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    • 65. 发明申请
    • OPERATING METHOD OF NONVOLATILE MEMORY DEVICE
    • 非易失性存储器件的操作方法
    • US20120195125A1
    • 2012-08-02
    • US13315523
    • 2011-12-09
    • BYEONG-IN CHOESunil ShimWoonkyung LeeJaehoon Jang
    • BYEONG-IN CHOESunil ShimWoonkyung LeeJaehoon Jang
    • G11C16/10G11C16/04
    • G11C16/10G11C16/0483G11C16/3459H01L27/11582
    • Disclosed is an operating method of a nonvolatile memory device, which includes programming the first selection transistors of the plurality of cell strings and programming the plurality of memory cells of the plurality of cell strings. The programming the first selection transistors comprises supplying a first voltage to a first bit line connected with a first selection transistor to be programmed and a different second voltage to a second bit line connected to a first selection transistor to be program inhibited; turning on the second selection transistors of the plurality of cell strings, and supplying a first program voltage to a selected first selection line among a plurality of first selection lines connected with the first selection transistors and a third voltage to an unselected first selection line among the plurality of first selection lines.
    • 公开了一种非易失性存储器件的操作方法,其包括编程多个单元串中的第一选择晶体管并对多个单元串中的多个存储单元进行编程。 对第一选择晶体管进行编程包括将第一电压提供给与待编程的第一选择晶体管连接的第一位线,以及将不同的第二电压提供给连接到第一选择晶体管的第二位线以被禁止编程; 接通多个单元串中的第二选择晶体管,并将第一编程电压提供给与第一选择晶体管连接的多个第一选择线中的所选择的第一选择线,以及将第三电压提供给未选择的第一选择线 多个第一选择线。