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    • 65. 发明申请
    • Nonvolatile semiconductor memory with a programming operation and the method thereof
    • 具有编程操作的非易失性半导体存储器及其方法
    • US20050030790A1
    • 2005-02-10
    • US10927716
    • 2004-08-27
    • Jae-Yong JeongSung-Soo Lee
    • Jae-Yong JeongSung-Soo Lee
    • G11C16/02G11C16/04G11C16/06G11C16/10G11C16/24G11C11/34
    • G11C16/24G11C16/0483G11C16/10
    • The invention provides a method of programming in a nonvolatile semiconductor memory device, having a plurality of memory cell strings connected to a plurality of bitlines and constructed of a plurality of memory cell transistors whose gates are coupled to a plurality of wordlines, and a plurality of registers corresponding to the bitlines. The method involves applying a first voltage to a first one of the bitlines and applying a second voltage to a second one of the bitline, the first bitline being adjacent to the second bitline, the first and second voltages being supplied from the registers; electrically isolating the first and second bitlines from their corresponding registers; charging the first bitline up to a third voltage higher than the first voltage and lower than the second voltage; and applying a fourth voltage to a wordline after cutting off current paths into the first and second bitlines.
    • 本发明提供了一种在非易失性半导体存储器件中进行编程的方法,该方法具有连接到多个位线的多个存储单元串,并且由多个存储单元晶体管组成,多个存储单元晶体管的栅极耦合到多个字线, 与位线对应的寄存器。 所述方法包括将第一电压施加到位线中的第一位置,并将第二电压施加到所述位线中的第二位置,所述第一位线与所述第二位线相邻,所述第一和第二电压从所述寄存器提供; 将第一和第二位线与其对应的寄存器电隔离; 将第一位线充电至高于第一电压并低于第二电压的第三电压; 以及在将当前路径切断到所述第一和第二位线之后,将第四电压施加到字线。
    • 68. 发明授权
    • Method and apparatus for optimizing erase and program times for a
non-volatile memory device
    • 用于优化非易失性存储器件的擦除和编程时间的方法和装置
    • US5801989A
    • 1998-09-01
    • US762495
    • 1996-12-09
    • Sung-Soo LeeJin-Ki Kim
    • Sung-Soo LeeJin-Ki Kim
    • G11C17/00G11C16/06G11C16/10G11C16/30G11C16/34G11C29/50G11C29/52G11C16/04
    • G11C16/3459G11C16/10G11C16/30G11C16/3454G11C29/028G11C29/50G11C29/50012G11C29/52G11C16/04G11C2029/5004
    • A nonvolatile semiconductor memory device optimizes the time required for erasing or programming a cell by determining an optimal initial programming voltage. The initial programming voltage is relatively low and is fixed in the device during a test mode operation. During a normal erasing or programming operation, a programming signal having the initial programming voltage level is applied to the cell. The programmed state of the cell is then checked. If the cell did not program successfully, the voltage of the programming signal is increased and another programming cycle is executed. The programming cycle is repeated until the cell is programmed properly or a maximum number of programming cycles is reached. To determine the optimal initial programming voltage, an automatic programming operation is performed using a relatively low voltage programming signal. If the time required to complete the programming operation exceeds a target programming time, the voltage of the programming signal is repetitively increased, and the programming operation is repeated until the time required for the programming operation is less than the target time. The optimal initial voltage level of the programming signal is then fixed in the memory device by selectively cutting fuses in a trimming address register in a programming circuit which also includes a loop counter for counting the number of programming cycles during a programming operation and a programming signal generator that varies the voltage of the programming signal responsive to a control signal from the loop counter.
    • 非易失性半导体存储器件通过确定最佳初始编程电压来优化擦除或编程单元所需的时间。 初始编程电压相对较低,并且在测试模式操作期间固定在器件中。 在正常擦除或编程操作期间,具有初始编程电压电平的编程信号被施加到单元。 然后检查单元格的编程状态。 如果单元没有成功编程,编程信号的电压就会增加,并执行另一个编程周期。 重复编程周期,直到单元被正确编程或达到最大编程周期数。 为了确定最佳初始编程电压,使用相对低电压的编程信号执行自动编程操作。 如果完成编程操作所需的时间超过目标编程时间,则编程信号的电压被重复地增加,并且重复编程操作,直到编程操作所需的时间小于目标时间。 编程信号的最佳初始电压电平然后通过选择性地切割编程电路中的微调地址寄存器中的熔丝固定在存储器件中,该编程电路还包括用于在编程操作期间对编程周期数进行计数的循环计数器和编程信号 发生器,响应于来自循环计数器的控制信号改变编程信号的电压。
    • 69. 发明授权
    • Sense amplifier for nonvolatile semiconductor memory device
    • 用于非易失性半导体存储器件的感应放大器
    • US5790458A
    • 1998-08-04
    • US680055
    • 1996-07-15
    • Sung-Soo LeeKang-Deog Suh
    • Sung-Soo LeeKang-Deog Suh
    • G11C17/00G11C7/06G11C16/06G11C17/18G11C7/00
    • G11C7/067
    • A sense amplifier for transferring data between a data input/output line and a bit line in a nonvolatile semiconductor memory device includes two isolated current paths to prevent data collisions. A transistor transfers a bit of input data from the data input/output line to a first terminal of a two-terminal latch in response to a load control signal. The second terminal of the latch is connected to the bit line. A second transistor transfers a bit of output data from the second terminal of the latch to the data input/output line in response to a read control signal. While the bit of input data is being transferred, the second transistor isolates the second terminal of the latch from the data input/output line.
    • 用于在非易失性半导体存储器件中的数据输入/输出线和位线之间传输数据的读出放大器包括两个隔离电流路径,以防止数据冲突。 晶体管响应于负载控制信号将数据输入/输出线中的一位输入数据传送到两端锁存器的第一端。 锁存器的第二端子连接到位线。 响应于读控制信号,第二晶体管将一位输出数据从锁存器的第二端传送到数据输入/输出线。 当输入数据的位被传送时,第二晶体管将锁存器的第二端与数据输入/输出线相隔离。