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51. 发明申请

US20020145414A1 Magneto-optic current sensor 失效
标题翻译：磁光电流传感器
公开(公告)号：US20020145414A1
公开(公告)日：2002-10-10
申请号：US09790961
申请日：2001-02-22
申请人： Argonne National Laboratory
发明人： Michael T. Lanagan , Vitalii K. Valsko-Vlasov , Brandon L. Fisher , Ulrich Welp
IPC分类号： G01R019/00 , G01R031/00
CPC分类号： G01R15/246
摘要： An optical current transducer configured to sense current in the conductor is disclosed. The optical current transducer includes a light source and a polarizer that generates linearly polarized light received from a the light source. The light is communicated to a magneto-optic garnet that includes, among other elements, bismuth, iron and oxygen and is coupled to the conductor. The magneto-optic garnet is configured to rotate the polarization of the linearly polarized light received from the polarizer. The optical current transducer also includes an analyzer in optical communication with the magneto-optic garnet. The analyzer detects the rotation of the linearly polarized light caused by the magneto-optic garnet.
摘要翻译：公开了一种配置成感测导体中的电流的光学电流传感器。光电流换能器包括产生从光源接收的线性偏振光的光源和偏振器。光被传送到磁光石榴石，其包括铋，铁和氧等元素，并且连接到导体。磁光石榴石被配置为旋转从偏振器接收的线性偏振光的偏振。光学电流传感器还包括与磁光石榴石光学通信的分析仪。分析仪检测由磁光石榴石引起的线性偏振光的旋转。

52. 发明申请

US20020135379A1 Circuit for the detection of a defective power supply connection 有权
标题翻译：用于检测有缺陷的电源连接的电路
公开(公告)号：US20020135379A1
公开(公告)日：2002-09-26
申请号：US10060105
申请日：2002-01-29
申请人： STMicroelectronics S.A.
发明人： Christophe Moreaux , Ahmed Kari
IPC分类号： G01R031/00
CPC分类号： G01R31/043
摘要： A device for detecting a defective power supply connection in an integrated circuit includes a comparison circuit for comparing voltage levels of an input/output pad of the integrated circuit and an internal power supply line connected to a power supply pad of the integrated circuit. A pull-down or pull-up device is connected between the input/output pad and the internal power supply line.
摘要翻译：用于检测集成电路中的有缺陷的电源连接的装置包括比较电路，用于比较集成电路的输入/输出焊盘的电压电平和连接到集成电路的电源焊盘的内部电源线。在输入/输出板和内部电源线之间连接一个下拉或上拉设备。

53. 发明申请

US20020135374A1 Repair device for decorative light shunt 有权
公开(公告)号：US20020135374A1
公开(公告)日：2002-09-26
申请号：US10059750
申请日：2002-01-28
发明人： W. Richard Frederick
IPC分类号： G01R031/00
CPC分类号： G01R31/44 , F21S4/10 , F21S9/04 , F21V19/04 , H02N2/183 , H05B37/036 , H05B39/105
摘要： A repair device for fixing a malfunctioning shunt across a failed filament in a light bulb in a group of series-connected miniature decorative bulbs includes a piezoelectric pulse generator producing one or more pulses of a magnitude greater than the standard AC power line voltage. A connector receives the pulses from the pulse generator and supplies them to the group of series-connected miniature decorative bulbs.

54. 发明申请

US20020126113A1 LCD power source control method and contol circuit thereof and image forming apparatus having the control circuit 有权
标题翻译： LCD电源控制方法及其控制电路以及具有该控制电路的图像形成装置
公开(公告)号：US20020126113A1
公开(公告)日：2002-09-12
申请号：US10091501
申请日：2002-03-07
发明人： Kazuya Iwasaki
IPC分类号： G01R031/00 , G09G005/00
CPC分类号： G09G3/36 , G09G2330/02 , G09G2330/04
摘要： Disclosed are an LCD power source control method and a control circuit thereof and an image forming apparatus having the control circuit. When a logic circuit voltage detecting circuit (voltage detecting means) detects a voltage drop of a power source of a power voltage null5V (logic circuit power source), a residual charge of a liquid crystal display (LCD) is forcibly discharged by an LCD power source control circuit (display voltage control means), whereby an LCD drive voltage can be caused to attenuate faster than the fall of the power source of the power voltage null5V (logic circuit power source) of a logic power source of the LCD, that is, a power source unit, therefore the liquid crystal display (LCD) will not be damaged.
摘要翻译：公开了一种LCD电源控制方法及其控制电路，以及具有该控制电路的图像形成装置。当逻辑电路电压检测电路（电压检测装置）检测到电源电压+ 5V（逻辑电路电源）的电源的电压降时，液晶显示器（LCD）的剩余电荷被LCD强制放电电源控制电路（显示电压控制装置），由此可以使LCD驱动电压比LCD的逻辑电源的电源电压+ 5V（逻辑电路电源）的电源的下降更快地衰减，即电源单元，因此液晶显示器（LCD）不会被损坏。

55. 发明申请

US20020091494A1 Debug device 失效
标题翻译：调试设备
公开(公告)号：US20020091494A1
公开(公告)日：2002-07-11
申请号：US10027918
申请日：2001-12-19
发明人： Makoto Kudo
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00
CPC分类号： G06F11/3656 , G06F11/261
摘要： A microcomputer 11 with a debug circuit 11b implemented therein for realizing an on-chip debugging function is mounted on a target board 10 in which a variety of buses 15 are led out and connected to a break board 30. The break board 30 is provided with a break condition storage section 31 and a break signal generation section 32. Break conditions are written in the break condition storage section 31 from the side of a debugger 20 through the debug circuit 11b, the CPU 11a and the various buses 15. Then, a user program stored in a ROM 12 is executed. The break signal generation section 32 monitors signals on the various buses 15, and outputs a break generation signal 30a when the signals on the various buses 15 coincide with the break condition. The execution of the user program is interrupted (stopped) based on the break generation signal 30a.
摘要翻译：在其上设置有用于实现片上调试功能的调试电路11b的微型计算机11安装在目标板10上，其中各种总线15被引出并连接到断路板30.断路板30设置有断开条件存储部分31和断点信号产生部分32.断路条件存储部分31通过调试电路11b，CPU 11a和各种总线15从调试器20一侧写入。然后，a 执行存储在ROM 12中的用户程序。断路信号生成部分32监视各种总线15上的信号，并且当各种总线15上的信号与断路条件一致时，输出中断产生信号30a。基于中断生成信号30a中断（停止）用户程序的执行。

56. 发明申请

US20020050825A1 System and method for deterring operation of a system outside a specified frequency range 有权
标题翻译：系统和方法，用于阻止系统在指定频率范围之外的操作
公开(公告)号：US20020050825A1
公开(公告)日：2002-05-02
申请号：US09504370
申请日：2000-02-15
发明人： David A. Brown
IPC分类号： G01R031/00
CPC分类号： G06F1/28
摘要： A system and method is disclosed for detecting the operation of an electronic device at a frequency that is outside a tested or warranted frequency range. An overvoltage detection device senses an operating voltage. When the sensed voltage exceeds a predetermined voltage level an overvoltage detection signal is generated. The overvoltage detection signal is coupled to an electronic device in which the operating frequency is related to the operating voltage. On receiving the overvoltage detection signal indicating out of warranty operation, the electronic device switches among a number of operating modes to deter the out of warranty operation.
摘要翻译：公开了一种系统和方法，用于检测处于测试或保证的频率范围之外的频率的电子设备的操作。过电压检测装置感测工作电压。当检测到的电压超过预定电压电平时，产生过电压检测信号。过电压检测信号耦合到其中工作频率与工作电压相关的电子设备。电子设备在接收到指示不在保修期内的过电压检测信号时，会切换多种操作模式，以防止超出保修期。

57. 发明申请

US20020035442A1 Hierarchical test circuit structure for chips with multiple circuit blocks 有权
公开(公告)号：US20020035442A1
公开(公告)日：2002-03-21
申请号：US09839602
申请日：2001-04-19
发明人： Bulent Dervisoglu , Laurence H. Cooke
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/318536 , G01R31/318505
摘要： A system and method for testing an integrated circuit having internal circuit blocks. Each of the internal circuit blocks may have its own test circuit block, referred to as a socket access port. The integrated circuit preferably includes a chip access port (e.g., an IEEE standard 1149.1 compliant test access port) connected to a set of boundary-scan cells, and connected in a hierarchical fashion to the lower-level test circuit blocks. Each of the lower-level test control circuit blocks preferably comprises a socket access port controller, and test operation is transferred downward and upwards within said hierarchical structure by communicating from a test control circuit block to the test control circuit block at the immediately higher or immediately lower level in the hierarchical structure. Each of the lower-level test control circuit blocks of the hierarchical test control network may be functionally identical. Further, each of the lower-level test control circuit blocks may be structurally identical. An existing boundary scan may be easily modified for use in the hierarchical structure by adding push instructions to send it to a lower-level test circuit block, and pop instructions to return control to the higher level test circuit block.

58. 发明申请

US20020033702A1 Method and device for remote monitoring of LED lamps 有权
标题翻译：用于远程监控LED灯的方法和装置
公开(公告)号：US20020033702A1
公开(公告)日：2002-03-21
申请号：US09996300
申请日：2001-11-28
申请人： GELCORE, LLC
发明人： Nicolas St-German
IPC分类号： G01R031/00 , G01R031/02 , H01H085/30
CPC分类号： B61L5/1881 , B61L2207/02 , G01R31/00 , G01R31/02 , H05B33/0815 , H05B33/0824 , H05B33/0884
摘要： LED lamp circuitry that emulates an incandescent lamp's behaviour upon remote verification of the LED lamp. The invention presents a fuse blow-out circuit and a cold filament detection circuit permitting the use of LED lamps in applications, such as railway signal light applications, where there is a need for remote monitoring of the lamps, while keeping the advantageous features of lower power consumption and longer life. The invention also provides a control circuit for enabling/disabling the power supply to LED lamps in relation to the level of the line voltage. The advantage of this embodiment is to avoid unwanted functioning of the LED lamp caused by interference from surrounding electrical cables.
摘要翻译： LED灯电路，用于在LED灯的远程验证时模拟白炽灯的行为。本发明提出了一种保险丝吹出电路和冷丝检测电路，其允许在诸如铁路信号灯应用的应用中使用LED灯，其中需要远程监控灯，同时保持较低的有利特征功耗和寿命更长。本发明还提供了一种控制电路，用于相对于线路电压的电平使能/禁用对LED灯的电源。该实施例的优点是避免由于来自周围电缆的干扰引起的LED灯的不期望的功能。

59. 发明申请

US20010029436A1 Semiconductor electrical characteristics evaluation apparatus and semiconductor electrical characteristics evaluation method 审中-公开
标题翻译：半导体电气特性评估装置及半导体电气特性评估方法
公开(公告)号：US20010029436A1
公开(公告)日：2001-10-11
申请号：US09816085
申请日：2001-03-26
申请人： TOCHIGI NIKON CORPORATION, NIKON CORPORATION
发明人： Ryoichi Fukasawa
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01N21/3581 , G01N21/3563 , G01R31/2831 , G01R31/311
摘要： An electrical characteristics evaluation apparatus comprises a terahertz pulse light source that irradiates terahertz pulse light onto a semiconductor material, a light detector that detects pulse light having been transmitted through or having been reflected by the semiconductor material, a measurement device that obtains a spectral transmittance or a spectral reflectance by using a time-series waveform of the electric field intensity of the transmitted pulse light or the reflected pulse light and an arithmetic operation unit that calculates an electrical characteristics parameter of the semiconductor material based upon the spectral transmittance or the spectral reflectance. By adopting this electrical characteristics evaluation apparatus and the corresponding electrical characteristics evaluation method, the electrical material quantities (such as the carrier density, the mobility, the resistivity and the electrical conductivity) of the measurement target, i.e.,the semiconductor material, can be measured and inspected without contaminating or damaging the semiconductor material.
摘要翻译：电特性评估装置包括将太赫兹脉冲光照射到半导体材料上的太赫兹脉冲光源，检测已被透过或被半导体材料反射的脉冲光的光检测器，获得光谱透射率的测量装置或通过使用发射脉冲光或反射脉冲光的电场强度的时间序列波形的光谱反射率和基于光谱透射率或光谱反射率计算半导体材料的电特性参数的算术运算单元。通过采用该电特性评价装置和相应的电特性评价方法，可以测量测量对象（即，半导体材料）的电气材料量（诸如载流子密度，迁移率，电阻率和电导率）并且在不污染或损坏半导体材料的情况下检查。

60. 发明申请

US20010028250A1 Conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus 有权
标题翻译：一种辅助线束和子束制造装置的电导率测试方法
公开(公告)号：US20010028250A1
公开(公告)日：2001-10-11
申请号：US09826363
申请日：2001-04-05
申请人： Yazaki Corporation
发明人： Kazuhiko Takada
IPC分类号： G01R031/00
CPC分类号： G01R31/026 , G01R31/021 , G01R31/045 , Y10T29/49004 , Y10T29/49174 , Y10T29/49181 , Y10T29/5187 , Y10T29/5193 , Y10T29/53209 , Y10T29/53213 , Y10T29/53217 , Y10T29/53226 , Y10T29/53243
摘要： A conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus are provided, which sub-harness manufacturing apparatus includes: a pair of connecting units each having a wire connecting portion, made of metal, vertically movable so as to connect one end of one of wires composing a sub-harness to one of terminals having a sheathing clamping portion and being arranged in a wire feeding direction; and a pair of transferring means to transfer the terminals in a direction perpendicular to the wire feeding direction so as to position each one of the terminals under each wire connecting portions, wherein a clamping punch portion to clamp the sheathing clamping portion is provided on the wire connecting portion of each of the pair of connecting units and a conductivity testing means to judge the one, having terminals on the respective ends thereof, of the wires being good or bad is arranged between the clamping punch portions of the pair of connecting units.
摘要翻译：提供了一种用于子束和子束制造设备的电导率测试方法，该线束制造设备包括：一对连接单元，每个连接单元具有由金属制成的线连接部分，可垂直移动以连接一个将构成子束的一根线的端部连接到具有护套夹持部的端子之一并且布置在送丝方向上; 以及一对传送装置，用于沿垂直于焊丝进给方向的方向传送端子，以便将每个端子定位在每个焊丝连接部分下方，其中夹紧夹套部分的夹紧冲头部分设置在焊丝一对连接单元中的每一个的连接部分和电导率测试装置，用于判断在其两端处具有良好或不良的导线的端子是否在一对连接单元的夹紧冲头部之间。

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