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    • 61. 发明授权
    • Sample processing apparatus and sample processing system
    • 样品处理设备和样品处理系统
    • US06939433B2
    • 2005-09-06
    • US10228039
    • 2002-08-27
    • Shoji IkuharaHideyuki Yamamoto
    • Shoji IkuharaHideyuki Yamamoto
    • H01L21/66H05H1/00C23C16/00C23F1/00H01L21/00
    • H01L22/20H01J37/32935
    • It is an object of the invention to provide a vacuum processing device and a vacuum processing system capable of improving the accuracy for the function of estimating the result of processing of samples based on the monitored values for the processing state of the samples, improving the forecasting accuracy and thus improving the yield of products. The system comprises a function of monitoring processing parameters for samples, a function of estimating the processing characteristics of the samples based on the monitored parameters, a function of conducting communication with a measuring device for measuring the processing state of the samples after processing and a function of updating the measuring conditions by the measuring device in accordance with the processing characteristics of the samples estimated from the information by monitoring.
    • 本发明的目的是提供一种真空处理装置和真空处理系统,其能够基于样本的处理状态的监视值来提高估计样品处理结果的功能的准确度,从而改善预测 准确性,从而提高产品的产量。 该系统包括监视样本的处理参数的功能,基于所监视的参数来估计样本的处理特性的功能,与测量装置进行通信的功能,用于测量处理后的样本的处理状态和功能 根据通过监视从信息估计的样本的处理特性,由测量装置更新测量条件。