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31. 发明申请

US20040124852A1 Propagation delay time measuring method and testing apparatus 失效
标题翻译：传播延迟时间测量方法和测试仪器
公开(公告)号：US20040124852A1
公开(公告)日：2004-07-01
申请号：US10646352
申请日：2003-08-22
发明人： Koichi Higashide , Yukio Ishigaki , Satoko Higashide
IPC分类号： G01R027/28
CPC分类号： G01R31/319 , G01R31/31725 , G01R31/31937
摘要： A propagation delay time measuring method of measuring a propagation delay time of a test signal propagating along one of a first signal path and a second signal path serially connecting to the first signal path through which a semiconductor testing apparatus includes a driver and a comparator electrically connected to a device under test, the method includes: a first connecting step of connecting an end of the first path to the driver and the comparator; a first output step of outputting a test signal from the driver to the first path; a first reflect signal receiving step of receiving a test signal at the comparator, defined as a first reflect signal, reflected at another end of the first path; a first timing detecting step of detecting a timing, defined as a first timing; a second connecting step of connecting an end of the second path to another end of the first path; a second output step of outputting the test signal from the driver to the second path; a second reflect signal receiving step of receiving a test signal at the comparator, defined as a second reflect signal, reflected at another end of the second path; a second timing detecting step of detecting a timing defined as a second timing when the second reflect signal obtained by the comparator reaches the predetermined level; and a delay time calculation step of calculating of the propagation delay time of the second path, based on the reference timing corresponding to a timing when the delay time calculator outputs the test signal, the first timing, and the second timing.
摘要翻译：一种传播延迟时间测量方法，用于测量沿着第一信号路径和第二信号路径中的一个传播的测试信号的传播延迟时间，所述第一信号路径和第二信号路径串联连接到第一信号路径，半导体测试设备通过该第一信号路径包括驱动器和电连接所述方法包括：将所述第一路径的末端连接到所述驱动器和所述比较器的第一连接步骤; 第一输出步骤，将来自驾驶员的测试信号输出到第一路径; 第一反射信号接收步骤，在所述比较器处接收被定义为第一反射信号的测试信号，所述第一反射信号在所述第一路径的另一端反射; 第一定时检测步骤，检测被定义为第一定时的定时; 将所述第二路径的端部连接到所述第一路径的另一端的第二连接步骤; 第二输出步骤，将来自驾驶员的测试信号输出到第二路径; 第二反射信号接收步骤，在所述比较器处接收被定义为在所述第二路径的另一端反射的第二反射信号的测试信号; 第二定时检测步骤，当由比较器获得的第二反射信号达到预定电平时，检测被定义为第二定时的定时; 以及延迟时间计算步骤，基于与延迟时间计算器输出测试信号，第一定时和第二定时的定时对应的参考定时，计算第二路径的传播延迟时间。

32. 发明申请

US20040021472A1 System and method for detecting a narrowband signal 有权
标题翻译：用于检测窄带信号的系统和方法
公开(公告)号：US20040021472A1
公开(公告)日：2004-02-05
申请号：US10631131
申请日：2003-07-31
发明人： Laurel H. Carney , Michael C. Anzalone
IPC分类号： G01R027/28
CPC分类号： H04B1/1027 , G10L21/0232
摘要： A system for the detection of narrowband signals in wideband noise that combines information across two frequency channels that straddle the frequency of the target signal. Two band pass filters having center frequencies that straddle the frequency of the target signal and that have phase transfer functions that differ by 180 degrees relative to each other at the frequency of the target signal. The presence of the target signal is detected by performing a running cross-correlation of the outputs of saturating, non-linearities that follow from the filters, and determining when the output of the running cross-correlator drops below a predetermined threshold due to the phase shift between the two filter responses caused by the presence of the target signal.
摘要翻译：用于检测宽带噪声中的窄带信号的系统，其组合跨越目标信号的频率的两个频道上的信息。两个带通滤波器具有跨越目标信号的频率的中心频率，并且具有在目标信号的频率处相对于彼此相差180度的相位传递函数。通过执行来自滤波器的饱和，非线性的输出的运行中的互相关来检测目标信号的存在，并且由于相位确定运行中的交叉相关器的输出何时下降到预定阈值以下在由目标信号的存在引起的两个滤波器响应之间的移位。

33. 发明申请

US20030164713A1 Product having a sensor and a surface acoustic wave element, as well as a method and arrangement for determining a measurement variable, which corresponds to a reactance, by a sensor 审中-公开
标题翻译：具有传感器和表面声波元件的产品，以及用于通过传感器确定对应于电抗的测量变量的方法和装置
公开(公告)号：US20030164713A1
公开(公告)日：2003-09-04
申请号：US10230856
申请日：2002-08-29
申请人： Siemens Aktiengesellschaft
发明人： Franz Dollinger , Gernot Schimetta
IPC分类号： G01R027/28
CPC分类号： H03H9/6406 , B60C23/0408 , G01D5/48 , G01K7/34
摘要： An electrical-technical product has a sensor (1) through which can be supplied a measured variable corresponding to a reactive resistance within a range of measurement, a matching network (2) and a surface acoustic wave (SAW) element in which the sensor is connected via the matching network (2) to a first reflector of the SAW element (3), and the first reflector (4) forms a resonator with the matching network (2) and the sensor (1). The resonator for one value of the measured variable within the range of measurement, is tuned to an acoustic surface wave on the surface wave element (3), in view of a reflection of the surface wave propagating at the first reflector (4). The resonance is determined by a maximum reflectivity of the first reflector (4).
摘要翻译：电气产品具有传感器（1），通过该传感器可以提供与测量范围内的无功电阻相对应的测量变量，匹配网络（2）和表面声波（SAW）元件，传感器通过匹配网络（2）连接到SAW元件（3）的第一反射器，并且第一反射器（4）与匹配网络（2）和传感器（1）形成谐振器。考虑到在第一反射器（4）处传播的表面波的反射，在测量范围内的测量变量的一个值的谐振器被调谐到表面波元件（3）上的声表面波。共振由第一反射器（4）的最大反射率决定。

34. 发明申请

US20030158690A1 Systems and methods for facilitating automated test equipment functionality within integrated circuits 失效
标题翻译：用于促进集成电路内自动测试设备功能的系统和方法
公开(公告)号：US20030158690A1
公开(公告)日：2003-08-21
申请号：US10383323
申请日：2003-03-07
发明人： John G. Rohrbaugh , Jeffrey R. Rearick , Shad R. Shepston
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/3187
摘要： A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit. Integrated circuits, methods and computer readable media also are provided.
摘要翻译：用于促进集成电路内的自动测试设备功能的优选系统包括被配置为与集成电路电互连并且向集成电路提供至少一个信号的自动测试设备（ATE）。还提供了集成电路内部的第一参数测试电路。第一参数测试电路适于与自动测试设备电通信，使得响应于接收到来自自动测试设备的信号，第一参数测试电路测量集成电路的第一焊盘的至少一个参数。还提供集成电路，方法和计算机可读介质。

35. 发明申请

US20030158689A1 Method for extracting parasitic capacitances of field-effect transistors 审中-公开
标题翻译：提取场效应晶体管寄生电容的方法
公开(公告)号：US20030158689A1
公开(公告)日：2003-08-21
申请号：US10300085
申请日：2002-11-20
发明人： Yeong-Lin Lai , Cheng-Tsung Chen
IPC分类号： G01R015/00 , G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/2621 , G01R31/275
摘要： The purpose of the present invention is to provide a method to extract the extrinsic capacitances of FETs by a physically-meaningful capacitive transmission line model and a linear regression technique. The method of the present invention includes method includes steps of (a) applying a gate-to-source voltage to pinch-off said FETs and setting a drain-to-source voltage to be zero for forming pinched-off cold FETs, (b) measuring S-parameters of said pinched-off cold FETs, (c) representing an intrinsic depletion region of said pinched-off cold FETs by a distributed capacitive transmission line model having a distributed series capacitance Cs and a distributed parallel capacitance Cp; and (d) executing an analytical procedure according to said measured S-parameters for obtaining Y-parameters.
摘要翻译：本发明的目的是提供一种通过物理上有意义的电容传输线模型和线性回归技术来提取FET的外在电容的方法。本发明的方法包括以下步骤：（a）施加栅极至源极电压以夹断所述FET并将漏极至源极电压设置为零以形成夹断冷却的FET（b 测量所述夹断冷FET的S参数，（c）通过具有分布式串联电容Cs和分布式并联电容Cp的分布式电容传输线模型表示所述夹断冷FET的固有耗尽区; 以及（d）根据所述测量的S参数执行分析程序以获得Y参数。

36. 发明申请

US20030158688A1 Method and apparatus for testing a system-on-a-chip 失效
标题翻译：用于测试片上系统的方法和装置
公开(公告)号：US20030158688A1
公开(公告)日：2003-08-21
申请号：US10280543
申请日：2002-10-24
发明人： Abhijit Chatterjee , Dave Majernik , Sasikumar Cherubal , Sudip Chakrabarti , Ramakrishna Voorakaranam , Jacob A. Abraham , Douglas Goodman
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/318505 , G01R31/3167
摘要： A method for testing a system on a chip or a system on a package (nullnullSOPCnull) having a plurality of internal modules that are tested to determine whether predetermined performance specifications are satisfied. A first module of the SOPC is selected for testing. A determination is made as to whether the first module is directly accessible or not. If the first module is directly accessible, the module may be tested with automated test equipment external to the SOPC. If the first module is not directly accessible, the module may be tested with a second and third module of the SOPC.
摘要翻译：一种用于测试芯片上的系统或者具有多个内部模块的封装上的系统（“SOPC”）的方法，所述多个内部模块被测试以确定是否满足预定的性能规范。选择SOPC的第一模块进行测试。确定第一模块是否可直接访问，如果第一模块可直接访问，则可以使用SOPC外部的自动测试设备对模块进行测试，如果第一模块不可直接访问，则模块可以用SOPC的第二和第三个模块进行测试。

37. 发明申请

US20030158681A1 Method for calibrating a sensor and switching arrangement for operating a sensor 有权
标题翻译：用于校准传感器的方法和用于操作传感器的开关装置
公开(公告)号：US20030158681A1
公开(公告)日：2003-08-21
申请号：US10367348
申请日：2003-02-14
发明人： Klaus Walter , Rasmus Rettig
IPC分类号： G01D018/00 , G01M019/00 , G06F019/00 , G01D021/00 , G01P021/00 , G01R035/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01D5/24452 , G01D18/008 , G01P21/02
摘要： A method for calibration of a sensor 1 is characterized in that the sensor 1 is arranged in a predetermined position, an equalizing unit 6 is connected to the sensor 1, data necessary for calibration are determined, and the determined calibration data are stored permanently in a storage medium 5.
摘要翻译：传感器1的校准方法的特征在于，传感器1被布置在预定位置，均衡单元6连接到传感器1，确定校准所需的数据，并将确定的校准数据永久地存储在存储介质5。

38. 发明申请

US20030151416A1 Circuit for determining the internal resistance of a linear lambda probe 失效
标题翻译：用于确定线性λ探针的内阻的电路
公开(公告)号：US20030151416A1
公开(公告)日：2003-08-14
申请号：US10341564
申请日：2003-01-13
发明人： Stephan Bolz
IPC分类号： G01R027/28
CPC分类号： G01N27/041 , G01R27/02
摘要： A device for measuring the probe impedance of a linear lambda probe of an internal combustion engine which is caused by an AC current measurement signal which is fed into the lambda probe, comprises a voltage amplifier for amplifying an AC voltage which drops across the probe impedance, and a rectifier for rectifying the amplified AC voltage, wherein the rectifier is a synchronous demodulator, by which in each case the upper and lower amplitude of the AC voltage signal is sampled with its frequency, filtered and stored, and by which the difference of the stored signals is amplified with a gain factor and made available as output signal at its output for controlling the temperature of the lambda probe.
摘要翻译：用于测量由馈送到λ探针中的AC电流测量信号引起的内燃机的线性λ探针的探针阻抗的装置包括用于放大跨越探针阻抗的AC电压放大的电压放大器，以及用于整流放大的AC电压的整流器，其中整流器是同步解调器，在每种情况下，AC电压信号的上和下幅度被采样其频率，滤波和存储，并且由此，存储的信号以增益因子放大，并在其输出端作为输出信号可用，用于控制λ探针的温度。

39. 发明申请

US20030137311A1 Determining cable attenuation and loss of signal threshold 有权
标题翻译：确定电缆衰减和信号阈值的损失
公开(公告)号：US20030137311A1
公开(公告)日：2003-07-24
申请号：US10339156
申请日：2003-01-09
发明人： Alexander Stephen , Daya Rasaratnam , Colin Johnstone
IPC分类号： H04B003/46 , H01H031/02 , G01R027/28
CPC分类号： H04B3/48
摘要： Attenuation of a pulsed signal traversing a cable is assessed by identifying a pulse in a signal received after traversing the cable and determining first and second reference signal levels in dependence upon characteristics of the pulse. A measurement is made of the slope of the pulse between the first and second reference signal levels (such as 25% and 75% of the peak pulse magnitude), and this measurement is used to determine an indication of the cable attenuation. The cable attenuation may in turn be used to determine a threshold for indicating loss of signal during a measurement operation.
摘要翻译：穿过电缆的脉冲信号的衰减通过识别穿过电缆后接收到的信号中的脉冲并根据脉冲特性确定第一和第二参考信号电平来评估。测量第一和第二参考信号电平之间的脉冲斜率（如峰值脉冲幅度的25％和75％），该测量用于确定电缆衰减的指示。电缆衰减又可用于确定在测量操作期间指示信号丢失的阈值。

40. 发明申请

US20030135343A1 Methods and apparatus for testing electronic devices 有权
标题翻译：用于测试电子设备的方法和装置
公开(公告)号：US20030135343A1
公开(公告)日：2003-07-17
申请号：US10047506
申请日：2002-01-15
申请人： EAGLE TEST SYSTEMS, INC.
发明人： Gordon M. Samuelson , Jack Edward Weimer
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/2841
摘要： Apparatus for testing an electronic device under a plurality of test conditions created during a test sequence includes an arbitrary waveform generator that sequentially generates the plurality of test conditions. The test conditions include selectively forcing voltage or forcing current over a wide range of amplitudes, measuring a plurality of results with various resolutions and at selected times during the test sequence, changing filter settings, gains and other parameters. The test conditions are selected and set under the control of a system clock using data stored in memory. A controller initiates the test sequence of the apparatus and determines whether measured results are within predetermined specifications. The controller uses processor-driven software, but the settings of the test apparatus are changed at predetermined times during the test sequence, without controller intervention. Several test apparatus are typically managed by one controller. Performing test sequences without controller intervention reduces the time required for testing.
摘要翻译：用于在测试序列期间产生的多个测试条件下测试电子设备的装置包括顺序产生多个测试条件的任意波形发生器。测试条件包括在宽范围的幅度上选择性地强制电压或强制电流，以各种分辨率测量多个结果，并且在测试序列期间的选定时间，改变滤波器设置，增益和其它参数。使用存储在存储器中的数据在系统时钟的控制下选择和设置测试条件。控制器启动设备的测试顺序，并确定测量结果是否在预定规格内。控制器使用处理器驱动的软件，但是在测试序列期间，测试设备的设置在预定的时间被改变，而无需控制器干预。一些测试装置通常由一个控制器管理。执行测试序列而无需控制器干预可以减少测试所需的时间。

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