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1. 发明授权

US07553334B2 Defective product inspection apparatus, probe positioning method and probe moving method 有权
标题翻译：产品检验设备不良，探头定位方法和探头移动方法
公开(公告)号：US07553334B2
公开(公告)日：2009-06-30
申请号：US11976238
申请日：2007-10-23
申请人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01N13/10
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于第一名

2. 发明授权

US07297945B2 Defective product inspection apparatus, probe positioning method and probe moving method 有权
标题翻译：产品检验设备不良，探头定位方法和探头移动方法
公开(公告)号：US07297945B2
公开(公告)日：2007-11-20
申请号：US11002710
申请日：2004-12-03
申请人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01N23/00
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于第一名

3. 发明申请

US20050139781A1 Defective product inspection apparatus, probe positioning method and probe moving method 有权
标题翻译：产品检验设备不良，探头定位方法和探头移动方法
公开(公告)号：US20050139781A1
公开(公告)日：2005-06-30
申请号：US11002710
申请日：2004-12-03
申请人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01Q30/02 , G01N23/225 , G21K7/00 , G01N23/00
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于第一名

4. 发明授权

US08074293B2 Defective product inspection apparatus, probe positioning method and probe moving method 有权
标题翻译：产品检验设备不良，探头定位方法和探头移动方法
公开(公告)号：US08074293B2
公开(公告)日：2011-12-06
申请号：US12471907
申请日：2009-05-26
申请人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： H01J37/20 , G01N13/16
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于第一名

5. 发明申请

US20090230984A1 DEFECTIVE PRODUCT INSPECTION APPARATUS, PROBE POSITIONING METHOD AND PROBE MOVING METHOD 有权
标题翻译：有缺陷的产品检验设备，探针定位方法和探头移动方法
公开(公告)号：US20090230984A1
公开(公告)日：2009-09-17
申请号：US12471907
申请日：2009-05-26
申请人： Eiichi HAZAKI , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi HAZAKI , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于第一名

6. 发明申请

US20080048699A1 Defective product inspection apparatus, probe positioning method and probe moving method 有权
标题翻译：产品检验设备不良，探头定位方法和探头移动方法
公开(公告)号：US20080048699A1
公开(公告)日：2008-02-28
申请号：US11976238
申请日：2007-10-23
申请人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
发明人： Eiichi Hazaki , Yasuhiro Mitsui , Takashi Furukawa , Hiroshi Yanagita , Susumu Kato , Osamu Satou , Osamu Yamada , Yoshikazu Inada
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01N23/225 , G01R31/2887 , H01J37/20 , H01J37/226 , H01J37/28 , H01J2237/2007 , H01J2237/2008 , H01J2237/20221 , H01J2237/204 , H01J2237/24564 , H01J2237/2482
摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
摘要翻译：为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且在第二位置处的测量精度优于第一名

7. 发明申请

US20050268708A1 Rough road drive simulation and evaluation for vehicle control system 失效
标题翻译：车辆控制系统的粗糙驾驶模拟与评估
公开(公告)号：US20050268708A1
公开(公告)日：2005-12-08
申请号：US11137789
申请日：2005-05-26
申请人： Osamu Satou , Syuuichi Nakagawa , Hiroshi Murakami , Haruki Saitou
发明人： Osamu Satou , Syuuichi Nakagawa , Hiroshi Murakami , Haruki Saitou
IPC分类号： B60T8/172 , G01M17/007 , G06F19/00 , G09B9/042 , G01L3/26
CPC分类号： B60T8/172 , B60T2210/14
摘要： A rough road drive simulation apparatus for testing a vehicle motion control system includes a real-time simulator. The real time simulator simulates a rough road driving state by entering, to a vehicle model representing a vehicle equipped with the vehicle motion control system, a wheel disturbance input based on a correlation between a road surface disturbance and a wheel rotation variation.
摘要翻译：用于测试车辆运动控制系统的粗糙道路驾驶模拟装置包括实时模拟器。实时模拟器通过将表示具有车辆运动控制系统的车辆的车辆模型输入到基于路面干扰与车轮旋转变化之间的相关性的车轮扰动输入，来模拟粗略的道路行驶状态。

8. 发明授权

US5841893A Inspection data analyzing system 失效
公开(公告)号：US5841893A
公开(公告)日：1998-11-24
申请号：US908550
申请日：1992-06-30
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： H01L21/66 , G01N21/88 , G01N21/956 , G06K9/00
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

9. 发明授权

US06339653B1 Inspection data analyzing system 失效
标题翻译：检验数据分析系统
公开(公告)号：US06339653B1
公开(公告)日：2002-01-15
申请号：US09523380
申请日：2000-03-10
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.
摘要翻译：本发明分别提供用于探测器和自动粒子检测机的数据分析台。并且，在数据分析站中，以产品为基础描述芯片的配置的坐标与描述缺陷的位置的坐标相同。此外，该站提供确定每个缺陷属于哪个芯片的功能。这些数据分析站通过通信线连接。本发明能够基于芯片分析数据，从而能够掌握每个芯片上的缺陷引起的芯片与芯片的产品特性之间的关系。

10. 发明授权

US5164758A Exposure control apparatus of camera having an automatic exposure bracket drive mode 失效
标题翻译：具有自动曝光支架驱动模式的相机曝光控制装置
公开(公告)号：US5164758A
公开(公告)日：1992-11-17
申请号：US794927
申请日：1991-11-19
申请人： Osamu Satou , Isamu Hashimoto , Takao Nishida
发明人： Osamu Satou , Isamu Hashimoto , Takao Nishida
IPC分类号： G03B7/091
CPC分类号： G03B7/091
摘要： An exposure control apparatus of a camera includes a first switch which can select a plurality of drive modes including an auto-exposure bracket mode (AEB mode), a second switch which issues signals when operated, a third switch which can modify an exposure correcting value and a memory which stores a plurality of predetermined exposure correcting values. A drive mode selector successively selects the drive modes in response to signals from the second switch when the second switch is actuated during the operation of the first switch. A modifying device successively selects an exposure correcting value to be used to correct the exposure value among those stored in the memory in response to signals issued from the second switch when the latter is actuated during the operation of the third switch. A photographing controller is provided which takes a plurality of pictures at different exposure values in an exposure width correcting values selected by the modifying device when the AEB mode is selected.
摘要翻译：照相机的曝光控制装置包括：第一开关，其可以选择多个驱动模式，包括自动曝光支架模式（AEB模式），在操作时发出信号的第二开关，可修改曝光校正值的第三开关以及存储多个预定曝光校正值的存储器。当在第一开关的操作期间启动第二开关时，驱动模式选择器响应于来自第二开关的信号而连续地选择驱动模式。修改装置在第三开关的操作期间响应于从第二开关发出的信号被激活而连续地选择要用于校正存储在存储器中的曝光值的曝光校正值。提供一种拍摄控制器，其在选择了AEB模式时，以修改装置选择的曝光宽度校正值中的不同曝光值拍摄多张图像。

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