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    • 42. 发明授权
    • EUV light source collector erosion mitigation
    • EUV光源收集器侵蚀减轻
    • US07180083B2
    • 2007-02-20
    • US11238828
    • 2005-09-28
    • William N. PartloAlexander I. ErshovIgor V. Fomenkov
    • William N. PartloAlexander I. ErshovIgor V. Fomenkov
    • A61N5/06G01J3/10H05G2/00
    • G03F7/70916B82Y10/00G01J1/429G03F7/70033G03F7/70175G03F7/70983G21K1/062G21K2201/067H05G2/003
    • An EUV light source collector erosion mitigation system and method is disclosed which may comprise a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma; a replacement material generator positioned to deliver replacement material comprising the capping material to the collector outer surface at a rate sufficient to replace the capping material removed due to the removing interaction. The replacement material generator may comprise a plurality of replacement material generators positioned to respectively deliver replacement material to a selected portion of the collector outer surface, which may comprise a sputtering mechanism sputtering replacement capping material onto the collector outer surface.
    • 公开了一种EUV光源收集器侵蚀缓解系统和方法,其可以包括收集器,其包括多层反射镜收集器,该多层反射镜收集器包括由封装材料构成的收集器外表面,该封盖材料由于与EUV发光等离子体中产生的材料的去除相互作用而被去除 ; 替代材料发生器定位成将包含封盖材料的替换材料以足以代替由于去除相互作用而去除的封盖材料的速率传送到收集器外表面。 替代材料发生器可以包括多个替换材料发生器,其被定位成分别将替代材料递送到集电器外表面的选定部分,其可以包括溅射机构将溅射替换封盖材料涂覆到集电器外表面上。
    • 44. 发明授权
    • EUV light source collector erosion mitigation
    • EUV光源收集器侵蚀减轻
    • US07141806B1
    • 2006-11-28
    • US11237649
    • 2005-09-27
    • William N. PartloAlexander I. ErshovIgor V. FomenkovDavid W. MyersWilliam Oldham
    • William N. PartloAlexander I. ErshovIgor V. FomenkovDavid W. MyersWilliam Oldham
    • G01J1/00
    • G21K1/062B82Y10/00H05G2/003H05G2/005
    • An EUV light source collector erosion mitigation method and apparatus for a collector comprising a multilayered mirror collector comprising a collector outer surface composed of a capping material subject to removal due to a removing interaction with materials created in an EUV light-creating plasma, is disclosed which may comprise including within an EUV plasma source material a replacement material. The replacement material may comprise the same material as the capping material of the multilayered mirror. The replacement material may comprise a material that is essentially transparent to light in a selected band of EUV light, e.g., a spectrum of EUV light generated in a plasma of a plasma source material. The replacement material may comprise a material not susceptible to being etched by an etching material used to remove deposited plasma source material from the collector, e.g., a halogen etchant.
    • 公开了一种用于收集器的EUV光源收集器侵蚀缓解方法和装置,其包括多层反射镜收集器,其包括由由与在EUV发光等离子体中产生的材料的去除相互作用而被去除的封盖材料组成的收集器外表面。 可以包括在EUV等离子体源材料内包括替换材料。 替代材料可以包括与多层反射镜的封盖材料相同的材料。 替代材料可以包括对EUV光的选定频带中的光基本上透明的材料,例如在等离子体源材料的等离子体中产生的EUV光的光谱。 替代材料可以包括不易被蚀刻材料蚀刻的材料,用于从集电体例如卤素蚀刻剂去除沉积的等离子体源材料。
    • 48. 发明授权
    • High resolution etalon-grating monochromator
    • 高分辨率标准光栅单色仪
    • US06480275B2
    • 2002-11-12
    • US09772293
    • 2001-01-29
    • Richard L. SandstromAlexander I. ErshovWilliam N. PartloIgor V. FomenkovScott T. Smith
    • Richard L. SandstromAlexander I. ErshovWilliam N. PartloIgor V. FomenkovScott T. Smith
    • G01J318
    • G01J3/12G01J1/4257G01J3/22G01J3/26G01J9/02
    • A high resolution etalon-grating monochromator. A preferred embodiment presents an extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser and the diffused light exiting the diffuser illuminates an etalon. A portion of its light exiting the etalon is collected and directed into a slit positioned at a fringe pattern of the etalon. Light passing through the slit is collimated and the collimated light illuminates a grating positioned in an approximately Littrow configuration which disburses the light according to wavelength. A portion of the dispursed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit and monitored by a light detector. When the etalon and the grating are tuned to the same precise wavelength a slit function is defined which is extremely narrow such as about 0.034 pm (FWHM) and about 0.091 pm (95 percent integral). The bandwidth of a laser beam can be measured very accurately by a directing portion of the laser beam into the monochromator and scanning the laser wavelength over a range which includes the monochromator slit wavelength.
    • 高分辨率标准光栅单色仪。 优选的实施例在紫外范围内呈现非常狭窄的狭缝功能,并且对于测量用于集成电路光刻的窄带准分子激光器的带宽是非常有用的。 来自激光的光被聚焦成漫射器,并且离开扩散器的漫射光照射标准具。 将其从标准具出射的光的一部分收集并引导到位于标准具的边缘图案处的狭缝中。 通过狭缝的光线被准直,并且准直光照射位于大约Littrow配置中的光栅,其根据波长散发光。 表示对应于所选择的标准具条纹的波长的调度光​​的一部分通过第二狭缝并由光检测器监视。 当标准具和光栅调谐到相同的精确波长时,定义狭缝功能,其极窄,例如约0.034μm(FWHM)和约0.091μm(95%积分)。 激光束的带宽可以通过激光束的引导部分进入单色仪并且在包括单色器狭缝波长的范围内扫描激光波长而被非常精确地测量。