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    • 43. 发明专利
    • Semiconductor module
    • 半导体模块
    • JP2014053457A
    • 2014-03-20
    • JP2012197105
    • 2012-09-07
    • Toyota Industries Corp株式会社豊田自動織機
    • MASUTANI MUNEHIKOHIGASHIMOTO SHIGEKAZU
    • H01L23/36H01L25/065H01L25/07H01L25/18
    • H01L2224/40H01L2224/40137H01L2224/84801H01L2924/00014H01L2924/1305H01L2924/13055H01L2924/1306H01L2924/13091H01L2924/15787H01L2924/00H01L2224/37099H01L2224/37599H01L2924/00012
    • PROBLEM TO BE SOLVED: To improve cooling efficiency for a semiconductor element.SOLUTION: A semiconductor module 10 has an insulating substrate 11 as an insulating layer. A first wiring metal plate 13 and a metal plate 14 are formed on a top surface of the insulating substrate 11. First semiconductor elements 21 and 22 are bonded onto a top surface of the first wiring metal plate 13, and an output electrode 32 is bonded onto a top surface of the metal plate 14. A second wiring metal plate 25 is bonded onto top surfaces of the first semiconductor elements 21 and 22 and the top surface of the metal plate 14 via solder layers 23 and 24. Second semiconductor elements 26 and 27 are bonded to the second wiring metal plate 25. The solder layer 23 and the first semiconductor elements 21 and 22 form a first heat transmission path for transmitting heat generated by the second semiconductor elements 26 and 27 to the first wiring metal plate 13. The output electrode 32 and the solder layer 24 form a second heat transmission path for transmitting heat generated by the second semiconductor elements 26 and 27 to the metal plate 14.
    • 要解决的问题:提高半导体元件的冷却效率。解决方案:半导体模块10具有作为绝缘层的绝缘基板11。 第一布线金属板13和金属板14形成在绝缘基板11的上表面上。第一半导体元件21和22被接合到第一布线金属板13的顶表面上,并且输出电极32被接合 在金属板14的上表面上。第二配线金属板25通过焊料层23和24接合到第一半导体元件21,22的顶表面和金属板14的顶表面。第二半导体元件26和 27焊接到第二布线金属板25.焊料层23和第一半导体元件21和22形成用于将由第二半导体元件26和27产生的热量传递到第一布线金属板13的第一热传输路径。 输出电极32和焊料层24形成用于将由第二半导体元件26和27产生的热量传递到金属板14的第二传热路径。
    • 44. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2014036558A
    • 2014-02-24
    • JP2012178473
    • 2012-08-10
    • Toyota Industries Corp株式会社豊田自動織機
    • KAMIYA KAZUNOBUHIGASHIMOTO SHIGEKAZUMASUTANI MUNEHIKOTAKEUCHI KAZUYOSHI
    • H02M7/48H01L23/40H01L25/07H01L25/18
    • H01L2924/0002H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device excellent in assemblability of a bus bar for lead-out with a terminal of a first semiconductor module and a terminal of a second semiconductor module which are arranged on a liquid-cooled cooler.SOLUTION: A semiconductor device comprises: semiconductor modules 30, 31, 32, 40, 41, 42 arranged on a top surface and an undersurface of a liquid-cooled cooler 20; a bus bar 50 including a confluence part 53 which converges at a point equidistant from a pair of fastening parts 51, 52 connected to a terminal 70 of a first semiconductor module and terminal 71 of a second semiconductor module extends in a direction apart from the liquid-cooled cooler 20; and a stopper 60 arranged at the fastening parts 51, 52 of the bus bar into which bolts 80, 81 are threaded to fasten the fastening parts 51, 52 and the terminals 70, 71.
    • 要解决的问题:提供一种半导体装置,其具有用于引出的汇流条与第一半导体模块的端子和布置在液冷式冷却器上的第二半导体模块的端子的组装性优异的半导体装置。解决方案:A 半导体器件包括:布置在液冷式冷却器20的顶表面和下表面上的半导体模块30,31,32,40,41,42; 汇流条50包括汇合在与连接到第一半导体模块的端子70的一对紧固部分51,52等距的点处的汇合部分53和第二半导体模块的端子71沿与液体相反的方向延伸 冷却器20; 以及设置在母线的紧固部51,52处的螺栓80,81螺纹连接到紧固部51,52和端子70,71的止动件60。
    • 45. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2013197162A
    • 2013-09-30
    • JP2012060269
    • 2012-03-16
    • Toyota Industries Corp株式会社豊田自動織機
    • MASUTANI MUNEHIKOHIGASHIMOTO SHIGEKAZUTAKEUCHI KAZUYOSHIKAMIYA KAZUNOBU
    • H01L23/48
    • H01L24/33H01L2924/13055H01L2924/13091H01L2924/351H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a highly reliable semiconductor device in which a semiconductor element and a metal plate for an electrode are successfully bonded.SOLUTION: A semiconductor device comprises a filling hole 16 which is formed on an upper electrode 14 and which penetrates in a board thickness direction. The filling hole 16 is formed as a stage structure composed of a first hole part 17 and a second hole part 18 having an opening width wider than that of the first hole part 17. This leads to increase in bulk of the filling hole 16 by the second hole part 18. Accordingly, because a solder amount to be filled in the filling hole 16 varies depending on variation of a distance between a semiconductor element 12 and the upper electrode 14, the semiconductor element 12 and the upper electrode 14 can be credibly bonded.
    • 要解决的问题:提供一种高可靠性的半导体元件和用于电极的金属板成功地结合的半导体器件。解决方案:半导体器件包括填充孔16,其形成在上电极14上并且穿透 板厚度方向。 填充孔16形成为由具有比第一孔部17的开口宽度宽的开口宽度的第一孔部17和第二孔部18构成的平台结构。这导致填充孔16的体积增加 因此,由于要填充在填充孔16中的焊料量根据半导体元件12和上部电极14之间的距离的变化而变化,所以半导体元件12和上部电极14可以可靠地结合 。
    • 48. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2013175682A
    • 2013-09-05
    • JP2012040661
    • 2012-02-27
    • Toyota Industries Corp株式会社豊田自動織機
    • MASUTANI MUNEHIKOHIGASHIMOTO SHIGEKAZU
    • H01L25/07H01L25/18H02M7/48
    • H01L2224/48091H01L2224/49111H01L2224/49175H01L2924/13055H01L2924/13091H01L2924/00014H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device which can easily pull out a signal line.SOLUTION: A semiconductor device comprises: a common electrode block 40 provided so as to be opposite to a first electrode block 30; a transistor chip 80 and a diode chip 81 which are arranged between the first electrode block 30 and the common electrode block 40, and bonded to the first electrode block 30 and the common electrode block 40; a second electrode block 50 provided so as to be opposite to the common electrode block 40; and a transistor chip 90 and a diode chip 91 which are arranged between the common electrode block 40 and the second electrode block 50, and bonded to the common electrode block 40 and the second electrode block 50. The first electrode block 30 and the common electrode block 40 are arranged in an offset manner such that a gate pad 85 of the transistor chip 80 is not opposed to the common electrode block 40.
    • 要解决的问题:提供一种可以容易地拉出信号线的半导体器件。解决方案:一种半导体器件包括:与第一电极块30相对设置的公共电极块40; 布置在第一电极块30和公共电极块40之间并结合到第一电极块30和公共电极块40的晶体管芯片80和二极管芯片81; 设置为与公共电极块40相对的第二电极块50; 以及设置在公共电极块40和第二电极块50之间并结合到公共电极块40和第二电极块50的晶体管芯片90和二极管芯片91.第一电极块30和公共电极 块40以偏移方式布置,使得晶体管芯片80的栅极焊盘85不与公共电极块40相对。
    • 49. 发明专利
    • Connection structure of electrode in electronic component
    • 电子元件电极连接结构
    • JP2012081481A
    • 2012-04-26
    • JP2010227518
    • 2010-10-07
    • Toyota Industries Corp株式会社豊田自動織機
    • KAMIYA KAZUNOBUTAKEUCHI MASAMIHIGASHIMOTO SHIGEKAZUSATO HARUMITSUISHIZAKI TAKUYAMASUTANI MUNEHIKO
    • B23K1/14B23K1/00B23K101/40H01L21/60H01L23/48
    • H01L24/33H01L2924/13055H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a connection structure of an electrode in an electronic component, which does not need to maintain the clearance between an upper electrode and a joined member to a clearance in which a capillary phenomenon occurs and which is capable of enhancing the joint strength of the joined member with the upper electrode.SOLUTION: The electrode connection structure in the electronic component includes: a base 11 with planate upper face; a semiconductor element 12 with planate surface as the joined member, provided with the first and second electrodes 13 and 14; an upper platy electrode 15 spacing from the semiconductor element 12; and a solder joining the element 12 and the upper electrode 15. The side faces 15C to 15E of the upper electrode 15 are formed with an inclined plane extending outside from a lower face 15B toward an upper face 15A. The lower face 15B of the upper electrode 15 is arranged parallel to the second electrode 14 of the semiconductor element 12, and the side faces 15C to 15E are arranged facing the second electrode 14.
    • 要解决的问题:为了提供电子部件中的电极的连接结构,其不需要将上部电极和接合部件之间的间隙保持为发生毛细管现象的间隙,并且能够 提高接合部件与上部电极的接合强度。 解决方案:电子部件中的电极连接结构包括:具有平面上表面的基部11; 设置有第一电极13和第二电极14的半导体元件12,其具有作为连接构件的平面表面; 与半导体元件12间隔开的上板状电极15; 以及焊接元件12和上电极15的焊料。上电极15的侧面15C〜15E形成有从下表面15B向上表面15A延伸的倾斜面。 上电极15的下表面15B平行于半导体元件12的第二电极14设置,并且侧面15C至15E被布置成面对第二电极14.版权所有(C)2012,JPO&INPIT