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    • 61. 发明授权
    • Method and apparatus for measuring time dependent signals with a
particle probe
    • 用粒子探针测量时间依赖信号的方法和装置
    • US4748407A
    • 1988-05-31
    • US16696
    • 1987-01-28
    • Matthias BrunnerReinhold SchmittDieter Winkler
    • Matthias BrunnerReinhold SchmittDieter Winkler
    • H01L21/66G01N23/225G01Q30/02G01R31/26G01R31/302G01R31/305H01J37/28H01J49/44G01R31/28
    • G01R31/305
    • To measure high frequency signal curves at nodes and interconnections of integrated circuits and achieve a good chronological resolution in accordance with the sampling method, extremely short primary electron pulses are used. For such extremely short pulse widths obtainable with beam blanking systems, only individual statistically appearing secondary electrons are registered per pulse, these electrons generating current pulses having different amplitudes and different time behaviors at the output of an energy analyzer. It is proposed that the number of current pulses occurring at the output of the energy analyzer within a prescribed time interval be identified and the quotient, or ratio, thereof, be kept constant with the assistance of a feedback circuit for connection to the voltage of a retarding field electrode. The feedback circuit includes a pulse counter, a digital-to-analog converter, and a spectrometer drive.
    • 为了测量集成电路的节点和互连的高频信号曲线,并根据采样方法实现良好的时间分辨率,使用极短的一次电子脉冲。 对于通过光束消隐系统可获得的这种极短的脉冲宽度,每个脉冲仅记录每个统计学显示的二次电子,这些电子在能量分析仪的输出处产生具有不同幅度和不同时间行为的电流脉冲。 提出在规定的时间间隔内在能量分析器的输出处出现的电流脉冲数被识别,并且在一个反馈电路的辅助下,商或其比率被保持恒定,以连接到 延迟场电极。 反馈电路包括脉冲计数器,数模转换器和光谱仪驱动器。
    • 62. 发明申请
    • CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERATING THEREOF
    • 具有动态聚焦的充电颗粒光束装置及其操作方法
    • US20130214155A1
    • 2013-08-22
    • US13405759
    • 2012-02-27
    • Dieter WinklerIgor Petrov
    • Dieter WinklerIgor Petrov
    • H01J37/04
    • H01J37/145H01J37/1474H01J37/21H01J37/28H01J2237/28
    • A retarding field scanning electron microscope is described. The microscope includes a scanning deflection assembly configured for scanning an electron beam over a specimen, one or more controllers in communication with the scanning deflection assembly for controlling the electron beam scanning pattern, and a combined magnetic-electrostatic objective lens configured for focusing the electron beam including an electrostatic lens portion. The electrostatic lens portion includes a first electrode with a high potential bias, and a second electrode disposed between the first electrode and the specimen plane with a potential bias lower than the first electrode, wherein the second electrode is configured for providing a retarding field. The microscope further includes a voltage supply connected to the second electrode for biasing the second electrode and being in communication with the controllers, wherein the controllers synchronize a variation of the potential of the second electrode with the scanning pattern.
    • 描述了延迟场扫描电子显微镜。 显微镜包括扫描偏转组件,其被配置为扫描试样上的电子束,与用于控制电子束扫描图案的扫描偏转组件连通的一个或多个控制器,以及组合的静电物镜,其被配置用于聚焦电子束 包括静电透镜部分。 静电透镜部分包括具有高电位偏置的第一电极和设置在第一电极和检体平面之间的电位偏压低于第一电极的第二电极,其中第二电极被配置为提供延迟场。 显微镜还包括连接到第二电极的电压源,用于偏置第二电极并与控制器连通,其中控制器使第二电极的电位变化与扫描图案同步。
    • 65. 发明授权
    • Charged particle beam device with a gas field ion source and a gas supply system
    • 带气体离子源和气体供应系统的带电粒子束装置
    • US07692165B2
    • 2010-04-06
    • US11752560
    • 2007-05-23
    • Dieter Winkler
    • Dieter Winkler
    • G21K5/10H01J37/08
    • H01J37/08H01J2237/006H01J2237/061H01J2237/0807H01J2237/0815
    • The present invention provides a charged particle beam device for irradiating a specimen with ions. The charged particle beam device comprises a gas field ion source unit for generating a beam of ions, the gas field ion source having an emitter unit having an emitter unit tip; and a gas supply system for directing gas to the emitter unit tip. The gas supply system comprises an array of capillary tubes. Further, the present invention provides a method for irradiating a specimen with ions by operating a charged particle beam device having a gas field ion source, wherein the method comprises the step of directing a gas flow to an emitter unit tip, wherein the gas flow has a gas beam aperture angle of 3° or less.
    • 本发明提供一种用离子照射样本的带电粒子束装置。 带电粒子束装置包括用于产生离子束的气体离子源单元,气体离子源具有发射极单元,其具有发射极单元尖端; 以及用于将气体引导到发射器单元尖端的气体供应系统。 气体供应系统包括一排毛细管。 此外,本发明提供了一种通过操作具有气体离子源的带电粒子束装置对离子进行照射的方法,其中该方法包括将气流引导到发射器单元尖端的步骤,其中气流具有 气束孔径角为3°以下。
    • 68. 发明申请
    • MODULAR GAS ION SOURCE
    • 模块化气体源
    • US20090020708A1
    • 2009-01-22
    • US12167734
    • 2008-07-03
    • Dieter WinklerThomas JasinskiUdo Weigel
    • Dieter WinklerThomas JasinskiUdo Weigel
    • H01J27/02
    • H01J37/08H01J27/26H01J2237/006H01J2237/03H01J2237/0807
    • A gas field ion source is described. The gas field ion source includes an emitter module. The emitter module includes an emitter holder, an emitter structure, a detachably connectable electrical connection assembly of the emitter module, and a detachably connectable gas supply connection assembly of the emitter module. The gas field ion source further includes a supply module, wherein the supply module includes an electrical conductor for providing voltage and/or current, a gas supply conduit, a thermal conductor, a detachably connectable electrical connection assembly of the supply module, and a detachably connectable gas supply connection assembly of the supply module. The emitter module and the supply module are detachably connectable by the detachably connectable connection assemblies of the emitter module and the detachably connectable connection assemblies of the supply module.
    • 描述了气体场离子源。 气体离子源包括发射器模块。 发射器模块包括发射器支架,发射器结构,发射器模块的可拆卸连接的电连接组件以及发射器模块的可拆卸地连接的气体供应连接组件。 所述气体离子源还包括供电模块,其中所述供应模块包括用于提供电压和/或电流的电导体,气体供应导管,热导体,所述供应模块的可拆卸地连接的电连接组件, 供电模块的可连接气体供应连接组件。 发射器模块和供电模块可通过发射器模块的可拆卸连接的连接组件和供应模块的可拆卸连接的连接组件可拆卸地连接。