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    • 72. 发明授权
    • Method of adaptively selecting chips for reducing in-line testing in a semiconductor manufacturing line
    • 自适应选择芯片以减少半导体生产线中的在线测试的方法
    • US07682842B2
    • 2010-03-23
    • US12129712
    • 2008-05-30
    • Rao H. DesineniXu OuyangHargurpreet SinghYunsheng SongStephen Wu
    • Rao H. DesineniXu OuyangHargurpreet SinghYunsheng SongStephen Wu
    • H01L21/00
    • G01R31/2894
    • A method for identifying potentially defective integrated circuit chips and excluding them from future testing as wafers move through a manufacturing line The method includes data-collecting steps, tagging the chips on wafers identified as potentially bad chips based on information collected as the wafer moves down the fabrication line, evaluating test cost savings by eliminating any further tests on the tagged chips preferably using a test cost database. Considering all the future tests to be preformed, the tagged chips are skipped if it is determined that the test cost saving is significant. Tagging bad chips is based on various criteria and models which are dynamically adjusted by performing the wafer final test on samples of the tagged chips and feeding-back the final test results. The dynamic adaptive adjustment method preferably includes a feedback loop or iterative process to evaluate financial tradeoffs when assessing the profit of salvaging chips against the additional test costs.
    • 一种用于识别潜在有缺陷的集成电路芯片的方法,并将其从将来的测试中排除,因为晶片移动通过生产线。该方法包括数据收集步骤,基于当晶片向下移动时收集的信息将标记为潜在的坏芯片的晶片上的芯片标记 通过消除对标记芯片的任何进一步测试,优选使用测试成本数据库来评估测试成本节省。 考虑到将要执行的所有将来的测试,如果确定测试成本节省是重要的,则标记的芯片被跳过。 标记坏芯片是基于各种标准和模型,通过对标记芯片的样品进行晶圆最终测试并反馈最终测试结果来动态调整。 动态自适应调整方法优选地包括反馈循环或迭代过程,以在评估补救筹码的利润与额外的测试成本时评估金融权衡。
    • 73. 发明授权
    • Test data reporting and analyzing using data array and related data analysis
    • 使用数据阵列和相关数据分析测试数据报告和分析
    • US07543198B2
    • 2009-06-02
    • US11163527
    • 2005-10-21
    • William J. FerranteJohn J. CasselsStephen Wu
    • William J. FerranteJohn J. CasselsStephen Wu
    • G06F11/00G11C29/00G01R31/28G01R31/02G01R31/26
    • G11C29/56G01R31/31935G11C29/56008G11C2029/5604
    • Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also presented.
    • 使用数据阵列从阵列结构的多个测试报告和/或分析测试数据。 一种方法包括获得测试数据,并将测试数据报告在数据阵列中,该数据阵列包括表示不同测试的至少两个部分。 存储在数据阵列中的数据根据​​翻译表进行组织,该转换表描述了要在数据阵列中分析的数据的测试数据和标准的位置。 也可以生成诸如列出预定义的最大失败点数的坐标文件或包括芯片故障点的芯片报告的许多其他数据布置。 数据阵列以更容易生成和存储的形式报告所有测试数据,并可将其转换为图像。 还提出了一种用于使用数据阵列分析数据的数据分析方法。
    • 77. 发明申请
    • METHOD AND SYSTEM FOR USING A FREQUENCY LOCKED LOOP LOGEN IN OSCILLATOR SYSTEMS
    • 在振荡器系统中使用频率锁定环路的方法和系统
    • US20080231375A1
    • 2008-09-25
    • US11831399
    • 2007-07-31
    • Jared WelzBrima Babatunde IbrahimStephen Wu
    • Jared WelzBrima Babatunde IbrahimStephen Wu
    • H03L7/00
    • H03L7/085H03L7/181
    • Aspects of a method and system for using a frequency locked loop LOGEN in oscillator systems may include generating an oscillating signal via one or more circuits comprising a feedback loop. The generation may be controlled by enabling or disabling the feedback loop, based on the generated oscillating signal. The one or more circuits may comprise a frequency-locked loop (FLL) that may enable the generation of the oscillating signal. The frequency-locked loop may comprise a voltage-controlled oscillator. The feedback loop may be disabled when an estimated frequency difference between a reference signal and a feedback signal may be less than or equal to a specified threshold. The feedback loop may be enabled when an estimated frequency difference between a reference signal and a feedback signal may be greater than a particular threshold.
    • 在振荡器系统中使用频率锁定环路LOGEN的方法和系统的方面可以包括经由包括反馈回路的一个或多个电路产生振荡信号。 可以基于产生的振荡信号来启用或禁用反馈回路来控制一代。 一个或多个电路可以包括可以产生振荡信号的频率锁定环(FLL)。 频率锁定环路可以包括压控振荡器。 当参考信号和反馈信号之间的估计频率差可以小于或等于指定阈值时,可以禁用反馈环路。 当参考信号和反馈信号之间的估计频率差可能大于特定阈值时,可以使能反馈回路。
    • 78. 发明申请
    • METHOD AND SYSTEM FOR A VARACTOR-TUNED VOLTAGE-CONTROLLED RING OSCILLATOR WITH FREQUENCY AND AMPLITUDE CALIBRATION
    • 用于具有频率和幅度校准的变量调制电压控制振荡器的方法和系统
    • US20080211590A1
    • 2008-09-04
    • US11680883
    • 2007-03-01
    • Stephen Wu
    • Stephen Wu
    • H03K3/02
    • H03K3/0322
    • Aspects of a method and system for a varactor-tuned voltage-controlled ring oscillator with frequency and amplitude calibration may include generating in a voltage controlled ring oscillator, an oscillating signal using delay cells, wherein each delay cell may comprise varactors and variable resistors. The frequency of the generated oscillating signal may be variable and may be calibrated by calibrating a delay associated with the delay cells. The amplitude of the generated oscillating signal may be calibrated by adjusting variable resistors and current sources within the delay cells. The frequency of the generated oscillating signal may be varied by varying the delay of at least one delay cell through changing the capacitance of its varactors. Changing a control voltage may change the varactor capacitance. The gain of the ring oscillator may be reduced by adjusting the varactors, and the generated oscillating signal may be a square wave signal.
    • 用于具有频率和幅度校准的变容二极管调谐电压控制环形振荡器的方法和系统的方面可以包括在压控环形振荡器中产生使用延迟单元的振荡信号,其中每个延迟单元可以包括变容二极管和可变电阻器。 产生的振荡信号的频率可以是可变的,并且可以通过校准与延迟单元相关联的延迟来校准。 可以通过调节延迟单元内的可变电阻器和电流源来校准产生的振荡信号的振幅。 所产生的振荡信号的频率可以通过改变其变容二极管的电容来改变至少一个延迟单元的延迟来改变。 改变控制电压可能会改变变容二极管电容。 可以通过调节变容二极管来减小环形振荡器的增益,并且所产生的振荡信号可以是方波信号。
    • 79. 发明授权
    • Method and apparatus for fractional-N synthesis
    • 分数N合成方法和装置
    • US07231196B2
    • 2007-06-12
    • US10015993
    • 2001-12-12
    • Hung-Ming ChienMeng-An PanStephen WuBrima Ibrahim
    • Hung-Ming ChienMeng-An PanStephen WuBrima Ibrahim
    • H04B7/00H04B1/18
    • H03L7/1978H03L7/0891
    • A method and apparatus for fractional-N synthesis includes processing that begins by generating a 1st feedback frequency from the output frequency based on a fixed divider value. The processing continues by generating a 2nd feedback frequency from the output frequency based on a selectable divider value, a modified fractional value of the divider value, and a modified integer value of the divider value. The processing continues by determining whether the fractional value of the divider value is within a range of fractional values. If so, the 1st feedback frequency is used to produce the output. If the fractional portion of the divider value is not within the range of fractional values, the 2nd feedback frequency is used to produce the output frequency.
    • 用于分数N合成的方法和装置包括通过基于固定分频值从输出频率产生1 反馈频率而开始的处理。 该处理继续,基于可选择的分频值,分频值的修正分数值和分频值的修正整数值,从输出频率产生二极点反馈频率。 通过确定分频值的分数值是否在分数值的范围内,继续处理。 如果是这样,则使用第一反馈频率来产生输出。 如果分频值的小数部分不在分数值的范围内,则使用反馈频率为2的反馈频率来产生输出频率。
    • 80. 发明授权
    • On-chip loop filter for a PLL
    • PLL的片上环路滤波器
    • US07088962B2
    • 2006-08-08
    • US10727371
    • 2003-12-04
    • Seema B. AnandStephen Wu
    • Seema B. AnandStephen Wu
    • H04B1/40H04B1/06H04B7/00
    • H03L7/093H03L7/0891
    • An on-chip loop filter includes a 1st resistor, a 1st capacitor, a 2nd capacitor, a 3rd capacitor, a 2nd resistor, and a 4th capacitor. The 1st resistor is operably coupled to receive a charge pump output. The 1st capacitor is coupled in series with the 1st resistor where the second node of the 1st capacitor is coupled to a return. The 2nd capacitor is coupled in parallel with the series combination of the 1st resistor and 1st capacitor. The 3rd capacitor is coupled in parallel with the 2nd capacitor. The 2nd resistor is coupled to a node of the 3rd capacitor and to a node of the 4th capacitor. The other node of the 4th capacitor is coupled to ground. To enable these components to be placed on-chip, the 1st capacitor is of a 1st capacitor construct having a 1st quality factor, the 2nd capacitor is of a 2nd capacitor construct having a 2nd quality factor, where the 2nd quality factor is greater than the 1st quality factor, and the 3rd and 4th capacitors are of a 3rd capacitor construct having a 3rd quality factor, which is greater than the 2nd quality factor.
    • 片上环路滤波器包括1 电阻器,1 电容器,2 电容器, / SUP>电容器,2 电阻器和4 电容器。 1 电阻器可操作地耦合以接收电荷泵输出。 1 SUP电容器与1 SUP电阻器串联耦合,其中第1个电容器的第二个节点耦合到一个返回端。 第二和第二电容器与第一和第二电阻器和1 SUP电容器的串联组合并联耦合。 第3个电容器与第2个电容器并联耦合。 2Ω电阻器耦合到第3级电容器的节点和4Ω电容器的节点。 第4个电容器的另一个节点耦合到地。 为了使这些部件能够被片上放置,1 电容器是具有1< SUP>品质因子的1 电容器结构, 2 nd电容器是具有第2个质量因子的第2个电容器构造,其中第2个< 品质因子大于1< ST>品质因子,并且第3 和4 电容器为3 SUP>电容器结构,其具有大于第2个质量因子的品质因子。