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    • 49. 发明专利
    • Multiple wavelength spectroscope device
    • 多波长光谱仪器
    • JPS58178227A
    • 1983-10-19
    • JP6101382
    • 1982-04-14
    • Hitachi Ltd
    • SONOBE SHIGERUKATOU IWAOWATANABE MAKOTO
    • G01J3/36G01J3/20G01J3/28G01N21/27
    • G01J3/20G01J3/0262G01J3/2803
    • PURPOSE:To enhance light measuring accuracy by a simple improvement, by providing a light shielding plate, which shields the straight input of dispersed light, for at least one light receiving element in an image forming region of the dispersed light, detecting the amount of stray light, and correcting the amount of the stray light with respect to the measured values of the light from other light emitting elements. CONSTITUTION:The light, which is inputted to an incident slit 1 from a light source, is dispersed on a photodiode array 4 and an image is formed. The photodiode array 4 is arranged on a Rowland circle, and the light is dispersed sequentially from a short wavelength side between l0 and ln. When diffracted light in the range of l1-ln is inputted to the photodiode array 4, the light is reflected and scattered on the surface of each of photodiodes 61-6n. The light is further reflected by a light receiving window 7 and inputted again. At this time, the scattered and astrayed light is distributed to the photodiode 60 on the short wavelength side, and the largest effect is received. Since the direct propgressing light is not inputted to the photodiode 60, only the astray light is detected. The same amount of the astray light is inputted to the neighboring photodiode 6a. When the detected astray signal of the photodiode 60 is subtracted from the detected signal of the photodiode 6a, the effect of the astray light of the photodiode 6a is mostly eliminated.
    • 目的:为了通过简单的改进来提高光测量精度,通过设置遮蔽分散光的直线输入的遮光板,对于分散光的图像形成区域中的至少一个光接收元件,检测杂散量 并且相对于来自其它发光元件的光的测量值来校正杂散光的量。 构成:从光源输入到入射狭缝1的光分散在光电二极管阵列4上,形成图像。 光电二极管阵列4布置在Rowland圆上,并且光从10和ln之间的短波长方向依次分散。 当在l1-ln范围内的衍射光被输入到光电二极管阵列4时,光在每个光电二极管61-6n的表面上被反射和散射。 光被光接收窗7进一步反射并再次输入。 此时,散射的和迷路的光被分散到短波长侧的光电二极管60,并且接收到最大的效果。 由于直接投射光不被输入到光电二极管60,所以仅检测到微波发光。 相同量的微斯光被输入到相邻光电二极管6a。 当从光电二极管6a的检测信号中减去光电二极管60的检测误差信号时,大部分消除了光电二极管6a的微波光的影响。