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    • 41. 发明申请
    • Configurable prober for TFT LCD array test
    • 可配置探针用于TFT LCD阵列测试
    • US20050179452A1
    • 2005-08-18
    • US10903216
    • 2004-07-30
    • Matthias BrunnerShinichi KuritaRalf SchmidFayez AbboudBenjamin JohnstonPaul BocianEmanuel Beer
    • Matthias BrunnerShinichi KuritaRalf SchmidFayez AbboudBenjamin JohnstonPaul BocianEmanuel Beer
    • G01R31/302G01R31/26G01R31/305G02F1/13G09G3/00H01L21/687
    • G01R1/07364G01R31/2893G01R31/305G09G3/006
    • An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection mechanism that allows for ready relocation of the prober bar to the frame at selected points along the frame, and a plurality of electrical contact pins along the prober bar for placing selected electronic devices in electrical communication with a system controller during testing. In one embodiment, the prober is be used to test devices such as thin film transistors on a glass substrate. Typically, the glass substrate is square, and the frame is also square. In this way, “x” and “y” axes are defined by the frame. The electrical pins may be movable along the axial length of the prober bars, or may be selectively pushed down to contact selected contact pads on the substrate.
    • 提供了一种用于电子设备测试系统的改进的探测器。 探测器是“可配置的”,这意味着它可以适用于不同的设备布局和基板尺寸。 探测器通常包括框架,至少一个具有第一端和第二端的探测杆,框架连接机构,其允许在沿着框架的选定点准备将探测杆重新定位到框架,以及多个电触点 沿着探测杆的引脚,用于在测试期间将选定的电子设备与系统控制器电连通。 在一个实施例中,探测器用于测试诸如玻璃基板上的薄膜晶体管的器件。 通常,玻璃基板是正方形的,框架也是正方形的。 以这种方式,“x”和“y”轴由框架定义。 电引脚可以沿着探针杆的轴向长度移动,或者可以选择性地向下推动以接触衬底上的所选择的接触垫。
    • 45. 发明授权
    • Magnetooptic recording method and apparatus
    • 磁光记录方法和装置
    • US5600612A
    • 1997-02-04
    • US331578
    • 1994-11-01
    • Jun SaitoShinichi KuritaYoshihiro YamanakaKazutomo Miyata
    • Jun SaitoShinichi KuritaYoshihiro YamanakaKazutomo Miyata
    • G11B11/105G11B20/12G11B11/10G11B7/00
    • G11B11/1053G11B11/10506G11B11/10595G11B11/10584G11B20/1258
    • In magnetooptic recording, compensation is provided for changes in temperature up and down characteristics for heating and cooling processes of a recording medium due to the rise and fall of a laser beam effected in dependence on the relative velocity of the laser beam and the recording medium. The advantages of the Z-CAV system, i.e., a high density recording and an enhanced access performance are realized and the reliability for performing a high density recording is also improved in the case of the CAV system. The relation between the relative velocity of the laser beam and the medium or the linear velocity of the medium and the thermal time constant of the medium is clarified and the thermal time constant .tau. at the current linear velocity is obtained. Information to be recorded is converted into binary signals and the laser beam intensity modulated in accordance with the binary signals is projected on the mangetooptic recording medium thereby recording the information. Thermal time constant information relating to the temperature variations of the magnetooptic recording medium due to the projection of the laser beam is preliminarily recorded on the magnetooptic recording medium. A clock frequency f is controlled in such a manner that a ratio T/.tau. between a reciprocal T of the clock frequency f and the thermal time constant .tau. of the medium is always maintained constant. The starting and end positions of each mark are formed with a high degree of accuracy.
    • PCT No.PCT / JP94 / 00411 Sec。 371日期:1994年11月1日 102(e)1994年11月1日PCT 1994年3月15日PCT公布。 公开号WO94 / 22139 日期1994年9月29日在磁光记录中,由于根据激光束的相对速度而激发的激光束的上升和下降,对记录介质的加热和冷却过程的温度上升和下降特性的变化提供补偿 和记录介质。 实现了Z-CAV系统的优点,即高密度记录和增强的访问性能,并且在CAV系统的情况下,还提高了执行高密度记录的可靠性。 激光束与介质的相对速度或介质的线速度和介质的热时间常数之间的关系得到澄清,并获得当前线速度下的热时间常数τ。 要记录的信息被转换为二进制信号,并且根据二进制信号调制的激光束强度被投影在管理记录介质上,从而记录信息。 与激光束的投射有关的光磁记录介质的温度变化的热时间常数信息被预先记录在磁光记录介质上。 控制时钟频率f,使得时钟频率f的倒数T与介质的热时间常数τ之间的比率T /τ始终保持恒定。 每个标记的开始和结束位置都以高精度形成。
    • 50. 发明申请
    • MASK MANAGEMENT SYSTEM AND METHOD FOR OLED ENCAPSULATION
    • 用于OLED封装的掩模管理系统和方法
    • US20140170785A1
    • 2014-06-19
    • US14126211
    • 2012-06-18
    • Shinichi KuritaBeom Soo Kim
    • Shinichi KuritaBeom Soo Kim
    • H01L51/56
    • H01L51/56C23C16/042
    • A system and method for encapsulating an organic light-emitting diode (OLED) device by enabling a substrate and a plurality of masks to be efficiently received into a vacuum processing environment, transferred between one or more process chambers for the deposition of encapsulating layers, and removed from the processing system. A method of encapsulating an organic light-emitting diode (OLED) device includes positioning one or more masks over a substrate to deposit encapsulating layers on an OLED device disposed on the substrate. A processing system for encapsulating an organic light-emitting diode (OLED) device includes one or more transfer chambers, one or more load lock chambers coupled to each transfer chamber and operable to receive a mask into a vacuum environment, and one or more process chambers coupled to each transfer chamber and operable to deposit an encapsulating layer on a substrate.
    • 一种用于封装有机发光二极管(OLED)器件的系统和方法,其通过使衬底和多个掩模能够被有效地接收到真空处理环境中,在一个或多个用于沉积封装层的处理室之间传送的真空处理环境中,以及 从处理系统中删除。 封装有机发光二极管(OLED)器件的方法包括将一个或多个掩模定位在衬底上以将封装层沉积在设置在衬底上的OLED器件上。 用于封装有机发光二极管(OLED)器件的处理系统包括一个或多个传送室,耦合到每个传送室的一个或多个负载锁定室,并可操作以将掩模接收到真空环境中,以及一个或多个处理室 耦合到每个传送室并可操作以将封装层沉积在衬底上。