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    • 63. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US08508978B2
    • 2013-08-13
    • US13114507
    • 2011-05-24
    • Kazuya IshiharaMitsuru NakuraYoshiji Ohta
    • Kazuya IshiharaMitsuru NakuraYoshiji Ohta
    • G11C11/00
    • G11C7/12G11C8/08G11C13/0004G11C13/0007G11C13/0026G11C13/0069G11C2013/0071G11C2213/79G11C2213/82
    • A semiconductor memory device includes a memory cell array in which a plurality of memory cells is aligned in a matrix shape, each memory cell including a two-terminal memory element and a transistor for selection connected in series; a first voltage applying circuit that applies a writing voltage pulse to first bit lines; and a second voltage applying circuit that applies a pre-charge voltage to the first bit lines and second bit lines, wherein in a writing of a memory cell, after the second voltage applying circuit has pre-charged both ends of the memory cell to a same voltage, the first voltage applying circuit applies the writing voltage pulse via the first bit line that is directly connected to the transistor for selection, and the second voltage applying circuit applies the pre-charge voltage to the second bit line directly connected to the memory element.
    • 半导体存储器件包括其中多个存储器单元以矩阵形状排列的存储单元阵列,每个存储单元包括串联连接的两端存储元件和选择晶体管; 对第一位线施加写入电压脉冲的第一电压施加电路; 以及施加预充电电压到第一位线和第二位线的第二电压施加电路,其中在存储单元的写入中,在所述第二电压施加电路将所述存储器单元的两端预充电到 第一电压施加电路经由直接连接到晶体管的第一位线施加写入电压脉冲用于选择,并且第二电压施加电路将预充电电压施加到直接连接到存储器的第二位线 元件。
    • 65. 发明授权
    • Control circuit for forming process on nonvolatile variable resistive element and control method for forming process
    • 用于在非易失性可变电阻元件上形成工艺的控制电路和用于形成工艺的控制方法
    • US08120944B2
    • 2012-02-21
    • US12722851
    • 2010-03-12
    • Suguru KawabataKazuya IshiharaYoshiji Ohta
    • Suguru KawabataKazuya IshiharaYoshiji Ohta
    • G11C11/00
    • G11C13/0007G11C13/0011G11C13/0064G11C13/0069G11C2013/0083G11C2213/34G11C2213/72G11C2213/79H01L27/24
    • A nonvolatile semiconductor memory device can carry out a forming process simultaneously on the nonvolatile variable resistive elements of memory cells and make the forming time shorter. The nonvolatile semiconductor memory device has a forming detection circuit provided between the memory cell array and the second selection line (bit line) decoder. The forming detection circuit detects the completion of the forming process for memory cells by measuring the fluctuation in the potential of second selection lines or the current flowing through the second selection lines when applying a voltage pulse for a forming process through the second selection lines simultaneously to the memory cells on which a forming process is to be carried out connected to the same first selection line (word line), and prevents a voltage from being applied to the second selection lines connected to the memory cells where the completion of the forming process is detected.
    • 非易失性半导体存储器件可以在存储单元的非易失性可变电阻元件上同时进行形成处理,并且使形成时间更短。 非易失性半导体存储器件具有设置在存储单元阵列和第二选择线(位线))解码器之间的形成检测电路。 形成检测电路通过测量当通过第二选择线同时施加用于形成处理的电压脉冲时第二选择线的电位的波动或流过第二选择线的电流来检测存储单元的形成处理的完成, 要在其上执行形成处理的存储单元连接到相同的第一选择线(字线),并且防止电压施加到连接到形成处理完成的存储单元的第二选择线 检测到。
    • 66. 发明授权
    • Nonvolatile semiconductor memory device and method of controlling the same
    • 非易失性半导体存储器件及其控制方法
    • US08111573B2
    • 2012-02-07
    • US12611279
    • 2009-11-03
    • Kazuya IshiharaYutaka IshikawaYoshiji Ohta
    • Kazuya IshiharaYutaka IshikawaYoshiji Ohta
    • G11C7/00
    • G11C8/12G11C8/18G11C13/0007G11C13/0023G11C13/0026G11C13/0028G11C13/0064G11C13/0069G11C2213/32G11C2216/22
    • Provided is a nonvolatile semiconductor memory device capable of performing a writing action for a memory cell at high speed. The device includes a memory cell array having a first sub-bank and a second sub-bank each having a plurality of nonvolatile memory cells arranged in a form of a matrix; a row decoder shared by the first sub-bank and the second sub-bank; a first column decoder and a second column decoder provided in the first sub-bank and the second sub-bank, respectively; and a control circuit arranged to execute alternately a first action cycle to perform a programming action in the first sub-bank and a reading action for a programming verifying action in the second sub-bank and a second action cycle to perform the reading action for the programming verifying action in the first sub-bank and the programming action in the second sub-bank.
    • 提供了一种能够高速地对存储单元执行写入动作的非易失性半导体存储器件。 该装置包括具有第一子库和第二子库的存储单元阵列,每个存储单元具有以矩阵形式布置的多个非易失性存储单元; 由第一子银行和第二子银行共享的行解码器; 分别设置在第一子行和第二子行中的第一列解码器和第二列解码器; 以及控制电路,被配置为交替地执行第一动作循环以在第一子存储体中执行编程动作,以及执行用于第二子存储体中的编程验证动作的读取动作和第二动作循环,以执行用于 在第一子行中编程验证动作和第二子行中的编程动作。
    • 69. 发明申请
    • Semiconductor memory device and electronic apparatus
    • 半导体存储器件和电子设备
    • US20070086238A1
    • 2007-04-19
    • US11541719
    • 2006-10-03
    • Yoshiji Ohta
    • Yoshiji Ohta
    • G11C16/06
    • G11C16/28
    • In the semiconductor storage device, in a read operation, a bit line charging/discharging section 101 performs discharge of bit lines of a memory cell array 100, and a counter counts discharge periods over which the potentials of bit lines come to a specified potential, based on a comparison result of a comparator comparing a potential of a bit line with a reference potential. Based on the comparison result, a reference value generation section 104 generates a reference value (RCi) for determining information stored in each of the memory cells. The above count value (CBUSi) and the above reference value (RCi) are compared with each other by a data decision circuit 108. Based on the comparison result, an output data control circuit 109 outputs information stored in each of the memory cells. This semiconductor storage device suppresses increases in chip area and power consumption and outputs memory cell information accurately.
    • 在半导体存储装置中,在读取操作中,位线充电/放电部分101执行存储单元阵列100的位线的放电,并且计数器计数位线的电位达到指定电位的放电周期, 基于比较器将比特线的电位与参考电位进行比较的比较结果。 基于比较结果,参考值生成部104生成用于确定存储在每个存储单元中的信息的参考值(RCi)。 通过数据判定电路108将上述计数值(CBUSi)和上述参考值(RCi)相互比较。根据比较结果,输出数据控制电路109输出存储在每个存储单元中的信息。 该半导体存储装置抑制芯片面积和功耗的增加,并且准确地输出存储单元信息。