming region. The coverslip is transparent and is positioned in a Field of View of the imaging device. The spacer is positioned in between the substrate and the coverslip such that a capillary volume is formed between the coverslip, the spacer and the capillary forming region of the surface.
摘要翻译：提出了一种用于提供用于由成像装置进行调查的样本的装置，系统和方法。该装置包括基底和毛细管形成部分。衬底包括在衬底的表面上的样品接收区域和毛细管形成区域。样品接收区域接收样品。样品接收区域与毛细管形成区域相邻。毛细管形成部分包括盖玻片和间隔物。盖玻片位于衬底表面的毛细管形成区域上方，使得盖玻片覆盖毛细管形成区域。盖玻片是透明的，并且位于成像装置的视场中。间隔物定位在基片和盖玻片之间，使得在盖片，间隔物和表面的毛细管形成区域之间形成毛细管体积。

6. 发明申请

WO2017041841A1 AN INTERFEROMETRIC MICROSCOPY ARRANGEMENT FOR INSPECTING A SAMPLE USING TWO ILLUMINATION SOURCES 审中-公开
标题翻译：用于使用两个照明源检查样品的干涉显微镜装置
公开(公告)号：WO2017041841A1
公开(公告)日：2017-03-16
申请号：PCT/EP2015/070627
申请日：2015-09-09
申请人： SIEMENS HEALTHCARE GMBH
发明人： SCHICK, Anton , HAYDEN, Oliver , SCHMIDT, Oliver
IPC分类号： G02B21/16 , G02B21/18 , G01B9/02
CPC分类号： G02B21/18 , G01B9/02007 , G01B9/02024 , G01B9/02027 , G01B9/02097 , G02B21/16
摘要： An interferometric microscopy arrangement for inspecting a sample includes a first illumination source providing a collimated first light beam, a second illumination source providing a second light beam focused onto the sample, a selection filter, an interferometric unit and an optical detector system. The selection filter directs the first and the second light beam towards the sample. The first and the second light beams after sample interaction are received by the interferometric unit. The interferometric unit generates from the first light beam a first object beam and a first reference beam, filters out object information from the first reference beam. The interferometric unit directs the first object beam, the first reference beam, and the second light beam towards the optical detector system. The optical detector assembly detects an interference pattern formed from the first light beam and also detects an optical pattern formed from the second light beam.
摘要翻译：用于检查样本的干涉式显微镜装置包括提供准直的第一光束的第一照明源，提供聚焦到样本上的第二光束的第二照明源，选择滤光器，干涉测量单元和光学检测器系统。选择滤波器将第一和第二光束导向样品。样品相互作用后的第一和第二光束被干涉仪接收。该干涉单元从第一光束产生第一物体光束和第一参考光束，从第一参考光束滤出物体信息。干涉测量单元将第一物体光束，第一参考光束和第二光束引导到光学检测器系统。光检测器组件检测由第一光束形成的干涉图案，并且还检测由第二光束形成的光学图案。

7. 发明申请

WO2017041840A1 AN INTERFEROMETRIC MICROSCOPY TECHNIQUE FOR INSPECTING A SAMPLE SIMULTANEOUSLY AT DIFFERENT DEPTHS OF THE SAMPLE 审中-公开
标题翻译：用于在样品不同深度同时检测样品的干涉显微技术
公开(公告)号：WO2017041840A1
公开(公告)日：2017-03-16
申请号：PCT/EP2015/070626
申请日：2015-09-09
申请人： SIEMENS HEALTHCARE GMBH
发明人： HAYDEN, Oliver , SCHICK, Anton , SCHMIDT, Oliver
IPC分类号： G02B21/14 , G02B21/36 , G02B27/14 , G01B9/02
CPC分类号： G02B21/14 , G01B9/02024 , G02B21/367 , G02B27/0075 , G02B27/146
摘要： An interferometric microscopy arrangement for inspecting a sample simultaneously along different depths of the sample is presented. The arrangement includes an interferometric unit and a sensor assembly. The interferometric unit generates an object beam and a reference beam. The sensor assembly includes a primary beam splitter and a plurality of sensors having a first sensor and a second sensor located at different positions with respect to the primary beam splitter. The interferometric unit directs the object beam and the reference beam to form an interference pattern forming beam directed towards the sensor assembly. The primary beam splitter of the sensor assembly receives and splits the interference pattern forming beam into at least a first and a second part. The primary beam splitter then directs the first part towards the first sensor and the second part towards the second sensor.
摘要翻译：提出了一种用于在样品的不同深度同时检测样品的干涉显微镜装置。该装置包括干涉仪和传感器组件。干涉单元产生物体光束和参考光束。传感器组件包括主分束器和多个传感器，其具有位于相对于主分束器的不同位置的第一传感器和第二传感器。干涉测量单元引导物体光束和参考光束以形成指向传感器组件的干涉图案形成光束。传感器组件的主分束器接收并将干涉图形形成光束分成至少第一和第二部分。主分束器然后将第一部分朝着第一传感器引导，第二部分朝向第二传感器。

8. 发明申请

WO2016091442A1 PEROWSKIT-PARTIKEL MIT BESCHICHTUNG AUS EINEM HALBLEITERMATERIAL 审中-公开
标题翻译：具有涂层的半导体材料颗粒钙钛矿
公开(公告)号：WO2016091442A1
公开(公告)日：2016-06-16
申请号：PCT/EP2015/074382
申请日：2015-10-21
申请人： SIEMENS HEALTHCARE GMBH
发明人： FISCHER, Rene , KANITZ, Andreas , SCHMIDT, Oliver , TEDDE, Sandro Francesco
IPC分类号： G21K4/00
CPC分类号： G21K4/00
摘要： Die vorliegende Erfindung betrifft beschichtete Partikel umfassend Perowskitkristalle vom Typ ABX 3 und/oder AB 2 X 4 , wobei A mindestens ein ein-, zwei- oder dreiwertiges Element ab der 4. Periode des Periodensystems und/oder Mischungen daraus darstellt, B ein einwertiges Kation darstellt, dessen Volumenparameter bei dem jeweiligen Element A der Perowskitgitterbildung genügt, und X ausgewählt ist aus Halogeniden und Pseudohalogeniden, ein Verfahren zu deren Herstellung, sowie die Verwendung der beschichteten Partikel in Schichten und Detektoren wie Röntgendetektoren, Gammadetektoren oder UV-Detektoren, oder Solarzellen.
摘要翻译：本发明涉及包含式ABX 3和/或AB2X4，其中A是至少一个单，二或三价元素是选自周期表和/或它们的混合物的第4周期的钙钛矿型结晶的涂布颗粒，B表示一价阳离子，体积参数足以用于Perowskitgitterbildung的每个元素，并且X选自卤化物和拟卤化物，它们的制备方法和使用该涂覆颗粒在层和检测器，例如X射线检测器，γ检测器，或UV检测器或太阳能电池的选择。

9. 发明申请

WO2020088927A1 ISOVOLUMETRISCHES AUFKUGELN VON ROTEN BLUTZELLEN 审中-公开
公开(公告)号：WO2020088927A1
公开(公告)日：2020-05-07
申请号：PCT/EP2019/077849
申请日：2019-10-15
申请人： SIEMENS HEALTHCARE GMBH
发明人： RICHTER, Lukas , RÜHRIG, Manfred , WAGNER, Ann-Kathrin , HÖRNIG, Gabriele , MATHEIS, Karl-Philipp , SCHMIDT, Oliver , UGELE, Matthias
IPC分类号： G01N15/14 , G01N1/44 , G01N33/49
摘要： Die Erfindung betrifft einen automatischen Analyzer zum Analysieren einer medizinischen Probe, der Analyzer umfassend eine Analysezelle für die Probe, ein Piezoelement und eine AnalyseVorrichtung, wobei das Piezoelement durch Anlegen einer Spannung und einer Frequenz betrieben werden kann und dabei ein akustisches Wellenfeld generiert, wobei eine sich in der Analysezelle befindende Probe bei Betrieb des Piezoelements in dem akustischen Wellenfeld befindet.

10. 发明申请

WO2017041843A1 A TECHNIQUE FOR ILLUMINATING A SAMPLE TO BE INSPECTED BY INTERFEROMETRIC MICROSCOPY 审中-公开
标题翻译：用于通过干涉显微镜检查样品的技术
公开(公告)号：WO2017041843A1
公开(公告)日：2017-03-16
申请号：PCT/EP2015/070630
申请日：2015-09-09
申请人： SIEMENS HEALTHCARE GMBH
发明人： SCHICK, Anton , HAYDEN, Oliver , SCHMIDT, Oliver
IPC分类号： G02B21/08 , G02B21/14 , G01B9/02 , G01B9/04
CPC分类号： G02B21/08 , G01B9/04 , G02B21/14
摘要： A condenser lens, and an interferometric microscopy arrangement based on the condenser lens and a method based on the condenser lens are presented. The condenser lens shines a light beam from an illumination source onto a sample that is to be inspected by an interferometric microscopy device. The light beam from the illumination source has a first wavefront. The condenser lens includes a non-condensing region and a condensing region. The non-condensing region receives a first part of the light beam from the illumination source and transmits the first part towards the sample. The first part of the light beam so transmitted has the first wavefront. The condensing region receives a second part of the light beam from the illumination source and transmits the second part towards the sample. The second part of the light beam so transmitted has a second wavefront. The first wavefront is different from the second wavefront.
摘要翻译：提出了一种聚光透镜，以及基于聚光透镜的干涉式显微镜装置以及基于聚光透镜的方法。聚光镜将来自照明源的光束照射到由干涉式显微镜装置检查的样品上。来自照明源的光束具有第一波前。聚光透镜包括非冷凝区域和冷凝区域。非冷凝区域接收来自照明源的光束的第一部分，并将第一部分朝向样品传送。所传输的光束的第一部分具有第一波前。聚光区域接收来自照明源的光束的第二部分，并将第二部分透射到样品。所传输的光束的第二部分具有第二波前。第一个波前与第二个波阵面不同。

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