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    • 63. 发明授权
    • Algorithm for charge loss reduction and Vt distribution improvement
    • 电荷损失减少和Vt分布改进的算法
    • US07619932B2
    • 2009-11-17
    • US11959122
    • 2007-12-18
    • Gwyn Robert JonesEdward Franklin RunnionZhizheng LiuMark William Randolph
    • Gwyn Robert JonesEdward Franklin RunnionZhizheng LiuMark William Randolph
    • G11C11/34
    • G11C16/3436G11C11/5671G11C16/0475G11C16/0491G11C2211/5621
    • Methods and systems for accurately programming or erasing one or more memory cells on a selected wordline of a memory device are provided. In one embodiment, the memory device comprises a memory array, a threshold voltage measuring component configured to measure a threshold voltage of each memory cell on the selected wordline of the memory array, and an average threshold voltage determining component configured to determine an average threshold voltage result uniquely associated with the selected wordline, based on the measured threshold voltages. The memory device is configured to program one or more of the memory cells to a predefined program level relative to the determined average threshold voltage, or to erase memory cells of the selected wordline to the determined average threshold voltage. The method is particularly useful for multi-level flash memory cells to reduce charge loss while improving data reliability and Vt distributions of the programmed element states.
    • 提供了用于在存储器件的选定字线上精确编程或擦除一个或多个存储器单元的方法和系统。 在一个实施例中,存储器件包括存储器阵列,阈值电压测量部件,被配置为测量存储器阵列的选定字线上的每个存储器单元的阈值电压,以及平均阈值电压确定部件,被配置为确定平均阈值电压 结果与所选择的字线唯一地相关联,基于所测量的阈值电压。 存储器装置被配置为相对于所确定的平均阈值电压将一个或多个存储器单元编程到预定程序级,或者将所选字线的存储单元擦除到所确定的平均阈值电压。 该方法对于多级闪存单元特别有用,以减少电荷损耗,同时提高编程元件状态的数据可靠性和Vt分布。
    • 67. 发明授权
    • Method of programming a flash memory device using multilevel charge storage
    • 使用多电平电荷存储来编程闪存器件的方法
    • US07042766B1
    • 2006-05-09
    • US10896651
    • 2004-07-22
    • Zhigang WangNian YangZhizheng Liu
    • Zhigang WangNian YangZhizheng Liu
    • G11C16/06
    • G11C11/5628G11C16/12G11C16/3468G11C2211/5621
    • Disclosed is a method of programming a flash memory device to store an amount of charge corresponding to one of a plurality of charged program states. The method can include pulsing the memory device with program voltages including at least a gate voltage. If the gate voltage is greater than or equal to a predetermined minimum threshold voltage for the one of the plurality of charged program states, an amount of charge stored by the memory device can be verified. Otherwise the memory device can be repulsed. This procedure can be carried out until verifying is conducted and the verifying indicates that the amount of charge stored by the memory device corresponds to the one of the plurality of charged program states.
    • 公开了一种编程闪速存储器件以存储对应于多个充电程序状态之一的电荷量的方法。 该方法可以包括使具有至少包括栅极电压的编程电压脉冲存储器件。 如果栅极电压大于或等于多个充电程序状态之一的预定最小阈值电压,则可以验证由存储器件存储的电荷量。 否则可能会使存储器件发生故障。 可以执行该过程,直到进行验证,并且验证指示存储器件存储的电荷量对应于多个充电程序状态中的一个。