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    • 48. 发明申请
    • FORMATION OF AIR GAP WITH PROTECTION OF METAL LINES
    • 形成有保护金属线的空气隙
    • US20110193230A1
    • 2011-08-11
    • US12700792
    • 2010-02-05
    • Takeshi NogamiShyng-Tsong ChenDavid V. HorakSon V. NguyenShom PonothChih-Chao Yang
    • Takeshi NogamiShyng-Tsong ChenDavid V. HorakSon V. NguyenShom PonothChih-Chao Yang
    • H01L23/532H01L21/768
    • H01L24/80H01L21/0337H01L21/31144H01L21/7682H01L23/5222H01L23/5329H01L23/53295
    • A method is provided for fabricating a microelectronic element having an air gap in a dielectric layer thereof. A dielectric cap layer can be formed which has a first portion overlying surfaces of metal lines, the first portion extending a first height above a height of a surface of the dielectric layer and a second portion overlying the dielectric layer surface and extending a second height above the height of the surface of the dielectric layer, the second height being greater than the first height. After forming the cap layer, a mask can be formed over the cap layer. The mask can have a multiplicity of randomly disposed holes. Each hole may expose a surface of only the second portion of the cap layer which has the greater height. The mask may fully cover a surface of the first portion of the cap layer having the lower height. Subsequently, an etchant can be directed towards the first and second portions of the cap layer to form holes in the cap layer aligned with the holes in the mask. Material can be removed from the dielectric layer where exposed to the etchant by the holes in the cap layer. At such time, the mask can protect the first portion of the cap layer and the metal lines from being attacked by the etchant.
    • 提供了一种用于制造其电介质层中具有气隙的微电子元件的方法。 可以形成介电盖层,其具有覆盖金属线表面的第一部分,第一部分在电介质层的表面的高度之上延伸第一高度,以及覆盖介电层表面的第二部分,并且延伸第二高度 电介质层的表面的高度,第二高度大于第一高度。 在形成盖层之后,可以在盖层之上形成掩模。 掩模可以具有多个随机布置的孔。 每个孔可以暴露仅具有较大高度的盖层的第二部分的表面。 掩模可以完全覆盖具有较低高度的盖层的第一部分的表面。 随后,可以将蚀刻剂引导到盖层的第一和第二部分,以在盖层中形成与掩模中的孔对准的孔。 可以通过盖层中的孔从暴露于蚀刻剂的介电层去除材料。 此时,掩模可以保护盖层的第一部分和金属线不被蚀刻剂侵蚀。