会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 41. 发明申请
    • Method for Changing Frequency and Base Station in Radio Optical Fusion Communication System
    • 无线光融合通信系统中频率和基站的改变方法
    • US20070206957A1
    • 2007-09-06
    • US10590518
    • 2005-02-21
    • Yozo ShojiHiroyo OgawaYoshihiro Hashimoto
    • Yozo ShojiHiroyo OgawaYoshihiro Hashimoto
    • H04B10/04H04B10/06H04Q7/20
    • G02F1/2255G02F2/002H04B10/25758
    • In a radio optical fusion communication system with the integration of an optical fiber transmission path and a radio propagation path, wherein by first and second light sources, an intermediate-frequency signal generating means for generating a modulating signal at an intermediate frequency band, a modulator for modulating an optical signal from the first light source into an SSB modulated optical signal using the intermediate-frequency signal, and an optical mixer for mixing the modulated optical signal with the optical signal from the second light source to obtain an optical transmission signal in a base station, the frequency of either of the optical signals is controlled such that the difference in frequency between the optical signals is a desired frequency of a modulated radio signal, thus switching the frequency channel of the modulated radio signal in the radio propagation path.
    • 在具有光纤传输路径和无线电传播路径的集成的无线光学融合通信系统中,其中,通过第一和第二光源,产生用于产生中频带的调制信号的中频信号发生装置,调制器 用于使用中频信号将来自第一光源的光信号调制成SSB调制光信号;以及光混合器,用于将调制光信号与来自第二光源的光信号混合,以获得光传输信号 控制光信号的频率,使得光信号之间的频率差是调制无线信号的期望频率,从而在无线传播路径中切换调制无线信号的频道。
    • 42. 发明授权
    • Particle monitoring device and processing apparatus including same
    • 粒子监测装置及包括其的处理装置
    • US07170602B2
    • 2007-01-30
    • US11082652
    • 2005-03-18
    • Susumu SaitoYoshihiro Hashimoto
    • Susumu SaitoYoshihiro Hashimoto
    • G01N15/02
    • G01N15/0211G01N15/1456G01N21/94G01N2015/025G01N2015/1493
    • A particle monitoring device includes a light source for emitting a measurement light; and a light projecting/receiving unit, connected to a depressurized vessel of a processing apparatus, for projecting the emitted measurement light into the depressurized vessel and receiving a scattered light from a particle floating in the depressurized vessel. The light projecting/receiving unit is disposed such that the scattered light is received substantially parallel to the measurement light. The particle monitoring device further includes a received light intensity detection unit. The received light intensity detection unit has a received light intensity detection unit for determining whether or not the detected intensity is greater than a predetermined value and an instruction unit for instructing the processing apparatus to start, continue or stop a processing operation of the processing apparatus depending on the determined result.
    • 粒子监测装置包括用于发射测量光的光源; 以及与处理装置的减压容器连接的光投射/接收单元,用于将发射的测量光投射到减压容器中并接收来自浮动在减压容器中的颗粒的散射光。 光投射/接收单元被布置成使得散射光基本上平行于测量光被接收。 粒子监测装置还包括接收光强检测单元。 所接收的光强度检测单元具有用于确定检测强度是否大于预定值的接收光强度检测单元和用于指示处理设备启动,继续或停止处理设备的处理操作的指令单元依赖 对确定的结果。
    • 45. 发明授权
    • IC testing method and IC testing device using the same
    • IC测试方法和IC测试装置使用相同
    • US06404220B1
    • 2002-06-11
    • US09319898
    • 1999-06-14
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G01R3126
    • G01R31/31917G01R31/3004
    • In an IC testing apparatus which executes a function test and a DC test, a resistor having a high resistance is connected to the output side of a DC tester such that the connection of the resistor allows a function test to operate normally if the DC tester is left connected to the function tester, thus allowing the DC test to be interrupted into the execution of the function test to enable a concurrent execution of the function test and the DC test. As a result, the time required to change switches in the DC tester, for example, can be executed during the function test, thus preventing the time interval required to change the switches from increasing the time interval required for the test, thereby reducing the testing time interval.
    • 在执行功能测试和DC测试的IC测试装置中,具有高电阻的电阻器连接到直流测试仪的输出侧,使得如果直流测试仪是直流测试仪,电阻器的连接允许功能测试正常工作 左连接到功能测试仪,从而允许直流测试中断功能测试的执行,以实现功能测试和直流测试的并发执行。 因此,可以在功能测试期间执行在DC测试器中更换开关所需的时间,从而防止从增加测试所需的时间间隔改变开关所需的时间间隔,从而减少测试 时间间隔。
    • 47. 发明授权
    • Active matrix display device
    • 主动矩阵显示装置
    • US5708485A
    • 1998-01-13
    • US617299
    • 1996-03-18
    • Takusei SatoYoshihiro HashimotoKazuyoshi YoshidaShingo MakimuraMakoto Takatoku
    • Takusei SatoYoshihiro HashimotoKazuyoshi YoshidaShingo MakimuraMakoto Takatoku
    • G02F1/136G02F1/1362G02F1/1368G09F9/30H01L21/336H01L29/786G02F1/1343G02F1/1333
    • G02F1/136209
    • To give an electric shield function and an electric contact function to a light shielding film formed on a drive substrate. An active matrix display device includes a drive substrate 1 having pixels 4, an opposed substrate 2 having an opposed electrode 5, and a liquid crystal 3 held in a space defined between the drive substrate 1 and the opposed substrate 2. An upper layer portion of the drive substrate 1 includes pixel electrodes 6 formed individually for the pixels 4. A lower layer portion of the drive substrate 1 includes thin-film transistors 7 for individually driving the pixel electrodes 6, scanning lines 8, and signal lines 9. A light shielding film having conductivity is interposed between the upper layer portion and the lower layer portion, and is divided into mask shielding films 16M and pad shielding films 16P. Each mask shielding film 16M is continuously patterned along each row of the pixels 4 to partially shield at least the corresponding thin-film transistor 7. Each mask shielding film 16M is insulated from both the upper layer portion and the lower layer portion, and is maintained at a fixed potential. The pad shielding films 16P are discretely patterned for the individual pixels 4, and each pad shielding film 16P is located at a contact portion C between the corresponding pixel electrode 6 and the corresponding thin-film transistor 7 to provide electrical connection therebetween and light shielding.
    • 为了对形成在驱动基板上的遮光膜赋予电屏蔽功能和电接触功能。 有源矩阵显示装置包括具有像素4的驱动基板1,具有相对电极5的相对基板2和保持在驱动基板1和相对基板2之间的空间中的液晶3。 驱动基板1包括为像素4分别形成的像素电极6.驱动基板1的下层部分包括用于单独驱动像素电极6,扫描线8和信号线9的薄膜晶体管7.遮光 具有导电性的膜插入在上层部分和下层部分之间,并被分成掩模屏蔽膜16M和焊盘屏蔽膜16P。 每个掩模屏蔽膜16M沿着像素4的每一行连续地图案化,以至少部分地屏蔽相应的薄膜晶体管7.每个掩模屏蔽膜16M与上层部分和下层部分都被绝缘,并被保持 处于固定的潜力。 衬垫屏蔽膜16P对于各个像素4离散地图案化,并且每个衬垫屏蔽膜16P位于相应的像素电极6和相应的薄膜晶体管7之间的接触部分C处,以提供其间的电连接和遮光。