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    • 53. 发明授权
    • Method for reading out symbol information and device for reading out symbol information
    • 用于读出符号信息的方法和用于读出符号信息的装置
    • US07380718B2
    • 2008-06-03
    • US11316546
    • 2005-12-21
    • Hiroshi Nakamura
    • Hiroshi Nakamura
    • G06K7/10
    • G06K7/1456G06K7/14G06K7/1486
    • To provide a method for reading out symbol information and a device for reading out symbol information which are able to prevent a decline in decoding reliability by reducing noise caused by a quantized error, localized contaminations or the like. The method for reading out symbol information may comprise a process in which the image data, obtained by imaging the symbol information such as bar codes and the like, are converted to corrected image data having zero angle of inclination; a smoothing process in which the corrected image data are smoothed; and a column specifying process in which breakpoints of said symbol information column are specified by computing the total sum in the row direction on the smoothed corrected image data.
    • 提供一种读出符号信息的方法和用于读出能够通过减少由量化误差,局部污染等引起的噪声而能够防止解码可靠性下降的符号信息的装置。 用于读出符号信息的方法可以包括将通过对诸如条形码等的符号信息进行成像而获得的图像数据转换为具有零倾角的校正图像数据的处理; 平滑处理,其中校正的图像数据被平滑化; 以及列指定处理,其中通过计算平滑校正图像数据上的行方向上的总和来指定所述符号信息列的断点。
    • 54. 发明授权
    • Sense amplifier circuit in non-volatile semiconductor memory comprising a boosting capacitor for boosting the potential at sense node
    • 非易失性半导体存储器中的感测放大器电路,包括用于升高感测节点处的电位的升压电容器
    • US07379340B2
    • 2008-05-27
    • US11318524
    • 2005-12-28
    • Koji HosonoHiroshi NakamuraKen TakeuchiKenichi Imamiya
    • Koji HosonoHiroshi NakamuraKen TakeuchiKenichi Imamiya
    • G11C11/34G11C16/06
    • G11C16/0483G11C5/145G11C7/1006G11C11/5621G11C11/5628G11C11/5635G11C11/5642G11C16/10G11C16/24G11C16/26G11C16/3445G11C16/3454G11C16/3459G11C2211/5621G11C2211/5641G11C2211/5642G11C2211/5643
    • A non-volatile semiconductor device has a memory cell array having electrically erasable programmable non-volatile memory cells, reprogramming and retrieval circuits that temporarily store data to be programmed in the memory cell array and sense data retrieved from the memory cell array. Each reprogramming and retrieval circuit has first and second latches that are selectively connected to the memory cell array and transfer data. A controller controls the reprogramming and retrieval circuits on a data-reprogramming operation to and a data-retrieval operation from the memory cell array. Each reprogramming and retrieval circuit has a multilevel logical operation mode and a caching operation mode. In the multilevel logical operation mode, re-programming and retrieval of upper and lower bits of two-bit four-level data is performed using the first and the second latches to store the two-bit four-level data in one of the memory cells in a predetermined threshold level range. In the caching operation mode, data transfer between one of the memory cells selected in accordance with a first address and the first latch is performed while data transfer is performed between the second latch and input/output terminals in accordance with a second address with respect to one-bit two-level data to be stored in one of the memory cells.
    • 非易失性半导体器件具有存储单元阵列,其具有电可擦除可编程非易失性存储器单元,重新编程和检索电路,其临时存储要存储在存储单元阵列中的要编程的数据并感测从存储器单元阵列检索的数据。 每个重新编程和检索电路具有选择性地连接到存储单元阵列和传送数据的第一和第二锁存器。 控制器控制数据重新编程操作中的重新编程和检索电路以及来自存储单元阵列的数据检索操作。 每个重新编程和检索电路都具有多级逻辑操作模式和缓存操作模式。 在多级逻辑操作模式中,使用第一和第二锁存器来执行二位四电平数据的高位和低位的重新编程和检索,以将两位四电平数据存储在存储单元之一中 在预定的阈值电平范围内。 在高速缓存操作模式中,根据第一地址选择的存储器单元之一和第一锁存器之间的数据传输是在第二锁存器和输入/输出端子之间根据第二地址相对于 要存储在其中一个存储单元中的一位二电平数据。
    • 56. 发明授权
    • Nonvolatile semiconductor memory
    • 非易失性半导体存储器
    • US07335937B2
    • 2008-02-26
    • US10914422
    • 2004-08-10
    • Hiroshi NakamuraKenichi Imamiya
    • Hiroshi NakamuraKenichi Imamiya
    • H01L29/76
    • H01L27/11526G11C11/5621G11C16/0483G11C16/26H01L27/115H01L27/11529H01L2924/0002H01L2924/00
    • In an EEPROM consisting of a NAND cell in which a plurality of memory cells are connected in series, the control gate voltage Vread of the memory cell in a block selected by the data read operation is made different from the each of the voltages Vsg1, Vsg2 of the select gate of the select transistor in the selected block so as to make it possible to achieve a high speed reading without bringing about the breakdown of the insulating film interposed between the select gate and the channel of the select transistor. The high speed reading can also be made possible in the DINOR cell, the AND cell, NOR cell and the NAND cell having a single memory cell connected thereto, if the control gate voltage of the memory cell is made different from the voltage of the select gate of the select transistor.
    • 在由多个存储单元串联连接的NAND单元组成的EEPROM中,通过数据读取操作选择的块中的存储单元的控制栅极电压V SUB读取不同于 所选块中选择晶体管的选择栅极的电压V SUB,V S s2,...,以使得可以实现高速读取而不带来 关于介于选择栅极和选择晶体管的沟道之间的绝缘膜的击穿。 如果使存储器单元的控制栅极电压与选择的电压不同,则也可以在DINOR单元,AND单元,NOR单元和与其连接的单个存储单元的NAND单元中实现高速读数。 选择晶体管的栅极。