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61. 发明授权

US08950940B2 Sliding apparatus 有权
标题翻译：滑动装置
公开(公告)号：US08950940B2
公开(公告)日：2015-02-10
申请号：US13703964
申请日：2011-06-13
申请人： Yasuhiro Mitsui , Tetsuya Katsuta
发明人： Yasuhiro Mitsui , Tetsuya Katsuta
IPC分类号： F16C29/00 , F16C29/06 , H04M1/00 , H04M1/02 , G03B11/04
CPC分类号： H04M1/0237 , G03B11/043
摘要： The sliding apparatus includes a substrate fixed to a main body, a slide plate being fixed to a sub-body and being slidable between a closed position and an open position in an opening/closing direction, a hole formed in the slide plate, a sloped surface part being formed in the main body, and being engaged with the hole in the closed position, and including a sloped surface being sloped toward a rear direction in the opening/closing direction, a slide guiding part guiding the slide plate in a sliding direction, a restricting part restricting movement of a closing direction end of the slide plate in the front/rear direction during an initial stage of sliding the slide plate from the closed position to the open position, and a sloped part being formed in a closing direction end of the slide guiding part and being sloped in a rear direction.
摘要翻译：滑动装置包括固定在主体上的基板，固定在副体上的滑动板，能够在打开/关闭方向的关闭位置和打开位置之间滑动，形成在滑板中的孔，倾斜的所述表面部分形成在所述主体中，并且在所述关闭位置处与所述孔接合，并且包括沿所述打开/关闭方向朝向后方向倾斜的倾斜表面;滑动引导部，其沿滑动方向引导所述滑动板限制部件，在滑动板从关闭位置向打开位置滑动的初始阶段期间，限制滑板的关闭方向端部在前后方向上的移动;以及倾斜部分形成在关闭方向端的滑动导向部并沿后方倾斜。

62. 发明授权

US08807835B2 Slide unit mechanism 有权
标题翻译：滑动单元机构
公开(公告)号：US08807835B2
公开(公告)日：2014-08-19
申请号：US13701901
申请日：2011-06-02
申请人： Yasuhiro Mitsui
发明人： Yasuhiro Mitsui
IPC分类号： F16C29/00 , F16C29/06 , A47B88/00 , H04W24/00 , H05K5/02 , H04M1/02 , G06F1/16
CPC分类号： H05K5/0217 , G06F1/1624 , G06F1/1679 , H04M1/0237
摘要： A slide unit mechanism includes a sliding plate including slide parts and rattle preventing mechanisms that engage the sliding plate to prevent the sliding plate from rattling. Each of the rattle preventing mechanisms includes a recess; an opening positioned on a moving path of the slide part; a locking torsion spring disposed in the recess, one end of which is attached to an engaging part protruding from the opening on the moving path of the slide part; and an engaging recess formed in the slide part and configured to engage the engaging part. When the sliding plate is slid to the open position or the closed position, the engaging part engages the engaging recess and is biased by elastic force of the locking torsion spring toward the engaging recess.
摘要翻译：滑动单元机构包括滑动板，其包括与滑动板接合的滑动部件和防撞击机构，以防滑板滑动。每个防拨动机构包括凹槽; 位于所述滑动部的移动路径上的开口; 锁定扭力弹簧设置在所述凹部中，其一端附接到从所述滑动部分的移动路径上的开口突出的接合部分; 以及形成在所述滑动部中并且构造成与所述接合部接合的接合凹部。当滑板滑动到打开位置或关闭位置时，接合部分接合接合凹部并被锁定扭转弹簧的弹性力朝向接合凹槽偏置。

63. 发明申请

US20130077902A1 SLIDE DEVICE FOR ELECTRONIC DEVICE 有权
标题翻译：用于电子设备的滑动装置
公开(公告)号：US20130077902A1
公开(公告)日：2013-03-28
申请号：US13703094
申请日：2011-06-13
申请人： Yasuhiro Mitsui
发明人： Yasuhiro Mitsui
IPC分类号： H05K5/02
CPC分类号： H05K5/0217 , G06F1/1624 , H04M1/0237
摘要： A slide device for an electronic device includes a substrate including a substrate including a pair of side edges; an intermediate plate including a pair of sandwiching portions slidably sandwiching the pair of side edges in the front and back direction, respectively, and a pair of outer edges at outer sides of the side edges in the width direction, respectively; a slide plate including a pair of outer sandwiching portions slidably sandwiching the pair of outer edges in the front and back direction, respectively; an intermediate housing position defining portion that protrudes an outer side in the width direction from the front end portion of the outer edge for defining an intermediate housing position of the slide plate with respect to the intermediate plate; an intermediate using position defining portion that protrudes the outer side in the width direction from the back end portion of the outer edge for defining an intermediate using position of the slide plate with respect to the intermediate plate; a housing position defining portion that protrudes in an upper direction of an upper and lower direction at a front portion of the substrate for defining a housing position of the intermediate plate with respect to the substrate; and a using position defining portion that protrudes in the upper direction at a back portion of the substrate for defining a using position of the intermediate plate with respect to the substrate.
摘要翻译：一种用于电子设备的滑动装置，包括：基板，其包括：包括一对侧边缘的基板; 中间板，分别包括一对夹持部，其分别在前后方向上可滑动地夹着所述一对侧边缘，并且在宽度方向上分别在所述侧边缘的外侧具有一对外边缘; 滑动板，其包括分别在前后方向可滑动地夹着所述一对外边缘的一对外侧夹持部; 中间壳体位置限定部分，其从外边缘的前端部在宽度方向上突出外侧，用于限定滑板相对于中间板的中间壳体位置; 用于限定滑板相对于中间板的中间使用位置的从外边缘的后端部向宽度方向外侧突出的中间体; 壳体位置限定部分，其在所述基板的前部沿上下方向的上方突出，以限定所述中间板相对于所述基板的壳体位置; 以及使用位置限定部分，其在所述基板的后部沿所述上方向突出，以限定所述中间板相对于所述基板的使用位置。

64. 发明申请

US20130061700A1 OPENING/CLOSING DEVICE 有权
标题翻译：开启/关闭装置
公开(公告)号：US20130061700A1
公开(公告)日：2013-03-14
申请号：US13698095
申请日：2011-05-02
申请人： Yasuhiro Mitsui , Hironobu Sayama
发明人： Yasuhiro Mitsui , Hironobu Sayama
IPC分类号： F16H21/44
CPC分类号： H04M1/0237 , G06F1/1615 , H04M1/0216 , Y10T16/544 , Y10T16/5448 , Y10T74/18944
摘要： The present invention relates to an opening/closing device including a fixed plate, a moving plate that can be moved relative to the fixed plate, a slide plate that is formed having a slide groove, a hinge arm including a first shaft part rotatably connected to the fixed plate, a third shaft part rotatably connected to the moving plate, and a second shaft part provided between the first shaft part and the third shaft part, and configured to move the moving plate between a closed position and an open position relative to the fixed plate by centrally rotating about the first shaft part, a slide arm including a fourth shaft part rotatably connected to the moving plate and a fifth shaft part connected slidably along the slide groove of the slide plate, and configured to move the moving plate between the closed position and the open position relative to the fixed plate by rotating about the fourth shaft part, a link arm having one end part connected to the second shaft part and another end part connected to the fifth shaft part. The fifth shaft part is configured to slide inside the slide groove as the link arm moves along with the moving of the hinge arm when the moving plate is moved between the closed position and the open position. The moving plate and the fixed plate are positioned substantially on the same plane when the moving plate is moved to the open position.
摘要翻译：本发明涉及一种打开/关闭装置，其包括固定板，可相对于固定板移动的移动板，形成有滑动槽的滑动板，铰链臂，其包括可旋转地连接到固定板，可旋转地连接到移动板的第三轴部分和设置在第一轴部分和第三轴部分之间的第二轴部分，并且构造成使移动板相对于相对于第二轴部分的关闭位置和打开位置移动通过围绕第一轴部中心旋转的固定板，包括可旋转地连接到移动板的第四轴部的滑动臂和沿着滑动板的滑动槽可滑动地连接的第五轴部，并且构造成使移动板在关闭位置和通过围绕第四轴部分旋转而相对于固定板的打开位置，连杆臂具有连接到第二轴部的一个端部，另一端部分连接到第五轴部分。当移动板在关闭位置和打开位置之间移动时，第五轴部分构造成随着连杆臂随着铰链臂的移动而移动而在滑动槽内滑动。当移动板移动到打开位置时，移动板和固定板基本位于同一平面上。

65. 发明授权

US08178840B2 Specimen inspection equipment and how to make the electron beam absorbed current images 有权
标题翻译：试样检查设备和如何使电子束吸收当前图像
公开(公告)号：US08178840B2
公开(公告)日：2012-05-15
申请号：US12691331
申请日：2010-01-21
申请人： Tomoharu Obuki , Hiroshi Toyama , Yasuhiro Mitsui , Munetoshi Fukui , Yasuhiko Nara , Tohru Ando , Katsuo Ooki , Tsutomu Saito , Masaaki Komori
发明人： Tomoharu Obuki , Hiroshi Toyama , Yasuhiro Mitsui , Munetoshi Fukui , Yasuhiko Nara , Tohru Ando , Katsuo Ooki , Tsutomu Saito , Masaaki Komori
IPC分类号： G01N23/225 , H01J37/28
CPC分类号： G01N23/225 , H01J2237/2449 , H01J2237/24564 , H01J2237/2817
摘要： An object of the present invention is to obtain a clear absorbed current image without involving the difference in gain of amplifier between inputs, from absorbed currents detected by using a plurality of probes and to improve measurement efficiency.In the present invention, a plurality of probes are brought in contact with a specimen. While irradiating the specimen with an electron beam, currents flowing in the probes are measured. Signals from at least two probes are input to a differential amplifier. An output of the differential amplifier is amplified. On the basis of the amplified output and scanning information of the electron beam, an absorbed current image is generated. According to the invention, a clear absorbed current image can be obtained without involving the difference in gain of amplifier between inputs. Thus, measurement efficiency in a failure analysis of a semiconductor device can be improved.
摘要翻译：本发明的目的是获得清晰的吸收电流图像，而不涉及放大器在输入之间的增益差异，从吸收的电流通过使用多个探针检测并提高测量效率。在本发明中，使多个探针与试样接触。在用电子束照射样品的同时，测量在探针中流动的电流。至少两个探头的信号被输入到差分放大器。差分放大器的输出被放大。基于电子束的放大输出和扫描信息，产生吸收的当前图像。根据本发明，可以获得清晰的吸收电流图像而不涉及放大器在输入之间的增益差。因此，可以提高半导体器件的故障分析中的测量效率。

66. 发明授权

US07888639B2 Method and apparatus for processing a micro sample 有权
标题翻译：用于处理微量样品的方法和设备
公开(公告)号：US07888639B2
公开(公告)日：2011-02-15
申请号：US11980654
申请日：2007-10-31
申请人： Mitsuo Tokuda , Muneyuki Fukuda , Yasuhiro Mitsui , Hidemi Koike , Satoshi Tomimatsu , Hiroyasu Shichi , Hideo Kashima , Kaoru Umemura
发明人： Mitsuo Tokuda , Muneyuki Fukuda , Yasuhiro Mitsui , Hidemi Koike , Satoshi Tomimatsu , Hiroyasu Shichi , Hideo Kashima , Kaoru Umemura
IPC分类号： G01N23/00
CPC分类号： H04L29/06 , G01N23/225 , H01J37/256 , H01J37/3056 , H01J2237/20 , H01J2237/202 , H01J2237/31745 , H04L67/16 , H04L69/329
摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.
摘要翻译：本发明的目的是实现一种用于处理和观察微分样品的方法和装置，其能够以高分辨率，高精度和高产量在水平和垂直方向观察晶片的截面而不分裂任何作为样品的晶片。在本发明的装置中，在一个真空容器中包括聚焦离子束光学系统和电子光学系统，并且通过用带电粒子束的成形处理分离包含样品的所需区域的微小样品，并且在那里被包括用于提取分离的微小样本的操纵器和用于独立于晶片样品台驱动操纵器的操纵器控制器。

67. 发明申请

US20090230984A1 DEFECTIVE PRODUCT INSPECTION APPARATUS, PROBE POSITIONING METHOD AND PROBE MOVING METHOD 有权
标题翻译：有缺陷的产品检验设备，探针定位方法和探头移动方法
公开(公告)号：US20090230984A1
公开(公告)日：2009-09-17
申请号：US12471907
申请日：2009-05-26
申请人： Eiichi HAZAKI , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi HAZAKI , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于第一名

68. 发明申请

US20090021350A1 Portable electronic device, security system and method for determining allowable operating range of portable electronic device 审中-公开
标题翻译：便携式电子设备，安全系统和方法，用于确定便携式电子设备的允许工作范围
公开(公告)号：US20090021350A1
公开(公告)日：2009-01-22
申请号：US11919129
申请日：2006-04-18
申请人： Koichi Hatta , Noritaka Koyama , Yasuhiro Mitsui
发明人： Koichi Hatta , Noritaka Koyama , Yasuhiro Mitsui
IPC分类号： H04Q5/22
CPC分类号： H04W12/08 , G08B13/1418 , G08B13/1427 , G08B21/0213 , G08B21/025 , H04L63/0853 , H04W12/0027 , H04W12/00503
摘要： There is provided a portable electronic device limiting an allowable operating range thereof for security reason and a security system using the portable electronic device. A security system 10 includes a mobile-phone 100 and an item 101. The mobile-phone 100 has functions of a registering unit 501, a judging unit 503 and an operating range determining unit 504, etc. The registering unit 501 registers item information to specify the item in advance. The judging unit 503 judges, based on the presence or absence of a signal from the item, whether an item specified by the registered item information can communicate with the mobile-phone or not when an event is generated in the mobile-phone. When it is judged that the communication is possible, the operating range determining unit 504 allows a normal operation of the mobile-phone in response to an external access, and when it is judged that the communication is impossible, the operating range determining unit 504 limits the operating range of the portable electronic device in response to an external access.
摘要翻译：提供了一种便携式电子设备，用于为了安全原因限制其允许的操作范围以及使用便携式电子设备的安全系统。安全系统10包括移动电话100和项目101.移动电话100具有登记单元501，判断单元503和操作范围确定单元504等的功能。登记单元501将项目信息登记到提前指定项目。当在移动电话中产生事件时，判断单元503基于项目的信号的存在或不存在来判断由注册的项目信息指定的项目是否可以与移动电话通信。当判断为可以进行通信时，操作范围确定单元504允许移动电话响应于外部访问的正常操作，并且当判断为不可能进行通信时，操作范围确定单元504限制便携式电子设备的响应于外部访问的操作范围。

69. 发明申请

US20080203297A1 Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images 有权
标题翻译：标本检测设备和如何使电子束吸收当前图像
公开(公告)号：US20080203297A1
公开(公告)日：2008-08-28
申请号：US12038079
申请日：2008-02-27
申请人： Tomoharu OBUKI , Hiroshi Toyama , Yasuhiro Mitsui , Munetoshi Fukui , Yasuhiko Nara , Tohru Ando , Katsuo Ooki , Tsutomu Saito , Masaaki Komori
发明人： Tomoharu OBUKI , Hiroshi Toyama , Yasuhiro Mitsui , Munetoshi Fukui , Yasuhiko Nara , Tohru Ando , Katsuo Ooki , Tsutomu Saito , Masaaki Komori
IPC分类号： G01N23/00
CPC分类号： G01N23/225 , H01J2237/2449 , H01J2237/24564 , H01J2237/2817
摘要： An object of the present invention is to obtain a clear absorbed current image without involving the difference in gain of amplifier between inputs, from absorbed currents detected by using a plurality of probes and to improve measurement efficiency.In the present invention, a plurality of probes are brought in contact with a specimen. While irradiating the specimen with an electron beam, currents flowing in the probes are measured. Signals from at least two probes are input to a differential amplifier. An output of the differential amplifier is amplified. On the basis of the amplified output and scanning information of the electron beam, an absorbed current image is generated. According to the invention, a clear absorbed current image can be obtained without involving the difference in gain of amplifier between inputs. Thus, measurement efficiency in a failure analysis of a semiconductor device can be improved.
摘要翻译：本发明的目的是获得清晰的吸收电流图像，而不涉及放大器在输入之间的增益差异，从吸收的电流通过使用多个探针检测并提高测量效率。在本发明中，使多个探针与试样接触。在用电子束照射样品的同时，测量在探针中流动的电流。至少两个探头的信号被输入到差分放大器。差分放大器的输出被放大。基于电子束的放大输出和扫描信息，产生吸收的当前图像。根据本发明，可以获得清晰的吸收电流图像而不涉及放大器在输入之间的增益差。因此，可以提高半导体器件的故障分析中的测量效率。

70. 发明申请

US20080048699A1 Defective product inspection apparatus, probe positioning method and probe moving method 有权
标题翻译：产品检验设备不良，探头定位方法和探头移动方法
公开(公告)号：US20080048699A1
公开(公告)日：2008-02-28
申请号：US11976238
申请日：2007-10-23
申请人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且在第二位置处的测量精度优于第一名

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