会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 41. 发明授权
    • Semiconductor memory integrated circuit employing a redundant circuit system for compensating for defectiveness
    • 采用冗余电路系统补偿缺陷的半导体存储器集成电路
    • US06490210B2
    • 2002-12-03
    • US09867796
    • 2001-05-31
    • Satoru TakaseTakeshi Nagai
    • Satoru TakaseTakeshi Nagai
    • G11C700
    • G11C29/14G11C11/401G11C29/50
    • A semiconductor memory integrated circuit is provided, which is capable of simultaneously applying voltage stress to normal signal lines and spare signal lines, thereby reducing the time required for performing a test. The semiconductor memory integrated circuit includes a memory cell array having a plurality of normal signal lines for selecting a memory cell, a redundant cell array including three or more of odd number of spare signal lines for compensating for defectiveness in the memory cell array, a decoder for decoding an address signal to select a normal signal line, a spare decoder, which is activated when a defective address signal is inputted, for decoding the defective address signal to select a spare signal line, and a test control circuit for controlling the decoder and the spare decoder to perform a test of applying voltage between adjacent signal lines in the normal signal lines and the spare signal lines. The test control circuit sets electric potential levels in a signal line group including the normal signal lines and the spare signal lines so that at the time of a test, electric potential levels of adjacent signal lines are opposite to each other.
    • 提供一种半导体存储器集成电路,其能够同时向正常信号线和备用信号线施加电压应力,从而减少进行测试所需的时间。 半导体存储器集成电路包括具有用于选择存储单元的多条正常信号线的存储单元阵列,包括用于补偿存储单元阵列中的缺陷的奇数个备用信号线的三个或更多个的冗余单元阵列,解码器 用于解码地址信号以选择正常信号线;当输入缺陷地址信号时激活的备用解码器,用于解码缺陷地址信号以选择备用信号线;以及测试控制电路,用于控制解码器和 备用解码器执行在正常信号线和备用信号线之间的相邻信号线之间施加电压的测试。 测试控制电路设置包括正常信号线和备用信号线的信号线组中的电位电平,使得在测试时,相邻信号线的电位电平彼此相反。
    • 42. 发明授权
    • Redundancy circuit of semiconductor memory
    • 半导体存储器的冗余电路
    • US06392937B2
    • 2002-05-21
    • US09861843
    • 2001-05-22
    • Takeshi Nagai
    • Takeshi Nagai
    • G11C700
    • G11C29/808G11C29/812
    • A semiconductor has eight banks that can be accessed simultaneously. Within each bank, there are disposed two fixed spare row decoders and two mapping spare row decoders. Within each bank, two fixed fuse sets are provided corresponding to the fixed spare row decoders. Eight mapping fuse sets are provided at the outside of each bank, for example, with no association with the mapping spare row decoders. Each mapping fuse set stores mapping data for determining a correspondence of the mapping fuse set to a specific mapping spare row decoder within a specific bank.
    • 半导体具有可以同时访问的八个存储体。 在每个银行内,都有两个固定的备用行解码器和两个映射备用行解码器。 在每个存储体内,相应于固定的备用排解码器​​提供两个固定熔丝组。 例如,在每个存储体的外部提供八个映射熔丝组,与映射备用行解码器没有关联。 每个映射熔丝组存储用于确定映射熔丝组与特定存储体内的特定映射备用行解码器的对应关系的映射数据。
    • 49. 发明授权
    • Testing apparatus for electrical characteristics of sheet-like
insulating materials
    • 板状绝缘材料的电气特性试验装置
    • US4583040A
    • 1986-04-15
    • US594625
    • 1984-03-22
    • Ryosuke HataMasayuki HiroseTakeshi NagaiKunitomo KatoKenjiro Osaki
    • Ryosuke HataMasayuki HiroseTakeshi NagaiKunitomo KatoKenjiro Osaki
    • G01R31/12G01R31/16G01R31/18H01B17/56
    • G01R31/1263G01R31/16
    • A testing chamber for electrically testing a sample of insulating material or materials in sheet form, under controllable conditions of pressure and temperature. The pressure resistant chamber is air and liquid tight to permit testing of oil impregnated samples unexposed to harmful air. A frame is positioned within the chamber. A supply reel storing a test sample of insulating material or materials and a takeup reel for receiving the test sample drawn from the supply reel are both rotatably mounted on the frame. The supply and takeup reels are separated from each other to form a testing station therebetween. A shaft with a handle is attached to the takeup reel and extends out of the chamber to facilitate rotation of the takeup reel whereby the test sample may be removed from the supply reel to the testing station and then to the takeup reel. First and second electrodes are connected, respectively, to the high and low voltage terminals of a power supply. Position and pressure producing means are operatively connected to at least one of the electrodes to control the spacing between the electrodes and the pressure applied to the test sample by the electrodes.
    • 用于在可控制的压力和温度条件下电绝缘材料样品或片状材料的试验室。 耐压室是空气和液体密封的,以允许对暴露于有害空气的油浸样品进行测试。 框架位于室内。 存储绝缘材料或材料的测试样品的供应卷轴和用于接收从供带盘抽出的测试样品的卷取卷轴都可旋转地安装在框架上。 供应卷取卷轴彼此分离以在它们之间形成测试台。 具有把手的轴连接到收紧卷轴并延伸出室以便于卷取卷轴的旋转,从而测试样品可以从供应卷轴移除到测试站,然后到卷绕卷轴。 第一和第二电极分别连接到电源的高低压端子。 位置和压力​​产生装置可操作地连接到至少一个电极以控制电极之间的间隔和通过电极施加到测试样品的压力。