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    • 54. 发明申请
    • ATOMIC FORCE MICROSCOPY APPARATUS AND A METHOD THEREOF
    • 原子力显微镜装置及其方法
    • WO1998008046A1
    • 1998-02-26
    • PCT/GB1997002232
    • 1997-08-19
    • ISIS INNOVATION LIMITEDKOLOSOV, Oleg VictorBRIGGS, George, Andrew, Davidson
    • ISIS INNOVATION LIMITED
    • G01B07/34
    • G01Q60/32
    • The microscopy apparatus comprises a cantilever (10) having an atomically sharp tip (11) and a detector (15) which monitors the deflection of the tip (11) as a measure of the atomic force between the tip and a sample. A piezotransducer (12) is provided on the end of the cantilever (10) distant from the tip (11). The piezotransducer (12) generates high frequency vibrations which are applied to the cantilever. The vibrations transmitted to the tip (11) are modulated using means such as a second piezotransducer (20) in contact with the sample and the movement of the tip (11) is then sampled by the detector (15) at a much lower frequency. The microscopy apparatus and method described is able to maintain sensitivity to the properties of the sample whilst retaining sensitivity to the output of the apparatus. The apparatus and method is particularly suited of the study of time-dependent physico-chemical and physico-mechanical properties up to nanosecond and sub-nanosecond time resolution.
    • 显微镜装置包括具有原子锋利尖端(11)的悬臂(10)和用于监测尖端(11)的偏转的检测器(15),作为尖端和样品之间的原子力的量度。 压电传感器(12)设置在远离尖端(11)的悬臂(10)的端部上。 压电传感器(12)产生施加到悬臂的高频振动。 传递到尖端(11)的振动使用诸如与样品接触的第二压电传感器(20)的装置进行调制,并且尖端(11)的运动然后由检测器(15)以低得多的频率被采样。 所述的显微镜装置和方法能够保持对样品性质的敏感性,同时保持对装置的输出的灵敏度。 该装置和方法特别适用于研究纳秒和亚纳秒时间分辨率下的时间依赖性物理化学和物理机械性能。