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41. 发明公开

EP1831914A2 TARGET DESIGN FOR HIGH-POWER LASER ACCELERATED IONS 审中-公开
标题翻译：目标设计加速高性能激光离子
公开(公告)号：EP1831914A2
公开(公告)日：2007-09-12
申请号：EP05857197.7
申请日：2005-12-22
申请人： FOX CHASE CANCER CENTER
发明人： FOURKAL, Eugene, S. , VELTCHEV, Lavor , MA, Chang, Ming
IPC分类号： H01J49/16 , H01L21/26
CPC分类号： H01J27/24 , G21B1/19 , H01L21/268 , Y02E30/16
摘要： Methods for designing a laser-accelerated ion beam are disclosed. The methods include modeling a system including a heavy ion layer, an electric field, and high energy light positive ions having a maximum light positive ion energy, correlating physical parameters of the heavy ion layer, the electric field, and the maximum light positive ion energy using the model, and varying the parameters of the heavy ion layer to optimize the energy distribution of the high energy light positive ions. One method includes analyzing the acceleration of light positive ions, for example protons, through interaction of a high-power laser pulse with a double-layer target using two-dimensional particle-in-cell (PIC) simulations and a one-dimensional analytical model. The maximum energy acquired by the accelerated light positive ions, e.g., protons, in this model depends on the physical characteristics of the heavy-ion layer-the electron-ion mass ratio and effective charge state of the ions. The hydrodynamic equations for both electron and heavy ion species solved and the test-particle approximation for the protons is applied. It was found that the heavy ion motion modifies the longitudinal electric field distribution, thus changing the acceleration conditions for the light positive ions.

42. 发明申请

WO2013002954A2 WINDOWLESS IONIZATION DEVICE 审中-公开
标题翻译：无窗电离装置
公开(公告)号：WO2013002954A2
公开(公告)日：2013-01-03
申请号：PCT/US2012/040407
申请日：2012-06-01
申请人： AGILENT TECHNOLOGIES, INC. , COOLEY, James, Edward , KOTHARI, Sameer
发明人： COOLEY, James, Edward , KOTHARI, Sameer
CPC分类号： H01J27/24 , H01J49/162
摘要： An ionization device comprises: a plasma source configured to generate a plasma. The plasma comprises light, plasma ions and plasma electrons. The plasma source comprises an aperture disposed such that at least part of the light passes through the aperture and is incident on a gas sample. The ionization device further comprises an ionization region: and a plasma deflection device comprising a plurality of electrodes configured to establish an electric field, wherein the electric field substantially prevents the plasma ions from entering the ionization region.
摘要翻译：电离装置包括：配置成产生等离子体的等离子体源。等离子体包括光，等离子体离子和等离子体电子。等离子体源包括布置成使得至少部分光穿过孔并入射在气体样本上的孔。该电离装置还包括电离区域：以及等离子体偏转装置，该等离子体偏转装置包括被配置为建立电场的多个电极，其中电场基本上防止等离子体离子进入电离区域。

43. 发明申请

WO2012057107A1 レーザ・イオン源审中-公开
标题翻译：激光源
公开(公告)号：WO2012057107A1
公开(公告)日：2012-05-03
申请号：PCT/JP2011/074493
申请日：2011-10-25
申请人：株式会社東芝 , 林和夫 , 角谷晶子 , 長内昭宏 , 佐藤潔和 , 来栖努 , 吉行健
发明人：林　和夫 , 角谷　晶子 , 長内　昭宏 , 佐藤　潔和 , 来栖　努 , 吉行　健
IPC分类号： H01J27/24 , H01J37/08
CPC分类号： H01J37/08 , H01J27/24 , H01J2237/022 , H01J2237/08 , H01J2237/186 , H01J2237/31701
摘要：　レーザ光の照射によりイオンを発生させるレーザ・イオン源であって、真空排気される容器（１１０）と、容器（１１０）内に配置され、レーザ光の照射によりイオンを発生するターゲット（１２１）が収容された照射箱（１２０）と、照射箱（１２０）からイオンを静電的に引き出し、イオンビームとして容器１１０の外部に導くイオンビーム引き出し部（１１２）と、容器（１１０）のイオンビームの取り出し部に設けられ、イオンビーム射出時に開き、射出時以外は閉じるバルブ（１４０）と、バルブ（１４０）と照射箱（１２０）との間に設けられ、イオンビーム射出時に間欠的に開き、射出時以外は閉じるシャッタ（１５０）と、を具備した。これにより、レーザ照射の際に発生する微粒子を容器（１１０）内に閉じ込め、真空排気系やイオン源に接続される後段の装置へ微粒子が流出するのを抑制する。
摘要翻译：提供了一种通过照射激光束产生离子的激光离子源，包括：抽空容器（110）; 位于所述容器（110）内的照明箱（120），并且其中通过用所述激光束照射而发射离子的靶（121）被容纳; 离子束提取单元，其从所述照明箱（120）静电地离开离子，并将作为离子束的离子导出到所述容器（110）外部; 设置在所述容器（110）的离子束提取部分上的阀（140），当所述离子束离开并且否则关闭时，所述阀打开; 以及设置在所述阀（140）和所述照明箱（120）之间的闸门（150），当所述离子束离开并且否则关闭时，所述闸门间歇地打开。激光束照射时发射的微观粒子因此被捕获在容器（110）内，并且所述显微粒子排放到排出组件或连接到离子源的下游装置被减轻。

44. 发明申请

WO2008069110A1 スピン偏極イオンビーム発生装置及びそのスピン偏極イオンビームを用いた散乱分光装置並びに試料加工装置审中-公开
标题翻译：旋转偏振光束发生器，使用旋转偏振光束的散射光谱和样品处理装置
公开(公告)号：WO2008069110A1
公开(公告)日：2008-06-12
申请号：PCT/JP2007/073121
申请日：2007-11-29
申请人：独立行政法人科学技術振興機構 , 鈴木拓 , 山内泰
发明人：鈴木拓 , 山内泰
IPC分类号： H05H1/46 , G01N27/64 , H01J27/24 , H01J37/08 , H01J37/252
CPC分类号： H01J27/24 , G01R33/282 , H01J27/18 , H01J37/08 , H01J2237/0815 , H01J2237/24557 , H01J2237/25
摘要：　スピン偏極イオンビーム発生装置（３０）は、高周波放電管（１５）内のイオンへポンピング光発生部（３３）により準安定原子に対して円偏光と直線偏光とを互いに直角の照射方向から光ポンピング（３３，３４）を照射することで効率良くスピン偏極イオンを発生することができ、例えば、スピン偏極率が１８％を超え２５％に達する高い偏極率をもった偏極ヘリウムイオンビームを発生させることができる。スピン偏極イオンビーム発生装置（３０）は、試料へ偏極したイオンビームを照射することができる加工装置や分析装置にも適用することができる。スピン偏極イオン散乱分光装置によれば、試料の表面２～３原子層程度の深さ領域において、元素と原子層とを同時選別したスピン状態を、測定時間を短縮して従来にはない高精度の測定が可能になる。
摘要翻译：自旋极化离子束发生器（30）通过从相互垂直的施加方向施加由泵浦光产生部分（33）产生的圆形和线性偏振的泵浦光束（34,35），从而高效率地生成自旋极化离子束通过离子化高频放电灯（15）中的亚稳原子产生的离子。例如，发生器（30）可以产生具有18％至25％的高自旋极化率的偏振氦离子束。发生器（30）可以用于可以将极化离子束施加到样本的处理装置或分析器。自旋极化离子散射分析仪可以在短的测量时间内以比常规的精度更高的精度在测量样品的大约两个或三个原子层深度的区域内测量自旋状态，同时区分元素与原子层。

45. 发明申请

WO2007044361A2 LDI/MALDI SOURCE FOR ENHANCED SPATIAL RESOLUTION 审中-公开
标题翻译： LDI / MALDI来源用于增强空间分辨率
公开(公告)号：WO2007044361A2
公开(公告)日：2007-04-19
申请号：PCT/US2006/038701
申请日：2006-10-02
申请人： THERMO FINNIGAN LLC , IZGARIAN, Nicolae
发明人： IZGARIAN, Nicolae
IPC分类号： H01J27/24
CPC分类号： H01J27/24 , H01J49/164
摘要： A MALDI/LDI source is disclosed that includes an ion optical device and beam- focusing optics disposed on opposite sides of a sample support that is at least locally transparent in a region underlying the sample to allow transmission of a radiation beam therethrough. A laser or other radiation source, located adjacent a rear surface of the sample support, emits a beam of radiation that is focused by the beam focusing optics and traverses the transparent region of the sample support to impinge on the sample. Ions produced by irradiation of the sample are collected by an ion optical device located adjacent the front surface of the sample support. By locating the ion optical device and beam-focusing optics on opposite sides of the sample support, short focal length beam-focusing optics may be utilized, thereby facilitating smaller beam spot sizes. This may be particularly useful for mass spectral tissue imaging and other applications where high spatial resolution analysis of a differentiated sample is desirable.
摘要翻译：公开了一种MALDI / LDI源，其包括设置在样品支架的相对侧上的离子光学装置和光束聚焦光学元件，其在样品下方的区域中至少局部透明，以允许辐射束透过。邻近样品支架的后表面定位的激光或其他辐射源发射由光束聚焦光学元件聚焦并穿过样品支架的透明区域以照射在样品上的辐射束。通过照射样品产生的离子通过位于样品支撑体的前表面附近的离子光学装置收集。通过将离子光学器件和光束聚焦光学器件放置在样品支撑体的相对侧上，可以利用短焦距聚焦光学元件，从而有助于较小的束斑尺寸。这对于质谱图组织成像和其它需要分辨的样品的高空间分辨率分析的应用尤其有用。

46. 发明公开

EP3096867A4 RESONANT ENHANCEMENT OF PHOTOIONIZATION OF GASEOUS ATOMS 审中-公开
公开(公告)号：EP3096867A4
公开(公告)日：2017-10-18
申请号：EP15737044
申请日：2015-01-15
申请人： ZEROK NANO TECH CORP
发明人： KNUFFMAN BRENTON J , STEELE ADAM V
IPC分类号： H01J27/24 , G01N27/64 , H01J27/02 , H01J37/08
CPC分类号： H01J27/24 , G01N27/64 , H01J27/022 , H01J37/08 , H01J2237/0815 , H01J2237/31701 , H01J2237/31749
摘要： A system and method for using a high-performance photoionization subsystem are disclosed. Embodiments of the present disclosure employ narrow bandwidth laser radiation to selectively excite ionizing resonant states of gaseous atoms in electric fields. This subsystem and method may be incorporated in an ion source producing ions by photoionizing gaseous atoms; the resultant ions may be employed to efficiently produce an ion beam of high brightness.

47. 发明公开

EP3096867A1 RESONANT ENHANCEMENT OF PHOTOIONIZATION OF GASEOUS ATOMS 审中-公开
标题翻译：谐振提高光离子气态ATOMS
公开(公告)号：EP3096867A1
公开(公告)日：2016-11-30
申请号：EP15737044.6
申请日：2015-01-15
申请人： Zerok Nano Tech Corporation
发明人： KNUFFMAN, Brenton, J. , STEELE, Adam, V.
IPC分类号： B01D59/46 , H01J49/24 , G01N27/64
CPC分类号： H01J27/24 , G01N27/64 , H01J27/022 , H01J37/08 , H01J2237/0815 , H01J2237/31701 , H01J2237/31749
摘要： A system and method for using a high-performance photoionization subsystem are disclosed. Embodiments of the present disclosure employ narrow bandwidth laser radiation to selectively excite ionizing resonant states of gaseous atoms in electric fields. This subsystem and method may be incorporated in an ion source producing ions by photoionizing gaseous atoms; the resultant ions may be employed to efficiently produce an ion beam of high brightness.

48. 发明公开

EP2979336A1 DISPOSITIF LASER HEURISTIQUE METTANT EN OEUVRE UN EQUIPEMENT DE PRODUCTION D'IMPULSIONS LASER, ET PROCEDE HEURISTIQUE CORRESPONDANT 有权
标题翻译：启发式激光器件使用同一设备进行产生激光次及其启发式方法
公开(公告)号：EP2979336A1
公开(公告)日：2016-02-03
申请号：EP14715245.8
申请日：2014-03-27
申请人： Ecole Polytechnique
发明人： MOUROU, Gérard , TAJIMA, Toshiki
IPC分类号： H01S3/067 , H01S3/23 , H01S3/00 , G05B13/04 , G05B15/00 , G05B17/00
CPC分类号： H01S3/0057 , G01N21/17 , H01J27/24 , H01S3/06758 , H01S3/10053 , H01S3/2383
摘要： The invention relates to a laser device (31) including an apparatus for producing amplified laser pulses, using a plurality of amplifying optical fibers and means for grouping the basic amplified pulses into an overall amplified pulse, as well as a target (33), onto which the overall amplified pulse is directed such as to generate a predetermined physical process thereon, which causes a change of state in the target. According to the invention, such a laser device includes: means (35) for measuring at least one distinctive parameter of the generated physical process; means for adjusting at least one characteristic for adjusting the basic amplified laser pulses; and means (36) for analyzing a plurality of measurements for different adjustments, said analyzing means being used many times in loops for different laser pulse adjustment characteristics, enabling an optimization by means of a heuristic method. The invention also relates to said heuristic optimization method implemented by said laser device.
摘要翻译：激光器件包括在制造装置放大的激光脉冲，使用的放大光纤，和组的多个基本放大的脉冲成整体放大的脉冲，以及一个目标，在其上整体放大的脉冲被引导：如，以产生预先确定的物理过程在其上，这会导致状态的目标的变化。激光设备被配置成测量所产生的物理过程中的至少一个独特的参数; 调整用于调整基本放大的激光脉冲的至少一个特性; 并分析了不同的调整测量多数。该设备分析测量多次在不同的激光脉冲特性的调整环路，由启发式方法使得能够优化。这样提供了一种通过激光设备中实现的启发式的优化法。

49. 发明公开

EP2591493A1 LASER-ABLATION ION SOURCE WITH ION FUNNEL 审中-公开
标题翻译：离子源激光消融离子漏斗
公开(公告)号：EP2591493A1
公开(公告)日：2013-05-15
申请号：EP11729576.6
申请日：2011-07-01
申请人： ETH Zurich
发明人： GÜNTHER, Detlef , HATTENDORF, Bodo , DIETIKER, Rolf , EGOROVA, Tatiana , VARENTSOV, Victor
IPC分类号： H01J49/10 , H01J49/16 , H01J49/06
CPC分类号： H01J27/24 , H01J27/024 , H01J49/066 , H01J49/107 , H01J49/164
摘要： A laser-ablation ion source is provided for generating a low energy ion beam having low longitudinal and transverse emittance. The ion source comprises a supersonic nozzle ( 13), followed by an RF ion funnel (23). A laser source (41) generates a laser beam (42) which is focused by a lens (43) to an ablation site (12). The ablation site is located upstream ofthe nozzle, at a distance of less than 10 mm from the nozzle aperture (14). The laser irradiates the ablation site through the nozzle aperture (14) to generate the ions. A specially designed RF-only ion funnel is also disclosed. Two groups of differently oriented elongate electrodes (25, 25') are staggered along a longitudinal axis (L) and supported by symmetrically arranged supporting rods (24a, 24b) and (24a', 24b').

50. 发明公开

EP2302372A1 Method and device for repetitive chemical analysis of a gas flow 审中-公开
标题翻译： Verfahren und Vorrichtung zur wiederholten chemischen分析ees Gasstroms
公开(公告)号：EP2302372A1
公开(公告)日：2011-03-30
申请号：EP09170744.8
申请日：2009-09-18
申请人： Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwelt GmbH
发明人： Zimmermann, Ralf , Bozorgzad, Mohammad Reza Saraji , Eschner, Markus, Simon , Gröger, Thomas maximilian
IPC分类号： G01N30/12 , G01N30/72 , G01N30/46
CPC分类号： G01N30/12 , G01N30/462 , G01N30/463 , G01N30/7206 , G01N2030/122 , G01N2030/3046 , G01N2030/3076 , H01J27/24 , H01J49/162
摘要： The present invention relates to a method for repetitive chemical analysis of a gas flow, wherein said gas flow consists of a carrier gas and gaseous chemical compounds, comprising the following method steps: feeding said gas flow to a gas chromatographic separation column (42) by means of a feeding device (3); collecting at least a part of said gaseous chemical compounds for a defined time period by means of a thermally based collecting device (41) which is coupled to said gas chromatographic separation column (42) and/or said feeding device (3); releasing said collected gaseous chemical compounds in a temporally focused manner by means of said thermally based collecting device (41); separating said released gaseous chemical compounds by means of said gas chromatographic separation column (42); and analyzing said separated gaseous chemical compounds by means of an analyzer (5). The present invention further relates to a device (1) for performing such a method.
摘要翻译：本发明涉及一种用于气流的重复化学分析的方法，其中所述气流由载气和气态化合物组成，包括以下方法步骤：将所述气流通过气相色谱分离柱（42）输送到气相色谱分离柱装置（3）的装置; 通过耦合到所述气相色谱分离柱（42）和/或所述进料装置（3）的热基收集装置（41）收集至少一部分所述气态化合物达一定时间。通过所述热基收集装置（41）以时间聚焦的方式释放所述收集的气态化合物; 通过所述气相色谱分离柱（42）分离所述释放的气态化合物; 并通过分析仪（5）分析所述分离的气态化合物。本发明还涉及一种用于执行这种方法的装置（1）。

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